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You searched on: Author: christina hacker

Displaying records 41 to 50 of 57 records.
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41. Molecule induced interface states dominate charge transport in Si-alkyl-metal junctions
Published: 8/26/2008
Authors: Lam H. Yu, Nadine Emily Gergel-Hackett, Christopher D Zangmeister, Christina Ann Hacker, Curt A Richter, James G. Kushmerick
Abstract: Abstract. Semiconductor-molecule-metal junctions consisting of alkanethiol mono- layers self-assembled on both p+ and n¡ type highly doped Si(111)wires contacted with a 10 ¹m Au wire in a crossed-wire geometry are examined. Low temperature transpo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832205

42. Demonstration of Molecular Assembly on Silicon (100) for CMOS-Compatible Molecule-Based Electronic Devices
Published: 3/7/2008
Authors: Nadine Emily Gergel-Hackett, Christopher D Zangmeister, Christina Ann Hacker, Lee J Richter, Curt A Richter
Abstract: In this work, we establish the potential of a UV-promoted direct attachment of alkanes with alcohol and thiol linkers to the CMOS-compatible silicon (100) orientation for use in closed, planar, molecular electronic devices. We develop processes for m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32875

43. Probing molecules in integrated solid-state silicon junctions
Published: 1/12/2008
Authors: Wenyong Wang, Adina Scott, Nadine Emily Gergel-Hackett, Christina Ann Hacker, David Janes, Curt A Richter
Abstract: In this research work, we fabricate integrated Si-SAMs-metal devices using the ?soft? top metal deposition technique and probe their electronic properties with IETS characterizations. IETS confirmed the existence of molecular species in the device ar ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32700

44. The Characterization of Silicon-Based Molecular Devices
Published: 9/30/2007
Authors: Nadine Emily Gergel-Hackett, Christina Ann Hacker, Lee J Richter, Oleg A Kirillov, Curt A Richter
Abstract: In order to realize molecular electronic (ME) technology, an intermediate integration with more traditional silicon-based technologies will likely be required. However, there has been little effort to develop the metrology needed to enable the fabric ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32615

45. Origin of differing reactivities of aliphatic chains on H-Si(111) and oxide surfaces with metal
Published: 6/5/2007
Authors: Christina Ann Hacker, Curt A Richter, Nadine Emily Gergel-Hackett, Lee J Richter
Abstract: The interaction of deposited metals with monolayer films is critical to the understanding of, and ultimate utility of, the emerging arena of molecular electronics. We present the results of a thorough study of the interaction of vapor deposited Au an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32527

46. On-Chip Characterization of Molecular Electronic Devices using CMOS: The Design and Simulation of a Hybrid Circuit Based on Experimental Molecular Electronic Device Results
Published: 3/11/2007
Authors: Nadine Emily Gergel-Hackett, Garrett S Rose, Pater Paliwoda, Christina Ann Hacker, Curt A Richter
Abstract: The focus of the field of molecular electronics in recent years has been mostly limited to the development of molecular electronic test devices and the characterization of electron transport through organic molecules. However, in order for molecular ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32587

47. Interface Characterization of Molecular-Monolayer/SiO2 Based Molecular Junctions
Published: 8/1/2006
Authors: Curt A Richter, Christina Ann Hacker, Lee J Richter, Oleg A Kirillov, Eric M. Vogel
Abstract: The properties of monolayers of molecules on thin SiO2 are of great interest for future hybrid Si-molecular device technologies. We present here a correlation of the results of dc-current-voltage (IV) and capacitance-voltage (CV) measurements with vi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32322

48. Interface Characterization of Molecular-Monolayer/SiO2 Based Molecular Junctions
Published: 4/19/2006
Authors: Curt A Richter, Christina Ann Hacker, Lee J Richter, Oleg A Kirillov, John S Suehle, Eric M. Vogel
Abstract: We present a correlation of the results of dc-current-voltage (IV) and ac-capacitance-voltage (CV) measurements with vibrational spectroscopy of Au/monolayer/SiO2/Si structures to establish an improved understanding of the interactions at the buried ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32175

49. Electrical and Spectroscopic Characterization of Metal/Monolayer/Si Devices
Published: 11/24/2005
Authors: Curt A Richter, Christina Ann Hacker, Lee J Richter
Abstract: A simple technique for vibrational spectroscopy of metal/monolayer/silicon structures is applied to study the interaction of Au, Al, and Ti with alkane monolayers, either assembled onto thin oxides or directly attached to Si. The results are correlat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31908

50. IR Spectroscopic Characterization of the Buried Metal Interface of Metal-Molecule-Silicon Vertical Diodes
Published: 9/28/2005
Authors: Christina Ann Hacker, Curt A Richter, Lee J Richter
Abstract: We have developed and utilized p-polarized backside reflection absorption infrared spectroscopy (pb-RAIRS) to examine dielectrics between silicon substrates and metallic overlayers. The technique has been used to investigate oxides, organic layers on ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31935



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