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Author: william estler

Displaying records 11 to 20 of 37 records.
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11. A Laser Tracker Calibration System
Published: 1/1/2002
Authors: Daniel S Sawyer, Bruce R. Borchardt, Steven David Phillips, Charles Fronczek, William Tyler Estler
Abstract: We describe a laser tracker calibration system developed for frameless coordinate metrology systems. The system employs a laser rail to provide an 'in situ' calibrated length standard that is used to test a tracker in several different configurations ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821749

12. Displacement Uncertainty in Interferometric Radius Measurements
Published: 1/1/2002
Authors: William Tyler Estler, Tony L Schmitz, Angela Davies, Christopher J. Evans
Abstract: Interferometric radius measurements may be completed using a radius bench, where radius is defined as the displacement between the confocal and cat''s eye nulls (identified using a figure measuring interferometer). Measurements of a Zerodur sphere ha ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821903

13. Large-Scale Metrology - An Update
Published: 1/1/2002
Authors: William Tyler Estler, K L Edmundson, G Peggs, D H Parker
Abstract: Developments in large-scale engineering metrology since the 1978 report of Puttock are reviewed. Advances in optical technology and fast, low-cost computation have led to wide-spread use of laser trackers and digital photogrammetry for general-purpos ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821742

14. A Careful Consideration of the Calibration Concept
Series: Journal of Research (NIST JRES)
Published: 3/1/2001
Authors: Steven David Phillips, William Tyler Estler, Theodore D Doiron, K Eberhardt, M Levenson
Abstract: This paper is a detailed discussion of the technical aspects of the calibration process with emphasis on the definition of the measurand, the conditions under which the calibration results are valid, and the subsequent use of the calibration results ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823126

15. Rationale and Procedures for Development of a NASA Primary Metrology Lab. for Large Optics
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6710
Published: 3/1/2001
Authors: Theodore Vincent Vorburger, Christopher J. Evans, William Tyler Estler
Abstract: Traceable optics metrology is not an expensive overhead. Rather it can improve NASA's procurement process and eliminate costly Hubble-like mistakes. Improved procurement? In deciding if a part meets specification, ISO Standard 14253, Part 1^u[1] s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823134

16. A Careful Consideration of the Calibration Concept
Published: 1/1/2001
Authors: Steven David Phillips, William Tyler Estler, Theodore D Doiron, K Eberhardt, M. Levenson
Abstract: This paper is a detailed discussion of the technical aspects of the calibration process with emphasis on the definition of the measurand, the conditions under which the calibration results are valid, and the subsequent use of the calibration results ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=824612

17. Rationale and Procedures for Development of a NASA Primary Metrology Laboratory for Large Optics
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6710
Published: 1/1/2001
Authors: Theodore Vincent Vorburger, Christopher J. Evans, William Tyler Estler
Abstract: Traceable optics metrology is not an expensive overhead. Rather it can improve NASA''s procurement process and eliminate costly Hubble-like mistakes. In deciding if a part meets specification, ISO Standard 14253, Part 1 requires that the vend ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=821573

18. Angle Metrology of Dispersion Prisms
Published: 1/1/2000
Authors: William Tyler Estler, Y H Queen, Christopher J. Evans
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820111

19. Measurement as Inference: Fundamental Ideas
Published: 8/1/1999
Author: William Tyler Estler
Abstract: We review the logical basis of inference as distinct from deduction, and show that measurements in general, and dimensional metrology in particular, are best viewed as exercises in probable inference: reasoning from incomplete information. The resul ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820928

20. Improving Kinematic Touch Trigger Probe Performance
Published: 4/1/1999
Authors: Steven David Phillips, William Tyler Estler
Abstract: Kinematic touch trigger probes are widely used on CMMs. This article gives CMM users advice on how to minimize the systematic errors associated with this class of probes.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820943



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