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Author: michael postek

Displaying records 211 to 220 of 225 records.
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211. An Approach to Accurate X-Ray Mask Measurements in a Scanning Electron Microscope
Series: NIST Interagency/Internal Report (NISTIR)
Published: 1/1/1989
Authors: Michael T Postek, Robert D. Larrabee, William J. Keery
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=20079

212. Evaluation of Single Point Diamond Turning Tools
Published: 12/31/1988
Authors: C J Evans, R. Polvani, Michael T Postek, Gordon W. Day
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=861

213. Low Accelerating Voltage SEM Magnification Standard Prototype
Published: 12/31/1988
Authors: Michael T Postek, R. C. Tiberio
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=2503

214. The Relationship Between Accelerating Voltage and Electron Detection Modes to Linewidth Measurement in an SEM
Published: 12/31/1988
Authors: Michael T Postek, William J. Keery, Robert D. Larrabee
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=29772

215. A Lithographic SEM Magnification Standard
Published: 12/1/1988
Authors: Michael T Postek, R. C. Tiberio
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100

216. Low Accelerating Voltage Pitch Standard Based on the Modification of NBS SRM 484
Series: NIST Interagency/Internal Report (NISTIR)
Published: 12/31/1987
Author: Michael T Postek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=15586

217. Non-Destructive Submicron Dimensional Metrology Using the Scanning Electron Microscope
Published: 12/31/1987
Author: Michael T Postek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5875

218. Resolution and Measurement in the Scanning Electron Microscope
Published: 12/31/1987
Author: Michael T Postek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=25567

219. Scanning Electron Microscope Linewidth Measurement Standards Programat the National Bureau of Standards
Published: 12/31/1987
Authors: Michael T Postek, Robert D. Larrabee, William J. Keery
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=23904

220. Some Observations on Tool Sharpness and Sub-Surface Damage in Single Point Diamond Turning
Published: 12/31/1987
Authors: C J Evans, R. Polvani, Michael T Postek, R. Rohrer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=8576



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