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Author: aaron forster

Displaying records 31 to 35.
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31. Spatial Correlations and Robust Statistical Analysis for Combinatorial Methodologies
Published: 1/1/2004
Authors: Eric J. Amis, S B Kennedy, Aaron M Forster, N. R. Washburn
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853944

32. High-Throughput Measurements of Polymer Adhesion and Mechanical Properties
Published: 9/1/2003
Authors: Christopher M Stafford, Aaron M Forster, C Harrison, Cher H. Davis, Eric J. Amis, Alamgir Karim
Abstract: Polymer adhesion is important to numerous technologies including electronic packaging, coatings and paints, biomedical implants, and pressure-sensitive adhesives. The challenge is to understand the fundamental driving forces for the development of a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852176

33. Combinatorial Adhesion Measurements: Factorial Design Concepts for Data Collection and Library Evaluation
Published: 1/1/2003
Authors: Aaron M Forster, Christopher M Stafford, Alamgir Karim, Eric J. Amis
Abstract: Product discovery in the adhesives industry is often characterized by experimental trial and error combined with empirical knowledge. The NIST developed multi-lens combinatorial adhesion test (MCAT) has the potential to increase the efficiency of th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852121

34. The Influence of Shearing Parameters on the Frictional Forces Measured Between Polymer Brushes
Published: 1/1/2003
Authors: Aaron M Forster, S. Michael Kilbey
Abstract: Polymer brushes have potential as end-tethered lubricants. Brush layers immersed in a good solvent must be compressed to ~16% of their equilibrium height before friction forces are measured. The same experiment in a solvent near the theta temperatu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852119

35. Polymer Science at the NIST Combinatorial Methods Center
Published: 8/1/2002
Authors: Cher H. Davis, Kathryn L Beers, Aaron M Forster, Christopher M Stafford, A P Smith, C Harrison, Weiping Zhang, Alamgir Karim, Eric J. Amis
Abstract: The measurements, standards, and test methods developed by NIST, in partnership with other organizations, often help unlock the potential of new discoveries and budding technologies. Combinatorial methods are a textbook example. These emerging tools ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852011



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