The Semiconductor and Dimensional Metrology Division (SDMD) provides leadership in conducting research in the areas of dimensional, nanometer-scale, surface, and acoustic pressure metrology; accelerometry; silicon Complementary Metal-Oxide Semiconductor (CMOS) technology; MicroElectroMechanical Systems (MEMS); power electronics; nanoelectronics; and flexible/printed electronics.
The technical programs, their goals, technical strategies, activities, and accomplishments described here for each Division project clearly demonstrate the impact of the SDMD's leadership and effective service as it continues to respond to the needs of industry and to contribute to the scientific and engineering communities.
Thank you for your interest in our Division! I welcome your comments and suggestions.
David Seiler, Division Chief
SRC, NIST Introduce Second Phase of Nanoelectronics Research Initiative with $5 Million in Annual Funding to Develop Post-CMOS Electronics
Conferences and Events
Popular LinksSenior and Post-doctoral NIST-ARRA Fellowships AnnouncementHall Effect2013 Metrology Frontiers for Nanoelectronics Conference, NIST, GaithersburgNACMA 2013 Annual Workshop and Conference: Meet World Experts on GD&T, Dimensional Measurement Uncertainty, and Coordinate Measuring Machine (CMM) AccuracyA Framework for Bioelectronics: Discovery and Innovation
Physical Measurement Laboratory (PML)