NIST logo

Publications Portal

You searched on: Author: nathanael heckert

Displaying records 21 to 30 of 37 records.
Resort by: Date / Title


21. A Risk-Uncertainty Formula Accounting for Uncertainties of Failure Probability and Consequence in a Nuclear Powerplant
Published: 7/20/2010
Authors: Jeffrey T Fong, Stephen R Gosselin, Pedro Vincente Marcal, James J Filliben, Nathanael A Heckert, Robert E Chapman
Abstract: This paper is a continuation of a recent ASME Conference paper entitled "Design of a Python-Based Plug-in for Bench-marking Probabilistic Fracture Mechanics Computer Codes with Failure Event Data" (PVP2009-77974). In that paper, which was co-authore ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905670

22. AN ECONOMICS-BASED INTELLIGENCE (EI) TOOL FOR PRESSURE VESSEL & PIPING (PVP) FAILURE CONSEQUENCE ESTIMATION
Published: 7/20/2010
Authors: Robert E Chapman, Jeffrey T Fong, David T Butry, Douglas S Thomas, James J Filliben, Nathanael A Heckert
Abstract: This paper is built around ASTM E 2506, Standard Guide for Developing a Cost-Effective Risk Mitigation Plan for New and Existing Constructed Facilities. E 2506 establishes a three-step protocol--perform risk assessment, specify combinations of risk ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905671

23. Design of a Python-based Plug-in for Benchmarking Probabilistic Fracture Mechanics Computer Codes with Failure Event Data
Published: 7/27/2009
Authors: Jeffrey T Fong, Roland deWit, Pedro Vincente Marcal, James J Filliben, Nathanael A Heckert, Stephen R Gosselin
Abstract: In a 2007 paper entitled "Application of Failure Event Data to Benchmark Probabilistic Fracture Mechanics (PFM) Computer Codes" (Simonen, F. A., Gosselin, S. R., Lydell, B. O. Y., Rudland, D. L., & Wikowski, G. M. Proc. ASME PVP Conf., San ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902444

24. A Design-of-Experiments Plug-In for Estimating Uncertainties in Finite Element Simulations
Published: 5/18/2009
Authors: Jeffrey T Fong, Roland deWit, Pedro Vincente Marcal, James J Filliben, Nathanael A Heckert
Abstract: The objective of this paper is to introduce an economical and user-friendly technique for estimating a specific type of finite element simulation uncertainties, or, "error bars," for a class of mathematical models, of which no closed-form o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902335

25. Through-focus Scanning and Scatterfield Optical Methods for Advanced Overlay Target Analysis
Published: 9/1/2008
Authors: Ravikiran Attota, Michael T. Stocker, Richard M Silver, Nathanael A Heckert, Hui H. Zhou, Richard J Kasica, Lei Chen, Ronald G Dixson, Ndubuisi George Orji, Bryan M Barnes, Peter Lipscomb
Abstract: In this paper we present overlay measurement techniques that use small overlay targets for advanced semiconductor applications. We employ two different optical methods to measure overlay using modified conventional optical microscope platforms. They ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902294

26. A Web-Based Data Analysis Methodology for Estimating Reliability of Weld Flaw Detection, Location, and Sizing
Published: 7/27/2008
Authors: Jeffrey T Fong, Owen F Hedden, James J Filliben, Nathanael A Heckert
Abstract: Recent advances in computer technology, intemet communication networks, and fmite element modeling and analysis capability have made it feasible for engineers to accelerate the feedback loop between the field inspectors of a structure or component fo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=152099

27. Robust Engineering Design for Failure Prevention
Published: 7/27/2008
Authors: Jeffrey T Fong, James J Filliben, Nathanael A Heckert, Roland deWit, Barry Bernstein
Abstract: To advance the state of the art of engineering design, we introduce a new concept on the "robustness" of a structure by measuring its ability to sustain a sudden loss of a part without causing an immediate collapse.  The concept is bas ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=152089

28. Uncertainty Estimate of Charpy Data Using a 5-factor 8-run Design of Experiments
Published: 7/27/2008
Authors: Charles G. Interrante, Jeffrey T Fong, James J Filliben, Nathanael A Heckert
Abstract: Scatter in laboratory data with duplicates on Charpy impact tests is analyzed by identifying several sources of variability such as temperature, manganese sulfide, initial strain, mis-orientation, and notch radius in order to estimate the predictive ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=152114

29. Design of Experiments Approach to Verification and Uncertainty Estimation of Simulations based on Finite Element Method
Published: 6/11/2008
Authors: Jeffrey T Fong, James J Filliben, Nathanael A Heckert, Roland deWit
Abstract: A fundamental mathematical modeling and computational tool in engineering and applied sciences is the finite element method (FEM).  The formulation of every such problem begins with the building of a mathematical model with carefully chosen simp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=150675

30. Relationship between dispersion metric and properties of PMMA/SWNT nanocomposites
Published: 6/13/2007
Authors: Takashi Kashiwagi, Jeffrey A Fagan, Jack F Douglas, Kazuya Yamamoto, Nathanael A Heckert, Stefan D Leigh, Jan Obrzut, Fangming Du, Minfang Mu, Sheng Lin-Gibson, K Winey, R Haggenmueller
Abstract: Particle spatial dispersion is a crucial characteristic of polymer composite materials and this property is recognized as especially important innanocomposite materials due to the general tendency of nanoparticles to aggregate under processing condit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854038



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series