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You searched on: Author: dylan williams

Displaying records 111 to 120 of 180 records.
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111. Computation of Causal Characteristic Impedances
Published: 6/12/2000
Authors: Dylan F Williams, Ronald Curtis Wittmann
Abstract: We develop a numerical method of determining the magnitude of characteristic impedance required by causal power-normalized circuit theories from its phase using a Hilbert-transform relationship. We also estimate the uncertainty in the method.

112. Characterization of Asymmetric Coupled CMOS Lines
Published: 6/1/2000
Authors: Uwe Arz, Dylan F Williams, David K Walker, J. E. Rogers, M. Rudack, D. Treytner, Hartmut Grabinski
Abstract: This paper investigates the properties of asymmetric coupled lines built in a 0.25 5m CMOS technology in the frequency range of 50 MHz to 26.5 GHz. We show that the frequency-dependent line parameters extracted from callibrated four-port S-parameter ...

113. Coplanar-Waveguide-to-Microstrip Transition Model
Published: 6/1/2000
Authors: Wojciech Wiatr, David K Walker, Dylan F Williams
Abstract: We develop a novel four-port equivalent circuit for a coplanar-waveguide-to-microstrip transition using a finite-difference time-domain analysis. The lumped model accounts for mutual inductive coupling and works well up to about 30 GHz.

114. Realistic Sampling-Circuit Model for a Nose-to-Nose Simulation
Published: 6/1/2000
Authors: Catherine A Remley, Dylan F Williams, Donald C. DeGroot
Abstract: We extend previously developed oscilloscope sampler models to include realistic circuit characteristics and use these models to investigate the nose-to-nose calibration technique.

115. Influence of the Substrate Resistivity on the Broadband Propagation Characteristics of Silicon Transmission Lines
Published: 12/1/1999
Authors: Uwe Arz, Hartmut Grabinski, Dylan F Williams
Abstract: This work investigates the broadband propagation characteristics of transmission lines fabricated on silicon substrates of different conductivities. We compare calculations to measurements and examine the sensitivity of the frequency-dependent line p ...

116. Nose-to-Nose Response of a 20-GHz Sampling Circuit
Published: 12/1/1999
Authors: Dylan F Williams, Catherine A Remley, Donald C. DeGroot
Abstract: We use SPICE simulations to determine a response function of a two-diode 20-GHz sampling circuit. We explore the validity of the SPICE simulations in a variety of operational conditions and examine differences between the actual response of an impeda ...

117. Sources of Error in Coplanar-Waveguide TRL Calibrations
Published: 12/1/1999
Authors: Raian K. Kaiser, Dylan F Williams
Abstract: This paper explores the impact of five sources of systematic error on coplanar waveguide thru-reflect-line calibrations.

118. A Causal Microwave Circuit Theory and Its Implications
Published: 8/1/1999
Authors: Dylan F Williams, Bradley K Alpert
Abstract: We will describe a new causal power-normalized waveguide equivalent-circuit theory and explore its implications. The new theory marries a power normalization with additional constraints that enforce simultancity of the theory's voltages and currents ...

119. Electrical Measurements for Electronic Interconnections at NIST
Published: 8/1/1999
Authors: Dylan F Williams, Donald C. DeGroot
Abstract: The National Institute of Standards and Technology (NIST) operates a number of research projects to advance measurement science and technology for the microelectronic industry. Here we will summarize (1), report on one component of the NIST program, ...

120. A Complete Multimode Equivalent-Circuit Theory for Electrical Design
Series: Journal of Research (NIST JRES)
Published: 6/22/1999
Authors: Dylan F Williams, L. A. Hayden, Roger Marks
Abstract: This work presents a complete equivalent-circuit theory for lossy multimode transmission lines. Its voltages and currents are based on general linear combinations of standard normalized modal voltages and currents. The theory includes new expressions ...

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  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
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