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You searched on: Author: john bonevich

Displaying records 31 to 40 of 68 records.
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31. Origin of Exchange Decoupling Effects in High-Coercivity Air-Annealed CoPd Multilayers
Published: 5/1/2005
Authors: William F. Egelhoff Jr., Robert D McMichael, J Mallett, Alexander J. Shapiro, Cedric John Powell, John E Bonevich, J H Judy, J H Thomas, Erik B. Svedberg
Abstract: We have achieved excellent exchange decoupling of grains in CoPd multilayers by annealing in air at 300 C. Samples exhibit a slope in the hysteresis loop close to 1.0, nucleation fields as large as 1.1 T, and coercivities as large as 1.6 T. These are ...

32. A Bayesian/Maximum Entropy Method for the Certification of a Nanocrystallite-Size NIST Standard Reference Material
Published: 7/1/2004
Authors: N G Armstrong, W Kalceff, James P Cline, John E Bonevich
Abstract: A Bayesian/Maximum Entropy (MaxEnt) method for determining crystallite size distribution and morphology from size-broadened x-ray line profiles is presented. This method will be used in certifying a nanocrystallite-size standard reference material ( ...

33. Electrical Properties of Superfilled Sub-Micrometer Silver Metallizations
Published: 7/1/2004
Authors: Daniel Josell, C + Burkhard, David R Kelley, Yi-Wen Cheng, R R Keller, John E Bonevich, Y Li, B C Baker, C A Witt, Thomas P Moffat

34. Bayesian Inference of Nanoparticle-Broadened X-Ray Line Profiles
Series: Journal of Research (NIST JRES)
Published: 2/1/2004
Authors: N G Armstrong, W Kalceff, James P Cline, John E Bonevich
Abstract: A single and self-contained method for determining the crystallite-size distribution and shape from experimental line profile data is presented. We have shown that the crystallite-size distribution can be determined without assuming a functional for ...

35. Coercivities above 10 kOe in CoPd Superlattices
Published: 1/1/2004
Authors: William F. Egelhoff Jr., Cedric John Powell, L Gan, P J Chen, H Ettendgui, D Tirosh, Robert D McMichael, Mark D Stiles, J Mallett, Alexander J. Shapiro, John E Bonevich
Abstract: We have achieved excellent grain isolation in CoPd superlattices by using 10 nm Au as both an underlayer and an overlayer and diffusing Au into the grain boundaries by annealing for {approximately equal to} 30 min. at 300 degrees C. The grain isola ...

36. Structure and Magnetic Properties of Electrodeposition Co on n-GaAs (001)
Published: 9/19/2003
Authors: A X Ford, John E Bonevich, Robert D McMichael, Mark D Vaudin, Thomas P Moffat
Abstract: Co thin films have been electrodeposited on n-type (001) GaAs. The structure and texture of the films were investigated using x-ray diffraction (XRD) and transmission electron microscopy (TEM) while the magnetic properties were examined using a vibr ...

37. Rapid Deformation of Thin Gold Layers in Polymer Matrices Studied by X-Ray Reflectivity
Published: 8/1/2003
Authors: K Shin, H Wang, Sushil K. Satija, Charles C Han, Daniel Josell, John E Bonevich
Abstract: We have used X-ray reflectivity to measure the morphological profiles of thin Au layers of three different average thicknesses sandwiched between two polystyrene layers with different molecular weights, Mw = 52.3k and Mw - 168.5k. The results showed ...

38. Tuning the Magnetic Properties of Multilayer Nanowires
Published: 5/12/2003
Authors: John E Bonevich, Limin Sun

39. Tuning the Response of Magnetic Suspensions
Published: 5/1/2003
Authors: M. Chen, L Sun, John E Bonevich, Daniel H. Reich, C L Chien, P C Searson
Abstract: The magnetic properties of multilayer ferromagnetic/nonmagnetic (FM/NM) nanowires can be tailored by controlling the composition and length of the FM and NM segments. Manipulation of properties such as the magnetic easy axis, Curie temperature (TC), ...

40. Effects of interlayer electrode thickness in Nb/(MoSi^d2^/Nb)^dN^ stacked Josephson junctions
Published: 4/14/2003
Authors: Yonuk Chong, Paul David Dresselhaus, Samuel Paul Benz, John E Bonevich
Abstract: Dense vertically stacked Josephson junction arrays are being developed because they are desirable for voltage metrology applications. We present measurements of the uniformity and reproducibility of Nb/(MoSi^u2^/Nb)N vertically stacked junctions that ...

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