NIST logo

Publications Portal

You searched on:
Author: jason killgore
Sorted by: title

Displaying records 1 to 10 of 13 records.
Resort by: Date / Title

1. Anomalous Friction in Suspended Graphene
Published: 9/20/2012
Authors: Alexander Y. Smolyanitsky, Jason Philip Killgore
Abstract: Since the discovery of the Amonton's law and with support of modern tribological models, friction between surfaces of three-dimensional materials is known to generally increase when the surfaces are in closer contact. Here, using molecular dynamics s ...

2. Dynamic contact AFM methods for nanomechanical properties
Published: 12/1/2013
Authors: Donna C. Hurley, Jason Philip Killgore
Abstract: This chapter focuses on two atomic force microscopy (AFM) methods for nanomechanical characterization: force modulation microscopy (FMM) and contact resonance (CR) techniques. FMM and CR methods share several common features that distinguish them fro ...

3. Effect of elastic deformation on frictional properties of few-layer graphene
Published: 1/9/2012
Authors: Alexander Y. Smolyanitsky, Jason Philip Killgore, Vinod K Tewary
Abstract: We describe the results of Brownian dynamics (BD) simulations of an AFM tip scanned on locally suspended few-layer graphene. The effects of surface compliance and sample relaxation are directly related to the observed friction force. We demonstrate t ...

4. Hydrodynamic Corrections to Contact Resonance Force Microscopy Measurements of Viscoelastic Loss Tangent
Published: 7/9/2013
Authors: Ryan C Tung, Jason Philip Killgore, Donna C. Hurley
Abstract: We present a method to improve accuracy in measurements of nanoscale viscoelastic material properties with contact resonance (CR) AFM methods. Through the use of the two-dimensional hydrodynamic function, we obtain a more precise estimate of the flu ...

5. In-Situ Measurement of Atomic Force Microscope Tip Wear by Contact Resonance Force Microscopy
Published: 3/15/2011
Authors: Jason Philip Killgore, Roy Howard Geiss, Donna C. Hurley
Abstract: Contact resonance force microscopy (CR-FM) mapping provides a means of continuously tracking contact stiffness while scanning an AFM tip in contact with a substrate. Because the contact stiffness is a function of contact radius, tip wear leading to ...

6. Low Force AFM Nanomechanics with Higher-Eigenmode Contact Resonance Spectroscopy
Published: 1/11/2012
Authors: Jason Philip Killgore, Donna C. Hurley
Abstract: Atomic force microscopy (AFM) methods for quantitative measurements of elastic modulus on stiff (>10 GPa) materials typically require tip-sample contact forces in the hundreds of nanonewton to few micronewton range. Such large forces can incur sa ...

7. Measurement of viscoelastic loss tangent with contact resonance modes of atomic force microscopy
Published: 11/26/2013
Authors: Donna C. Hurley, Sara E. Campbell, Jason Philip Killgore, Lewis M Cox, Yifu Ding
Abstract: We show how atomic force microscopy techniques based on contact resonance (CR) can be used to measure the viscoelastic loss tangent tan δ of polymeric materials. Absolute values of tan δ do not involve intermediate calculation of loss modul ...

8. Pulsed Contact Resonance in the Atomic Force Microscope
Published: 1/30/2012
Authors: Jason Philip Killgore, Donna C. Hurley

9. Quantitative Subsurface Contact Resonance Force Microscopy of Model Polymer Nanocomposites
Published: 3/16/2011
Authors: Jason Philip Killgore, Jennifer Y. Kelly, Christopher M Stafford, Michael J Fasolka, Donna C. Hurley
Abstract: We present experimental results on the use of quantitative contact resonance force microscopy (CR-FM) for mapping the planar location and depth of 50 nm silica nanoparticles buried beneath polystyrene films 30 nm to 165 nm thick. The presence of sha ...

10. Quantitative Viscoelastic Mapping of Polyolefin Blends with Contact Resonance Atomic Force Microscopy
Published: 5/9/2012
Authors: Dalia Yablon, Anil Gannepalli, Roger Proksch, Jason Philip Killgore, Donna C. Hurley, Andy Tsou
Abstract: The storage modulus (E') and loss modulus (E") of polyolefin blends have been mapped on the nanoscale with contact resonance force microscopy (CR-FM), a dynamic contact mode of atomic force microscopy (AFM). CR-FM maps for a blend of polyethylene, po ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series