NIST logo

Publications Portal

You searched on:
Author: muhammad arif

Displaying records 41 to 50 of 55 records.
Resort by: Date / Title


41. Application of Neutron Interferometry to the Measurement of Thin Film Density
Published: 1/1/1999
Authors: William E Wallace III, David L Jacobson, Muhammad Arif, A I Ioffe
Abstract: The application of neutron interferometry to the measurement of the atom density of polymer thin films (<1 m thick) supported on silicon substrates is described. Polymer films were chosen primarily for their fixed, well-defined stoichiometry; howev ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851480

42. Development of the Neutron Phase Contrast Imaging Technique and Its Application In Materials Science Research
Published: 1/1/1999
Authors: David L Jacobson, Muhammad Arif, L Bergmann, A I Ioffe
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103550

43. Neutron Imaging Technique for {I}In Situ{/I} Measurement of Water Transport Gradients Within Nafion in Polymer Electrolyte Fuel Cells
Published: 1/1/1999
Authors: R J Bellows, M Y Lin, Muhammad Arif, Alan K Thompson, David L Jacobson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103449

44. Precision Neutron Interferometric Search For Evidence of Nuclear Quantum Entanglement in Liquid H^d2^O-D^d2^O Mixtures
Published: 1/1/1999
Authors: A I Ioffe, Muhammad Arif, David L Jacobson, F Mezei
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103549

45. A New Neutron Interferometric Method Used to Measure the Scattering Length of Silicon
Published: 1/1/1998
Authors: A I Ioffe, David L Jacobson, Muhammad Arif, M Vrana, S. A. Werner, P Fischer, G Greene, F Mezei
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103182

46. The Precision Neutron Interferometric Measurement of the Coherent Neutron Scattering Length in Silicon
Published: 1/1/1998
Authors: A I Ioffe, David L Jacobson, Muhammad Arif, M Vrana, S. A. Werner, P Fischer, G Greene, F Mezei
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103183

47. Effective-Mass Enhanced Deflection of Neutrons in Noninertial Frames
Published: 1/1/1995
Authors: K Raum, M Koellner, Anton Zeilinger, Muhammad Arif, R Gahler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103302

48. A Multistage, Position Stabilized Vibration Isolation System for Neutron Interferometry
Published: 1/1/1994
Authors: Muhammad Arif, D E Brown, G L Greene, R Clothier, K C Littrell
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=102994

49. Precision Comparison of the Lattice Parameters of Silicon Monocrystals
Series: Journal of Research (NIST JRES)
Published: 1/1/1994
Authors: Ernest G. Kessler, Albert Henins, R Deslattes, L Nielsen, Muhammad Arif
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=102765

50. Precision Comparison of the Lattice Parameters of Silicon Monocrystals
Published: 1/1/1994
Authors: Ernest G. Kessler, Albert Henins, R Deslattes, L Nielsen, Muhammad Arif
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=103197



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series