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Author: jason killgore
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1. Anomalous Friction in Suspended Graphene
Published: 9/20/2012
Authors: Alexander Y. Smolyanitsky, Jason Philip Killgore
Abstract: Since the discovery of the Amonton's law and with support of modern tribological models, friction between surfaces of three-dimensional materials is known to generally increase when the surfaces are in closer contact. Here, using molecular dynamics s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910882

2. Dynamic contact AFM methods for nanomechanical properties
Published: 12/1/2013
Authors: Donna C. Hurley, Jason Philip Killgore
Abstract: This chapter focuses on two atomic force microscopy (AFM) methods for nanomechanical characterization: force modulation microscopy (FMM) and contact resonance (CR) techniques. FMM and CR methods share several common features that distinguish them fro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911068

3. Effect of elastic deformation on frictional properties of few-layer graphene
Published: 1/9/2012
Authors: Alexander Y. Smolyanitsky, Jason Philip Killgore, Vinod K Tewary
Abstract: We describe the results of Brownian dynamics (BD) simulations of an AFM tip scanned on locally suspended few-layer graphene. The effects of surface compliance and sample relaxation are directly related to the observed friction force. We demonstrate t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909404

4. Hydrodynamic Corrections to Contact Resonance Force Microscopy Measurements of Viscoelastic Loss Tangent
Published: 7/9/2013
Authors: Ryan C Tung, Jason Philip Killgore, Donna C. Hurley
Abstract: We present a method to improve accuracy in measurements of nanoscale viscoelastic material properties with contact resonance (CR) AFM methods. Through the use of the two-dimensional hydrodynamic function, we obtain a more precise estimate of the flu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913520

5. In-Situ Measurement of Atomic Force Microscope Tip Wear by Contact Resonance Force Microscopy
Published: 3/15/2011
Authors: Jason Philip Killgore, Roy Howard Geiss, Donna C. Hurley
Abstract: Contact resonance force microscopy (CR-FM) mapping provides a means of continuously tracking contact stiffness while scanning an AFM tip in contact with a substrate. Because the contact stiffness is a function of contact radius, tip wear leading to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907208

6. Low Force AFM Nanomechanics with Higher-Eigenmode Contact Resonance Spectroscopy
Published: 1/11/2012
Authors: Jason Philip Killgore, Donna C. Hurley
Abstract: Atomic force microscopy (AFM) methods for quantitative measurements of elastic modulus on stiff (>10 GPa) materials typically require tip-sample contact forces in the hundreds of nanonewton to few micronewton range. Such large forces can incur sa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909735

7. Measurement of viscoelastic loss tangent with contact resonance modes of atomic force microscopy
Published: 11/26/2013
Authors: Donna C. Hurley, Sara E. Campbell, Jason Philip Killgore, Lewis M Cox, Yifu Ding
Abstract: We show how atomic force microscopy techniques based on contact resonance (CR) can be used to measure the viscoelastic loss tangent tan δ of polymeric materials. Absolute values of tan δ do not involve intermediate calculation of loss modul ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914560

8. Pulsed Contact Resonance in the Atomic Force Microscope
Published: 1/30/2012
Authors: Jason Philip Killgore, Donna C. Hurley
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910331

9. Quantitative Subsurface Contact Resonance Force Microscopy of Model Polymer Nanocomposites
Published: 3/16/2011
Authors: Jason Philip Killgore, Jennifer Y. Kelly, Christopher M Stafford, Michael J Fasolka, Donna C. Hurley
Abstract: We present experimental results on the use of quantitative contact resonance force microscopy (CR-FM) for mapping the planar location and depth of 50 nm silica nanoparticles buried beneath polystyrene films 30 nm to 165 nm thick. The presence of sha ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907026

10. Quantitative Viscoelastic Mapping of Polyolefin Blends with Contact Resonance Atomic Force Microscopy
Published: 5/9/2012
Authors: Dalia Yablon, Anil Gannepalli, Roger Proksch, Jason Philip Killgore, Donna C. Hurley, Andy Tsou
Abstract: The storage modulus (E') and loss modulus (E") of polyolefin blends have been mapped on the nanoscale with contact resonance force microscopy (CR-FM), a dynamic contact mode of atomic force microscopy (AFM). CR-FM maps for a blend of polyethylene, po ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909881



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