NIST logo
NIST Home > Manufacturing Metrology Programs and Projects 
 

Manufacturing Metrology Programs & Projects

(showing 16 - 30 of 40)
Nano-Structured Optics and Optical Surface Metrology
Last Updated Date: 09/30/2014

Aspheric, free-form, and nano-structured surfaces are indispensable in high-performance optical systems. The ability to accurately manufacture … more

Dimensional Measurement Services
Last Updated Date: 09/30/2014

The Dimensional Measurement Services Project within the Semiconductor & Dimensional Metrology Division (683) of the Physical Measurement … more

Atom-Based Dimensional Metrology
Last Updated Date: 09/30/2014

A primary goal of this project is to develop intrinsic calibration standards based on the crystalline lattice. The ultimate limit for nanoscale … more

Forensic Topography and Surface Metrology
Last Updated Date: 09/30/2014

Provide SI-traceable measurements and standards for ballistic and toolmark identification and surface texture and microform calibrations. Enable … more

CMOS Device and Reliability
Last Updated Date: 09/29/2014

The CMOS Device and Reliability Project develops advanced metrology tools to enable high performance CMOS (Complementary Metal Oxide Semiconductor) … more

Thin Film Electronics
Last Updated Date: 09/23/2014

The Thin Film Electronics Project facilitates the commercialization of emerging and future semiconductor electronic device technologies by … more

Traceable Scanning Probe Nano-Characterization
Last Updated Date: 09/23/2014

Research and development of rigorously SI traceable nano-characterization instrumentation, measurements, and procedures to enable a fundamental … more

International System of Units (SI)
Last Updated Date: 04/29/2014

The International System of Units (SI) provides definitions of units of measurement that are widely accepted in science and technology and which … more

Smart Manufacturing Operations Planning and Control Program
Last Updated Date: 04/25/2014

The Smart Manufacturing Operations Planning and Control Program will enhance U.S. innovation and industrial competitiveness by facilitating the … more

Smart Manufacturing Systems Interoperability
Last Updated Date: 04/25/2014

Smart manufacturing system components exchange and use information inefficiently because the information is not uniformly expressed nor well … more

Systems Integration for Additive Manufacturing
Last Updated Date: 04/23/2014

Numerous research efforts are underway to reduce the time and improve the quality of the product realization process for additive manufacturing. A … more

Wide-area Monitoring and Control of Smart Grid
Last Updated Date: 01/24/2014

Without ubiquitous, accurate, and reliable real-time sensors, the electric grid will not have the resiliency, reliability, and capacity to manage … more

Advanced Metering in Smart Distribution Grids
Last Updated Date: 01/24/2014

Electricity meters today face unprecedented challenges, from distorted waveforms on the grid, bidirectional metering for renewables, and the use … more

Industrial Ethernet Network Performance (IENetP)
Last Updated Date: 01/08/2014

Develop metrics, tests, and tools to determine and report the network performance of industrial Ethernet devices in a standardized way.

Micro- and Nano-Manipulation for Manufacturing Applications
Last Updated Date: 01/10/2013

Manipulation at the micro and nano levels requires different strategies than at the macro scale and also the development of related sensing and … more

Contact
General Information:
301-975-NIST (6478)
inquiries@nist.gov

100 Bureau Drive, Stop 1070
Gaithersburg, MD 20899-1070