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You searched on: Author: michael postek

Displaying records 211 to 220 of 233 records.
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211. Low Accelerating Voltage SEM Imaging and Metrology Using Backscattered Electrons
Published: 12/1/1990
Author: Michael T Postek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13038

212. Low-Profile High-Efficiency Microchannel-Plate Detector System for Scanning Electron Microscopy Applications
Published: 6/1/1990
Authors: Michael T Postek, William J. Keery, Nolan V. Frederick
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=3462

213. Inspection of Single-Point Diamond Turning Tools at Low Accelerating Voltage in a Scanning Electron Microscope
Published: 12/31/1989
Authors: Michael T Postek, C J Evans
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14724

214. Metrological Electron Microscope for the Certification of Magnification and Linewidth Artifacts for the Semiconductor Industry
Published: 12/31/1989
Authors: Michael T Postek, William J. Keery, S. Jones
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13631

215. Scanning Electron Microscope-Based Metrological Electron Microscope System and New Prototype SEM Magnification Standard
Published: 12/31/1989
Author: Michael T Postek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=28937

216. Specimen Biasing to Enhance or Suppress Secondary Electron Emission from Charging Specimens at Low Accelerating Voltages
Published: 12/31/1989
Authors: Michael T Postek, William J. Keery, Robert D. Larrabee
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5505

217. Specimen Biasing at Low Accelerating Voltages
Published: 12/1/1989
Author: Michael T Postek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=1043

218. A New Approach to Accurate X-Ray Mask Measurements in a Scanning Electron Microscope
Published: 11/1/1989
Authors: Michael T Postek, Robert D. Larrabee, William J. Keery
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=26670

219. An Approach to Accurate X-Ray Mask Measurements in a Scanning Electron Microscope
Series: NIST Interagency/Internal Report (NISTIR)
Published: 1/1/1989
Authors: Michael T Postek, Robert D. Larrabee, William J. Keery
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=20079

220. Evaluation of Single Point Diamond Turning Tools
Published: 12/31/1988
Authors: C J Evans, R. Polvani, Michael T Postek, Gordon W. Day
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=861



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