NIST logo

Publications Portal

You searched on: Author: john bonevich

Displaying records 31 to 40 of 71 records.
Resort by: Date / Title

31. Electrodeposition of Cu on Ru Barrier Layers for Damascene Processing
Published: 12/2/2005
Authors: Thomas P Moffat, Marlon L Walker, P J Chen, John E Bonevich, William F. Egelhoff Jr., Lee J Richter, Daniel Josell, C A Witt, T Aaltonen, M Ritala, M Leskela
Abstract: Superfilling of sub-micrometer trenches by direct copper electrodeposition onto PVD and ALD Ru barriers is demonstrated. The Cu nucleation and growth mode is found to be sensitive to the oxidation state of the Ru surface as well as the copper deposi ...

32. Fabrication and Measurement of Tall Stacked Arrays of SNS Josephson Junctions
Published: 6/1/2005
Authors: Nicolas Hadacek, Paul David Dresselhaus, Yonuk Chong, Samuel Paul Benz, John E Bonevich
Abstract: We have made tall, uniform stacked Josephson junction arrays by developing an etch process using an inductively coupled plasma etcher. This process produces vertical profiles in thin-film multilayers of alternating superconducting and normal metals. ...

33. Interparticle Interaction Effects in the Magnetic Properities NiO Nanorods
Published: 5/1/2005
Authors: M Seehra, H Shim, P Dutta, A Manivannan, John E Bonevich
Abstract: Magnetic properties of sol-gel synthesized 5 nm nanorods of NiO, with and without oleic acid coating to affect interparticle interactions, are reported. Particle morphologies were studied by transmission electron microscopy and temperature variations ...

34. Origin of Exchange Decoupling Effects in High-Coercivity Air-Annealed CoPd Multilayers
Published: 5/1/2005
Authors: William F. Egelhoff Jr., Robert D McMichael, J Mallett, Alexander J. Shapiro, Cedric John Powell, John E Bonevich, J H Judy, J H Thomas, Erik B. Svedberg
Abstract: We have achieved excellent exchange decoupling of grains in CoPd multilayers by annealing in air at 300 C. Samples exhibit a slope in the hysteresis loop close to 1.0, nucleation fields as large as 1.1 T, and coercivities as large as 1.6 T. These are ...

35. A Bayesian/Maximum Entropy Method for the Certification of a Nanocrystallite-Size NIST Standard Reference Material
Published: 7/1/2004
Authors: N G Armstrong, W Kalceff, James P Cline, John E Bonevich
Abstract: A Bayesian/Maximum Entropy (MaxEnt) method for determining crystallite size distribution and morphology from size-broadened x-ray line profiles is presented. This method will be used in certifying a nanocrystallite-size standard reference material ( ...

36. Electrical Properties of Superfilled Sub-Micrometer Silver Metallizations
Published: 7/1/2004
Authors: Daniel Josell, C + Burkhard, David R Kelley, Yi-Wen Cheng, R R Keller, John E Bonevich, Y Li, B C Baker, C A Witt, Thomas P Moffat

37. Bayesian Inference of Nanoparticle-Broadened X-Ray Line Profiles
Series: Journal of Research (NIST JRES)
Published: 2/1/2004
Authors: N G Armstrong, W Kalceff, James P Cline, John E Bonevich
Abstract: A single and self-contained method for determining the crystallite-size distribution and shape from experimental line profile data is presented. We have shown that the crystallite-size distribution can be determined without assuming a functional for ...

38. Coercivities above 10 kOe in CoPd Superlattices
Published: 1/1/2004
Authors: William F. Egelhoff Jr., Cedric John Powell, L Gan, P J Chen, H Ettendgui, D Tirosh, Robert D McMichael, Mark D Stiles, J Mallett, Alexander J. Shapiro, John E Bonevich
Abstract: We have achieved excellent grain isolation in CoPd superlattices by using 10 nm Au as both an underlayer and an overlayer and diffusing Au into the grain boundaries by annealing for {approximately equal to} 30 min. at 300 degrees C. The grain isola ...

39. Structure and Magnetic Properties of Electrodeposition Co on n-GaAs (001)
Published: 9/19/2003
Authors: A X Ford, John E Bonevich, Robert D McMichael, Mark D Vaudin, Thomas P Moffat
Abstract: Co thin films have been electrodeposited on n-type (001) GaAs. The structure and texture of the films were investigated using x-ray diffraction (XRD) and transmission electron microscopy (TEM) while the magnetic properties were examined using a vibr ...

40. Rapid Deformation of Thin Gold Layers in Polymer Matrices Studied by X-Ray Reflectivity
Published: 8/1/2003
Authors: K Shin, H Wang, Sushil K Satija, Charles C Han, Daniel Josell, John E Bonevich
Abstract: We have used X-ray reflectivity to measure the morphological profiles of thin Au layers of three different average thicknesses sandwiched between two polystyrene layers with different molecular weights, Mw = 52.3k and Mw - 168.5k. The results showed ...

Search NIST-wide:

(Search abstract and keywords)

Last Name:
First Name:

Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series