NIST logo

Publications Portal

You searched on:
Author: bruce ravel
Sorted by: date

Displaying records 1 to 10 of 18 records.
Resort by: Date / Title


1. The red color in 19th century Thai glass studied by X-ray and optical spectroscopy
Published: 7/2/2014
Authors: Bruce D Ravel, Wantana Klysubun, G. Lawrence Carr, Christoph Hauzenberger
Abstract: The Temple of the Emerald Buddha in Bangkok, Thailand is noted for its glass mosaic decorations on exterior walls and statuary. The original mosaic artwork dates to the early 19th century and is composed of variously-colored, mirrored glass pieces. I ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914254

2. National Synchrotron Light Source II: Long Islands state-of-the-art X-ray microscope
Published: 5/20/2014
Authors: Bruce D Ravel, Scott Calvin, Linnea Russell
Abstract: This is an education and outreach effort that we have undertaken for the benefit of the Photon Sciences Users' Executive Committee. The UEC is the group that represents the user of the National Synchrotron Light Source, which is currently in its fina ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915664

3. Sample Thickness and Quantitative Concentration Measurements in XANES Spectroscopy
Published: 5/16/2014
Authors: Alessandra C Leri, Bruce D Ravel
Abstract: While XANES spectroscopy is an established tool for quantitative information on chemical structure and speciation, elemental concentrations are generally quantified by other methods. The edge step in XANES spectra represents the absolute amount of t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915146

4. Diamond Sensors and Polycapillary Lenses for X-ray Absorption Spectroscopy
Published: 10/13/2013
Author: Bruce D Ravel
Abstract: Diamond sensors are evaluated as incident beam monitors for X-ray Absorption Spectroscopy experiments. These single crystal devices pose a challenge for an energyscanning experiment using hard X-rays due to the e ect of diffraction from the crystalli ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913887

5. EXAFS Studies of Catalytic DNA Sensors for Mercury Contamination of Water
Published: 12/11/2009
Authors: Bruce D Ravel, S.C. Slimmer, X. Meng, G.C.L. Wong, Y. Lu
Abstract: Monitoring of metallic contaminants in domestic and agricultural water systems systems requires technology that is fast, flexible, sensitive, and selective. Recently, metal sensors based on catalytic DNA have been demonstrated as a practical monitor ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854469

6. Condensed Matter Astrophysics A Prescription for Determining the Species-Specific Composition and Quantity of Interstellar Dust using X-rays
Published: 9/10/2009
Authors: Bruce D Ravel, Julia C. Lee, Jingen Xiang, Jeffrey Kortright, Kathryn Flanagan
Abstract: We present a new technique for determining the quantity and composition of dust in astrophysical environments using < 6 keV X-rays. We argue that high resolution X-ray spectra as enabled by the Chandra and XMM-Newton gratings should be considered ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903572

7. Pentavalent Uranium Oxide via Reduction of [UO^d2^]^u2+^ Under Hydrothermal Reaction Conditions
Published: 5/23/2008
Authors: Nebebech Belai, Mark Frisch, Eugene Ilton, Bruce D Ravel, Christopher Cahill
Abstract: The synthesis, crystal structure and spectroscopic characterization of [UV(H2O)2(UVIO2)2O4(OH)](H2O)4, a mixed-valent UV/UVI oxide material, are reported. The hydrothermal reaction of UO22+ with Zn and hydrazine at 120 °C for three days yields 1 in t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854092

8. Surface Structure and Orientation of PTFE Films Determined by Experimental and FEFF8-Calculated NEXAFS Spectra
Published: 3/1/2002
Authors: L Gamble, Bruce D Ravel, Daniel A Fischer, David G. Castner
Abstract: Near edge X-ray absorption fine structure (NEXAFS) experiments have provided information about the orientation of adsorbed small molecules, self-assembled monolayers, and polymers. Long fluorocarbon chains are known to have a twisted (or helical) st ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850579

9. Tomography of Integrated Circuit Interconnects
Published: 10/1/2001
Authors: Zachary H Levine, A R Kalukin, M Kuhn, S P Frigo, I McNulty, C C Retsch, Y Wang, Uwe Arp, Thomas B Lucatorto, Bruce D Ravel, Charles S Tarrio
Abstract: 00 Word summary based on the paper:Z. H. Levine, A. R. Kalukin, M. Kuhn, S. P. Frigo, I. McNulty,>C. C. Retsch, Y. Wang, U. Arp, T. B. Lucatorto, B. D. Ravel, and C. Tarrio,>``Microtomography of Integrated Circuit Interconnect with an> Electromigra ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840113

10. Tomography of Integrated Circuit Interconnect With an Electromigration Void
Published: 5/1/2000
Authors: Zachary H Levine, A R Kalukin, M Kuhn, S P Frigo, I McNulty, C C Retsch, Y Wang, Uwe Arp, Thomas B Lucatorto, Bruce D Ravel, Charles S Tarrio
Abstract: An integrated circuit interconnect was subject to accelerated-life conditions to induce an electromigration void. The silicon substrate was removed, leaving only the interconnect encased test structure encased in silica. We imaged the sample wit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840087



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series