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Author: jason killgore
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1. Effect of elastic deformation on frictional properties of few-layer graphene
Published: 1/9/2012
Authors: Alexander Y. Smolyanitsky, Jason Philip Killgore, Vinod K Tewary
Abstract: We describe the results of Brownian dynamics (BD) simulations of an AFM tip scanned on locally suspended few-layer graphene. The effects of surface compliance and sample relaxation are directly related to the observed friction force. We demonstrate t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909404

2. In-Situ Measurement of Atomic Force Microscope Tip Wear by Contact Resonance Force Microscopy
Published: 3/15/2011
Authors: Jason Philip Killgore, Roy Howard Geiss, Donna C Hurley
Abstract: Contact resonance force microscopy (CR-FM) mapping provides a means of continuously tracking contact stiffness while scanning an AFM tip in contact with a substrate. Because the contact stiffness is a function of contact radius, tip wear leading to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907208

3. Low Force AFM Nanomechanics with Higher-Eigenmode Contact Resonance Spectroscopy
Published: 1/11/2012
Authors: Jason Philip Killgore, Donna C Hurley
Abstract: Atomic force microscopy (AFM) methods for quantitative measurements of elastic modulus on stiff (>10 GPa) materials typically require tip-sample contact forces in the hundreds of nanonewton to few micronewton range. Such large forces can incur sa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909735

4. Pulsed Contact Resonance in the Atomic Force Microscope
Published: 1/30/2012
Authors: Jason Philip Killgore, Donna C Hurley
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910331

5. Quantitative Subsurface Contact Resonance Force Microscopy of Model Polymer Nanocomposites
Published: 3/16/2011
Authors: Jason Philip Killgore, Jennifer Y. Kelly, Christopher M Stafford, Michael J Fasolka, Donna C Hurley
Abstract: We present experimental results on the use of quantitative contact resonance force microscopy (CR-FM) for mapping the planar location and depth of 50 nm silica nanoparticles buried beneath polystyrene films 30 nm to 165 nm thick. The presence of sha ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907026

6. Quantitative Viscoelastic Mapping of Polyolefin Blends with Contact Resonance Atomic Force Microscopy
Published: 5/9/2012
Authors: Dalia Yablon, Anil Gannepalli, Roger Proksch, Jason Philip Killgore, Donna C Hurley, Andy Tsou
Abstract: The storage modulus (E') and loss modulus (E") of polyolefin blends have been mapped on the nanoscale with contact resonance force microscopy (CR-FM), a dynamic contact mode of atomic force microscopy (AFM). CR-FM maps for a blend of polyethylene, po ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909881

7. Relationship between Barrier Layer Tg and TFC Membrane Performance: Effect of Chlorine Treatment
Published: 3/8/2012
Authors: Sajjad H. Maruf, Dae U. Ahn, John Pellegrino, Jason Philip Killgore, Alan R. Greenberg, Yifu Ding
Abstract: Thin film composite (TFC) reverse osmosis (RO) membranes play a significant role in addressing rapidly expanding global needs for potable water. A well-known problem of TFC membranes is their sensitivity to oxidizing agents such as chlorine, whi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910101

8. Viscoelastic Property Mapping with Contact Resonance Force Microscopy
Published: 11/4/2011
Authors: Jason Philip Killgore, Donna C Hurley, Dalia Yablon, Joseph Turner, Philip Yuya, Roger Proksch, Anil Gannepalli, Andy Tsou
Abstract: We demonstrate accurate nanoscale mapping of loss and storage modulus on a polystyrene-polypropylene blend with contact resonance force microscopy (CR-FM). The viscoelastic properties are extracted from spatially resolved maps of the contact resonanc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909102