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Manufacturing Metrology Programs & Projects

(showing 16 - 30 of 45)
Three-Dimensional Nanometer Metrology
Last Updated Date: 04/30/2013

Three-dimensional measurements of nanometer-scale structures are of increasing importance for nanoscience and nanomanufacturing, including the … more

Dimensional Measurement Services
Last Updated Date: 04/23/2013

The Dimensional Measurement Services Project within the Semiconductor & Dimensional Metrology Division (683) of the Physical Measurement … more

Optical Surface Metrology and Nano-Structured Optics
Last Updated Date: 04/19/2013

Aspheric surfaces are indispensable in high-performance optical systems. The ability to accurately manufacture these surfaces to the required … more

Atom-Based Dimensional Metrology
Last Updated Date: 04/19/2013

A primary goal of this project is to develop intrinsic calibration standards based on the crystalline lattice. The ultimate limit for nanoscale … more

Forensic Topography and Surface Metrology
Last Updated Date: 04/19/2013

Provide SI-traceable measurements and standards for ballistic and toolmark identification and surface texture and microform calibrations. Enable … more

CMOS Device and Reliability
Last Updated Date: 04/11/2013

The CMOS Device and Reliability Project will develop advanced metrology tools to enable high performance CMOS (Complementary Metal Oxide … more

Nanoscale Stress Measurements and Standards
Last Updated Date: 03/15/2013

Our objective is to develop accurate measurement methods for the nanoscale stress distributions and surface defects that control device … more

Micro- and Nano-Manipulation for Manufacturing Applications
Last Updated Date: 01/10/2013

Manipulation at the micro and nano levels requires different strategies than at the macro scale and also the development of related sensing and … more

Diffraction Metrology and Standards
Last Updated Date: 10/09/2012

Our objective is the development of Standard Reference Materials (SRMs) and quantitative, reproducible, and accurate measurement methods for … more

Thin Film X-Ray Reflectometry
Last Updated Date: 10/09/2012

Our goal is to develop Standard Reference Materials (SRMs) and quantitative, reproducible X-ray reflectometry (XRR) data analysis methods to … more

Federal Highway Administration Exploratory Advanced Research Program
Last Updated Date: 09/05/2012

Leverage NIST knowledge and capabilities in task analysis, perception, autonomous vehicle systems, and performance measurements to support an FWHA … more

Army Research Laboratory Perception/ Performance Evaluation Project
Last Updated Date: 09/05/2012

The detection, classification, and tracking of moving vehicles and people from an unmanned vehicle maneuvering at speeds of up to 80 kph remain a … more

Uniform Realization of the Unit of Torque in the US
Last Updated Date: 05/30/2012

Torque measurements are used heavily during product assembly and testing throughout the aerospace, automotive, and manufacturing sectors. … more

Small Force Metrology
Last Updated Date: 05/30/2012

The Small Force Metrology project supports U.S. instrumentation vendors, academic researchers, government scientists, and a broad spectrum of … more

Redefinition of the Kilogram
Last Updated Date: 05/30/2012

This project will conduct the research and development required to support the international efforts to prepare for a future redefinition of the … more

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