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Author: yoshihiro ohno

Displaying records 161 to 170 of 174 records.
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161. LED-Based Spectrally Tunable Source for Radiometric, Photometric and Colorimetric Applications
Published: Date unknown
Authors: Irena Fryc, Steven W Brown, George P Eppeldauer, Yoshihiro Ohno
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841847

162. Measurement of Solid-State-Lighting Products
Published: Date unknown
Authors: Yoshihiro Ohno, Carl C Miller
Abstract: This paper discusses issues of photometric measurements of solid-state-lighting (SSL) products, for quantities including luminous flux, luminous efficacy, luminous intensity distribution, and color characteristics. Standards for SSL products are urge ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841077

163. Measuring Color Quality of Light Sources
Published: Date unknown
Authors: Wendy L Davis, Yoshihiro Ohno
Abstract: The successful commercialization of solid-state lighting for general illumination will require an effective method to characterize the color quality of these sources. The distinctive spectral characteristics of solid-state lighting sources present bo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841041

164. NIST Calibration Facility for Display Colorimeters
Published: Date unknown
Authors: Steven W Brown, Yoshihiro Ohno
Abstract: A calibration facility has been developed at the National Institute of Standards and Technology (NIST) to address the need for high accuracy color measurementsof displays. Calibration services tailored to display measuremets are planned for colimeter ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841337

165. NIST Facility for Color Rendering Simulation
Published: Date unknown
Authors: Wendy L Davis, J L Gardner, Yoshihiro Ohno
Abstract: The color rendering index (CRI) does not adequately assess the color rendering properties of solid-state light sources. An improved metric will be critical to the development of such new light sources for general lighting applications. A facility ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840953

166. NIST Measurement Services: Total Spectral Radiant Flux Calibrations
Series: Special Publication (NIST SP)
Report Number: sp
Published: Date unknown
Authors: Yuqin Zong, Carl C Miller, Yoshihiro Ohno
Abstract: The National Institute of Standards and Technology supplies calibrated standards and special tests of incandescent type of lamps for total spectral radiant flux (TSRF) from 360 nm to 830 nm. The total spectral radiant flux scale is based on both the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841078

167. NIST Reference Spectroradiometer for Color Display Calibrations
Published: Date unknown
Authors: Steven W Brown, Yoshihiro Ohno
Abstract: A program has recently been established at the National Institute of Standards and Technology (NIST) to develop calibration services for color-measuring instruments to address commercial and industrial needs for higher-accuracy measurements of displa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841976

168. New Photometer Standards for Low Uncertainty Illuminance Scale Realization
Published: Date unknown
Authors: George P Eppeldauer, Carl C Miller, Yoshihiro Ohno
Abstract: Improved performance photometers have been developed at the National Institute of Standards and Technology (NIST) to utilize the low spectral responsivity uncertainty of spectral irradiance responsivity measurements performed on the facility of Spect ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841066

169. Optical Metrology for LEDs and Solid State Lighting
Published: Date unknown
Author: Yoshihiro Ohno
Abstract: The performance of Light Emitting Diodes (LEDs), including efficiency, flux level, lifetime, and the variation of color, is advancing at a remarkable pace. LEDs are increasingly used for many applications including automotive, aviation, display, tran ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=840989

170. Recent Developments in Detector-Based Photometry and Future Needs in Photometry
Published: Date unknown
Author: Yoshihiro Ohno
Abstract: A group of standard photometers are now used to realize, maintain, and transfer the photometric units at the National Institute of Standards and Technology (NIST). The detector-based calibration procedures utilizing standard photometers have been im ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841404



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Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
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  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
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  • SP 700-XX: Industrial Measurement Series
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  • SP 823-XX: Integrated Services Digital Network Series