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CMOS and Novel Devices Group

Welcome

The CMOS and Novel Devices Group develops measurement science to accelerate the commercialization and manufacture of high performance and reliable electron devices for the electronics industry by developing new characterization techniques, physics-based models, and data analysis methods. The Group develops the advanced metrology tools to enable quantitative and mechanistic assessment of reliability issues in emerging electronic devices. Another key thrust is to develop new measurements, physical models, and data analysis techniques to accelerate the development and commercialization of nanoelectronic device-based medical technology for life sciences and personalized health care.

Group 06 Collage

Programs/Projects

Nanobiotechnology—We are developing methods and technology to detect, characterize, and identify biological molecules. Our focus is primarily on addressing next generation health care applications (e.g., early …

Power Devices and Thermal Metrology—The Power Devices and Thermal Metrology Project develops electrical and thermal measurement methods and equipment to support development and application of advanced power semiconductor devices and …

CMOS Device and Reliability— The CMOS Device and Reliability Project aims to develop new metrology tools for characterizing high-performance complementary metal-oxide-semiconductor (CMOS) materials and devices. The principle …

Metrology for Advanced Bioelectronics—This new project's mission is to exploit the unique characteristics of novel electronic devices and new materials to advance healthcare diagnosis, monitoring, and therapy. A key thrust is to …

Back-End-of-Line Reliability Metrology—This project aims to develop the metrology to enable quantitative assessment of performance limiting reliability issues in emerging electronic devices related to new materials, processes, and …

 
Photo of a high-speed, amplified probe.
High-speed, amplified probe tip used to collect reliability data in the NIST Advanced Device Characterization and Reliability laboratory.
Contact

Physical Measurement Laboratory (PML)
Semiconductor & Dimensional Metrology Division

CMOS and Novel Devices Group
Joseph Kopanski, Leader
301-975-2089 Telephone

General Information:
Christina Brapham, Secretary
301-975-2053 Telephone
301-975-8069 Facsimile

100 Bureau Drive, M/S 8120
Gaithersburg, Maryland 20899-8120