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Author: joseph tan

Displaying records 21 to 30 of 45 records.
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21. Accurate Modeling of Benchmark X-ray Spectra from Highly-Charged Ions of Tungsten
Published: 10/26/2006
Authors: Y Ralchenko, Joseph N Tan, John D Gillaspy, Joshua M Pomeroy, E Silver
Abstract: We present detailed collisional-radiative modeling for the benchmark x-ray spectrum of highly-charged tungsten ions in the range between 3 \AA \ and 10 \AA produced in an Electron Beam Ion Trap (EBIT) with a beam energy of 4.08 keV. Remarkably good ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840848

22. Accurate modeling of benchmark x-ray spectra from highly charged ions of tungsten
Published: 1/1/2006
Authors: Yuri Ralchenko, Joseph N Tan, John D Gillaspy, Joshua M Pomeroy, E Silver
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=102432

23. Low Jitter Metal Vapor Vacuum Arc Ion Source for EBIT Injections
Published: 6/27/2005
Authors: G Holland, Craig N Boyer, J Seely, Joseph N Tan, Joshua M Pomeroy, John D Gillaspy
Abstract: A metal vapor vacuum arc (MeVVA) ion source having eight different cathodes that are individually selectable via the control electronics and having low trigger jitter (200 ns) is described. The arc plasma is produced by means of a 26 kV, 125 A, 30 s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840772

24. A high efficiency ultrahigh vacuum compatible flat field spectrometer for extreme ultraviolet wavelengths
Published: 1/1/2005
Authors: B Blagojevic, E O Le bigot, K Fahy, A Aguilar, K Makonyi, E Takacs, Joseph N Tan, Joshua M Pomeroy, John H. Burnett, John D Gillaspy, R Roberts j
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=101941

25. An Electron Beam Ion Trap (EBIT) plus a microcalorimeter: a good combination for laboratory astrophysics
Published: 1/1/2005
Authors: Joseph N Tan, E Silver, Joshua M Pomeroy, J M Laming, John D Gillaspy
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=102561

26. EUV Spectroscopy of Xenon Ions Created Using an Electron Beam Ion Trap, ed. by H.J. Byrne
Published: 1/1/2005
Authors: K Fahy, E Sokell, G O'Sullivan, A Cummings, A Aguilar, John D Gillaspy, Joshua M Pomeroy, Joseph N Tan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=102695

27. Low jitter metal vapor vacuum arc ion source for electron beam ion trap injections
Published: 1/1/2005
Authors: G E Holland, C N Boyer, J Seely, Joseph N Tan, Joshua M Pomeroy, John D Gillaspy
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=102154

28. UTA versus Line Emission for EUVL: Studies on Xenon Emission at the NIST EBIT
Published: 12/1/2004
Authors: K Fahey, P Dunne, L McKinney, G O'Sullivan, E Sokell, J White, Alejando Aguilar-Mendoza, Joshua M Pomeroy, Joseph N Tan, B Blagojevic, E O LeBigot, John D Gillaspy
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840739

29. UTA versus line emission for EUVL: studies on xenon emission at the NIST EBIT
Published: 1/1/2004
Authors: K Fahy, P Dunne, L McKinney, G O'Sullivan, E Sokell, J White, A Aguilar, Joshua M Pomeroy, Joseph N Tan, B Blagojevic, E O LeBigot, John D Gillaspy
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=102089

30. Visible, EUV, and X-ray Spectroscopy at the NIST EBIT Facility, ed. by Cohen, J.S., Mazevet, S., and Kilcrease, D.P.
Published: 1/1/2004
Authors: John D Gillaspy, B Blagojevic, A Dalgarno, K Fahey, V Kharchenko, J M Laming, E -O Le bigot, L Lugosi, L P. Ratliff, H W Schnopper, E H Silver, E Takacs, Joseph N Tan, H Tawara, K Tokesi
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=102707



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