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You searched on: Author: joseph kopanski

Displaying records 101 to 110 of 116 records.
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101. Semiconductor Measurement Technology: Improved Characterization and Evaluation Measurements for HgCdTe Detector Materials, Processes and Devices Used on the GOES and TIROS Satellites
Series: Special Publication (NIST SP)
Published: 4/1/1994
Authors: David G Seiler, J R. Lowney, W. Robert Thurber, Joseph J Kopanski, George Gibson Harman
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=13439

102. Boron-Implanted 6H-SiC Diodes
Published: 8/1/1993
Authors: M Ghezzo, D. M. Brown, E. Downey, J K Kretchmer, Joseph J Kopanski
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=6302

103. Review of Semiconductor Microelectronic Test Structures with Applications to Infrared Detector Materials and Processes
Published: 7/1/1993
Authors: Joseph J Kopanski, C. E. Schuster
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=11257

104. Charge Trapping in Cubic Silicon Carbide MIS Capacitors
Published: 12/31/1992
Author: Joseph J Kopanski
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=6576

105. High Spatial Resolution Mapping of Resistivity Variations in Semiconductors
Published: 12/31/1992
Authors: Joseph J Kopanski, G. P. Carver, J R. Lowney, D. S. Miles, Donald B. Novotny
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=19136

106. High-Spatial-Resolution Mapping Applied to Mercury Cadmium Telluride
Published: 8/1/1992
Authors: Joseph J Kopanski, J R. Lowney, Donald B. Novotny, David G Seiler, A. Simmons, J. Ramsey
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=12351

107. Assessment of Reliability Concerns for Wide-Temperature Operation of Semiconductor Devices and Circuits
Published: 12/31/1991
Authors: Joseph J Kopanski, David L. Blackburn, George Gibson Harman, David Warren Berning
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=4347

108. High Spatial Resolution Mapping of Semiconductor Resistivity
Published: 12/31/1991
Authors: Joseph J Kopanski, J R. Lowney, D. S. Miles, Donald B. Novotny, G. P. Carver
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=18544

109. High-Spatial-Resolution Mapping Applied to Mercury Cadmium Telluride
Published: 12/31/1991
Authors: Joseph J Kopanski, J R. Lowney, Donald B. Novotny, David G Seiler, A. Simmons, J. Ramsey
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14956

110. Permittivity Measurements on Molecular-Sized Samples, Extended Abstract
Published: 12/1/1990
Authors: A. van Roggen, L. Yuwono, Hui Zhou, Paul H Meijer, Joseph J Kopanski
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=15920



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Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series