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You searched on: Author: dylan williams

Displaying records 111 to 120 of 180 records.
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111. Computation of Causal Characteristic Impedances
Published: 6/12/2000
Authors: Dylan F Williams, Ronald Curtis Wittmann
Abstract: We develop a numerical method of determining the magnitude of characteristic impedance required by causal power-normalized circuit theories from its phase using a Hilbert-transform relationship. We also estimate the uncertainty in the method.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30759

112. Characterization of Asymmetric Coupled CMOS Lines
Published: 6/1/2000
Authors: Uwe Arz, Dylan F Williams, David K Walker, J. E. Rogers, M. Rudack, D. Treytner, Hartmut Grabinski
Abstract: This paper investigates the properties of asymmetric coupled lines built in a 0.25 5m CMOS technology in the frequency range of 50 MHz to 26.5 GHz. We show that the frequency-dependent line parameters extracted from callibrated four-port S-parameter ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14312

113. Coplanar-Waveguide-to-Microstrip Transition Model
Published: 6/1/2000
Authors: Wojciech Wiatr, David K Walker, Dylan F Williams
Abstract: We develop a novel four-port equivalent circuit for a coplanar-waveguide-to-microstrip transition using a finite-difference time-domain analysis. The lumped model accounts for mutual inductive coupling and works well up to about 30 GHz.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=7738

114. Realistic Sampling-Circuit Model for a Nose-to-Nose Simulation
Published: 6/1/2000
Authors: Catherine A Remley, Dylan F Williams, Donald C. DeGroot
Abstract: We extend previously developed oscilloscope sampler models to include realistic circuit characteristics and use these models to investigate the nose-to-nose calibration technique.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16115

115. Influence of the Substrate Resistivity on the Broadband Propagation Characteristics of Silicon Transmission Lines
Published: 12/1/1999
Authors: Uwe Arz, Hartmut Grabinski, Dylan F Williams
Abstract: This work investigates the broadband propagation characteristics of transmission lines fabricated on silicon substrates of different conductivities. We compare calculations to measurements and examine the sensitivity of the frequency-dependent line p ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=24545

116. Nose-to-Nose Response of a 20-GHz Sampling Circuit
Published: 12/1/1999
Authors: Dylan F Williams, Catherine A Remley, Donald C. DeGroot
Abstract: We use SPICE simulations to determine a response function of a two-diode 20-GHz sampling circuit. We explore the validity of the SPICE simulations in a variety of operational conditions and examine differences between the actual response of an impeda ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=15965

117. Sources of Error in Coplanar-Waveguide TRL Calibrations
Published: 12/1/1999
Authors: Raian K. Kaiser, Dylan F Williams
Abstract: This paper explores the impact of five sources of systematic error on coplanar waveguide thru-reflect-line calibrations.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=2573

118. A Causal Microwave Circuit Theory and Its Implications
Published: 8/1/1999
Authors: Dylan F Williams, Bradley K Alpert
Abstract: We will describe a new causal power-normalized waveguide equivalent-circuit theory and explore its implications. The new theory marries a power normalization with additional constraints that enforce simultancity of the theory's voltages and currents ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=6678

119. Electrical Measurements for Electronic Interconnections at NIST
Published: 8/1/1999
Authors: Dylan F Williams, Donald C. DeGroot
Abstract: The National Institute of Standards and Technology (NIST) operates a number of research projects to advance measurement science and technology for the microelectronic industry. Here we will summarize (1), report on one component of the NIST program, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=7260

120. A Complete Multimode Equivalent-Circuit Theory for Electrical Design
Series: Journal of Research (NIST JRES)
Published: 6/22/1999
Authors: Dylan F Williams, L. A. Hayden, Roger Marks
Abstract: This work presents a complete equivalent-circuit theory for lossy multimode transmission lines. Its voltages and currents are based on general linear combinations of standard normalized modal voltages and currents. The theory includes new expressions ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30244



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