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Author: kevin brady
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Displaying records 11 to 20 of 28 records.
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11. Representation of a Thermal Resistor Network Model of a Packaged Component in STEP AP210 Edition 2
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7648
Published: 12/4/2009
Authors: Jamie Stori, Kevin G Brady, Thomas Thurman
Abstract: STEP AP210 (ISO-10303:210) is the first international standard capable of representing both ECAD and MCAD data of packaged components within a unified model. In order to promote AP210 as a standards-based mechanism for the representation of component ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903903

12. Information management for Environmental Concerns
Published: 2/8/2008
Authors: Eric D Simmon, John V Messina, Kevin G Brady
Abstract: Around the world there is a growing awareness that the environmental impact from manufacturing needs to be minimized. Concerns about issues from toxic materials ending up in landfills to manufacturing process chelmicals causing health problems are ca ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32935

13. The NIST Calibration Check Standards Database
Published: 6/1/2007
Authors: Kevin G Brady, Frederic Jean Marie de Vaulx, Randolph E Elmquist
Abstract: For several years now, NIST has been a leader in the development and use of Information Technology to process calibration information. Beginning in 1996, researchers designed and developed a calibration database, the NIST Information System to Suppor ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32701

14. Automating Thermo-Mechanical Warpage Estimation of PCBs/PCAs using a Design-Analysis Integration Framework
Published: 8/18/2006
Authors: Manas Bajaj, Russell Peak, Dirk Zwemer, Thomas Thurman, Lothar Klein, Giedrius Liutkus, Kevin G Brady, John V Messina, Mike Dickerson
Abstract: Accurate prediction, validation and reduction of thermally-induced PCB warpage are critical for enhancing manufacturing yield and reliability in time-to-market driven electronics product realization. In this paper, we describe a methodology to simula ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32287

15. Next Generation Simulation-based Design Technologies for Electronics Product Realization
Published: 5/1/2005
Authors: Manas Bajaj, Dirk Zwemer, Russell Peak, Mike Dickerson, Thomas Thurman, Kevin G Brady, John V Messina
Abstract: The realm of electronics product realization is marked by an extremely fast-paced market, stringent demands for product reliability and high importance to innovative design. Further, the time-to-market and the cost-to-realize play a critical role for ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31962

16. Seeing in Three Dimensions: An alternative technique for viewing large information spaces
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7093
Published: 8/30/2004
Authors: Matthew L Aronoff, John V Messina, Kevin G Brady
Abstract: This paper describes Hydra, a graphical software tool designed for use on the Web, that is intended to simplify the building, editing, and searching of large and complex information hierarchies. Specifically, the initial development focuses on facili ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31605

17. PWB Warpage Analysis and Verification using an AP210 Standards-based Engineering Framework and Shadow Moire
Published: 3/10/2004
Authors: Dirk Zwemer, Manas Bajaj, Russell Peak, Thomas Thurman, Kevin G Brady, S McCarron, A Spradling, Mike Dickerson, Lothar Klein, Giedrius Liutkus, John V Messina
Abstract: Thermally induced warpage of printed wiring boards (PWB) and printed circuit assemblies (PCA) is an increasingly important issue in managing the manufacturing yield and reliability of electronic devices. In this paper, we introduce complementary simu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31627

18. Information Technology for Engineering and Manufacturing
Published: 5/10/2000
Authors: Michael Gruninger, Barbara L Goldstein, Kevin G Brady, Simon Szykman, Charles R. McLean, Joshua Lubell
Abstract: Advances in information technology are frequently cited as the basis for the continued growth of the U.S. economy. Manufacturers use information technology products to increase productivity, to decrease time-to-market, to lower supply chain costs, an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30569

19. An Information System to Support Calibration
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6425
Published: 11/1/1999
Author: Kevin G Brady
Abstract: The National Institute of Standards and Technology (NIST) performs calibrations that achieve the highest level of measurement quality for the makers and users of precision devices world-wide. The information system that administers these calibration ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14405

20. Conformance Testing Object-Oriented Frameworks Using JAVA
Published: 10/1/1998
Authors: Kevin G Brady, James A St. Pierre
Abstract: This paper details the assumptions, decision processes, and conclusions reached during the development and implementation of a Conformance Testing Tool using the JAVA [JAVA] programming language, and the Object Management Group's (OMG's) Common Objec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=11725



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