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Author: stephan stranick
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1. Accuracy and Resolution of Nanoscale Strain Measurement Techniques
Published: 3/26/2013
Authors: William A Osborn, Lawrence H Friedman, Mark D Vaudin, Stephan J Stranick, Michael S. Gaither, Justin M Gorham, Victor Vartanian, Robert Francis Cook
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913178

2. Assessment of Sensitivity Advances in Near-Field Raman Spectroscopy
Published: 9/1/2000
Authors: Chris A Michaels, C EJ Dentinger, Lee J Richter, D B Chase, Richard R Cavanagh, Stephan J Stranick
Abstract: Near-field Raman spectroscopy can be used to obtain images with both chemical specificity and the subwavelength spatial resolution of near-field scanning optical microscopy (NSOM). In the absence of signal intensification factors, such as surface en ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831194

3. Chemical Imaging With Scanning Near-Field Infrared Microscopy and Spectroscopy
Published: 10/1/2000
Authors: Chris A Michaels, Lee J Richter, Richard R Cavanagh, Stephan J Stranick
Abstract: The development of a scanning near-field microscope that utilizes infrared absorption as the optical contrast mechanism is described. This instrument couples the nanoscale spatial resolution of a scanning probe microscope with the chemical specifici ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831196

4. Chemical Imaging of Heterogeneous Polymeric Materials With Near-Field IR Microscopy
Published: 4/1/2005
Authors: Chris A Michaels, D B Chase, Stephan J Stranick
Abstract: The development of techniques to probe spatial variations in chemical composition on the nanoscale continues to be an important area of research in the characterization of polymeric materials. Recent efforts have focused on the development and chara ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831470

5. Chemical Imaging of Thin Films Polymer Blends With Near-Field Infrared Microscopy and Spectroscopy
Published: Date unknown
Authors: Stephan J Stranick, Xiaohong Gu, D B Chase, Chris A Michaels
Abstract: The utility of an infrared scanning near-field microscope in the characterization of the mesoscale structure of thin film polymer blends is demonstrated. This unique IR microscope souples the nanoscale spatial resolution of scanning probe microscopy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830269

6. Comparison of Nanoscale Measurements of Strain and Stress using Electron Back Scattered Diffraction and Confocal Raman Microscopy
Published: 12/12/2008
Authors: Mark D Vaudin, Yvonne Beatrice Gerbig, Stephan J Stranick, Robert Francis Cook
Abstract: Strains in Si as small as 104 (corresponding to stresses of 10 MPa) have been measured using electron back scatter diffraction (EBSD), with spatial resolution close to 10 nm, and confocal Raman microscopy (CRM) with spatial resolution app ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854129

7. Comparison of the Sensitivity and Image Contrast in Spontaneous Raman and Coherent Stokes Raman Scattering Microscopy of Geometry Controlled Samples
Published: 2/9/2011
Authors: Hyun Min Kim, Chris A Michaels, Garnett W Bryant, Stephan J Stranick
Abstract: We experimentally compare the performance and contrast differences between spontaneous and coherent Stokes Raman scattering microscopy. We demonstrate the differences on a series of geometry controlled samples that range in complexity from a point (a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906194

8. Controlling The Growth Direction of ZnO Nanowires (NWs) on c and a -Plane Sapphire
Published: 2/1/2004
Authors: Babak Nikoobakht, Albert Davydov, Stephan J Stranick
Abstract: The issue of controlling the growth direction of NWs is vital in nanotechnology applications and future optoelectronic devices. In an effort to address the above, we have begun studies aimed at selectively controlling the growth direction of horizont ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831331

9. Controlling the Growth Direction of ZnO Nanowires on c-Plane Sapphire
Published: Date unknown
Authors: Babak Nikoobakht, Albert Davydov, Stephan J Stranick
Abstract: Well oriented vertical ZnO nanowires (NWs) are grown on c-plane sapphire via a vapor-phase transport process using an Au thin film as a catalyst. This new finding is novel and unexpected due to the fact that the lattice mismatch between the zinc oxi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853395

10. Direct observation of phase transformation anisotropy in indented silicon using confocal Raman microscopy
Published: 5/31/2011
Authors: Yvonne Beatrice Gerbig, Stephan J Stranick, Robert Francis Cook
Abstract: The theoretically-predicted anisotropic nature of the indentation phase transformation in silicon (Si) is observed directly in experiments using hyperspectral, confocal Raman microscopy. The anisotropy is reflected in the two-dimensional distribution ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906105



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