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Author: joseph kopanski

Displaying records 101 to 107.
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101. Permittivity Measurements on Molecular-Sized Samples, Extended Abstract
Published: 12/1/1990
Authors: A. van Roggen, L. Yuwono, Hui Zhou, Paul H Meijer, Joseph J Kopanski
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=15920

102. Verification of the Relation Between Two-Probe and Four-Probe Resistances as Measured on Silicon Wafers
Published: 12/1/1990
Authors: Joseph J Kopanski, John Albers, G. P. Carver, James R. Ehrstein
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=1227

103. MIS Capacitor Studies on Silicon Carbide Single Crystals: Final Report for May 8, 1989 to November 8, 1989
Series: NIST Interagency/Internal Report (NISTIR)
Published: 7/1/1990
Author: Joseph J Kopanski
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=28845

104. Electrical Characterization of Beta Silicon Carbide MIS Capacitors with Thermally Grown or Chemical-Vapor-Deposited Oxides
Published: 12/31/1989
Authors: Joseph J Kopanski, Donald B. Novotny
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5009

105. Experimental Verification of the Relation Between Two-Probe and Four-Probe Resistances
Published: 12/31/1989
Authors: Joseph J Kopanski, John Albers, G. P. Carver
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=8193

106. Development and Characterization of Insulating Layers on Silicon Carbide: Annual Report for Feb. 14, 1988 to Feb. 14, 1989
Series: NIST Interagency/Internal Report (NISTIR)
Published: 9/1/1989
Authors: Joseph J Kopanski, Donald B. Novotny
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=14440

107. Specific Contact Resistivity of Metal-Semiconductor Contacts - A New, Accurate Method Linked to Spreading Resistance
Published: 12/31/1988
Authors: G. P. Carver, Joseph J Kopanski, Donald B. Novotny, R. A. Forman
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=15466



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