Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Author: dylan williams

Displaying records 111 to 120 of 195 records.
Resort by: Date / Title


111. Contact-Pad Design for High-Frequency Silicon Measurements
Published: 10/1/2000
Authors: Dylan F Williams, A. C. Byers, V. C. Tyree, David K Walker, J. J. Ou, X. Jin, M. Piket-Moy, C. Hu
Abstract: We measure and compare the electrical parasitics of contact pads of different designs fabricated on silicon integrated circuits and develop a strategy for reducing the parasitics.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=28265

112. On-Wafer Measurement of Transmission Lines On Lossy Silicon Substrates
Published: 9/25/2000
Authors: Uwe Arz, Dylan F Williams, Hartmut Grabinski
Abstract: This paper examines broadband measurement techniques for electrical properties of planar transmission lines built on lossy silicon substrates. We start by investigating the performance of a new formulation of the calibration com-parison method which ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30212

113. Computation of Causal Characteristic Impedances
Published: 6/12/2000
Authors: Dylan F Williams, Ronald Curtis Wittmann
Abstract: We develop a numerical method of determining the magnitude of characteristic impedance required by causal power-normalized circuit theories from its phase using a Hilbert-transform relationship. We also estimate the uncertainty in the method.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30759

114. Characterization of Asymmetric Coupled CMOS Lines
Published: 6/1/2000
Authors: Uwe Arz, Dylan F Williams, David K Walker, J. E. Rogers, M. Rudack, D. Treytner, Hartmut Grabinski
Abstract: This paper investigates the properties of asymmetric coupled lines built in a 0.25 5m CMOS technology in the frequency range of 50 MHz to 26.5 GHz. We show that the frequency-dependent line parameters extracted from callibrated four-port S-parameter ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14312

115. Coplanar-Waveguide-to-Microstrip Transition Model
Published: 6/1/2000
Authors: Wojciech Wiatr, David K Walker, Dylan F Williams
Abstract: We develop a novel four-port equivalent circuit for a coplanar-waveguide-to-microstrip transition using a finite-difference time-domain analysis. The lumped model accounts for mutual inductive coupling and works well up to about 30 GHz.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=7738

116. Realistic Sampling-Circuit Model for a Nose-to-Nose Simulation
Published: 6/1/2000
Authors: Catherine A Remley, Dylan F Williams, Donald C. DeGroot
Abstract: We extend previously developed oscilloscope sampler models to include realistic circuit characteristics and use these models to investigate the nose-to-nose calibration technique.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16115

117. Causality and Characteristic Impedance
Published: 12/2/1999
Authors: Dylan F Williams, Bradley K Alpert
Abstract: A new causal power-normalized waveguide equivalent-circuit theory fixes both the magnitude and phase of the characteristic impedance of a waveguide.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=920434

118. Influence of the Substrate Resistivity on the Broadband Propagation Characteristics of Silicon Transmission Lines
Published: 12/1/1999
Authors: Uwe Arz, Hartmut Grabinski, Dylan F Williams
Abstract: This work investigates the broadband propagation characteristics of transmission lines fabricated on silicon substrates of different conductivities. We compare calculations to measurements and examine the sensitivity of the frequency-dependent line p ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=24545

119. Nose-to-Nose Response of a 20-GHz Sampling Circuit
Published: 12/1/1999
Authors: Dylan F Williams, Catherine A Remley, Donald C. DeGroot
Abstract: We use SPICE simulations to determine a response function of a two-diode 20-GHz sampling circuit. We explore the validity of the SPICE simulations in a variety of operational conditions and examine differences between the actual response of an impeda ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=15965

120. Sources of Error in Coplanar-Waveguide TRL Calibrations
Published: 12/1/1999
Authors: Raian K. Kaiser, Dylan F Williams
Abstract: This paper explores the impact of five sources of systematic error on coplanar waveguide thru-reflect-line calibrations.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=2573



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series