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Manufacturing Metrology Programs & Projects

(showing 1 - 15 of 40)
CMOS Device and Reliability
Last Updated Date: 04/24/2015

The CMOS Device and Reliability Project develops advanced metrology tools to enable high performance CMOS (Complementary Metal Oxide Semiconductor) … more

Traceable Scanning Probe Nano-Characterization
Last Updated Date: 04/23/2015

Research and development of rigorously SI traceable nano-characterization instrumentation, measurements, and procedures to enable a fundamental … more

Forensic Topography and Surface Metrology
Last Updated Date: 04/23/2015

Provide SI-traceable measurements and standards for ballistic and toolmark identification and surface texture and microform calibrations. Enable … more

Atom-Based Dimensional Metrology
Last Updated Date: 04/23/2015

A primary goal of this project is to develop intrinsic calibration standards based on the crystalline lattice. The ultimate limit for nanoscale … more

Nano-Structured Optics and Optical Surface Metrology
Last Updated Date: 04/23/2015

Aspheric, free-form, and nano-structured surfaces are indispensable in high-performance optical systems. The ability to accurately manufacture … more

Optical Methods for 3-D Nanostructure Metrology
Last Updated Date: 04/23/2015

We develop new approaches to optical microscopy and electromagnetic modeling to enable improved metrology of nanoscale structures with dimensions … more

Dimensional Measurement Services
Last Updated Date: 04/16/2015

The Dimensional Measurement Services Project within the Semiconductor & Dimensional Metrology Division (683) of the Physical Measurement … more

SI Length and Traceability
Last Updated Date: 04/16/2015

In total, the SI Length and Traceability project addresses some central aspects of three cornerstones of precision length measurements: … more

Advanced Dimensional Measurement Systems for Manufacturing
Last Updated Date: 04/16/2015

The US manufacturing industry is experiencing an increase in the variety of dimensional measuring systems available to more rapidly inspect high … more

Redefinition of the Kilogram
Last Updated Date: 03/25/2015

This project will conduct the research and development required to support the international efforts to prepare for a future redefinition of the … more

Small Force Metrology
Last Updated Date: 03/25/2015

The Small Force Metrology project supports U.S. instrumentation vendors, academic researchers, government scientists, and a broad spectrum of … more

Uniform Realization of the Unit of Torque in the US
Last Updated Date: 03/25/2015

Torque measurements are used heavily during product assembly and testing throughout the aerospace, automotive, and manufacturing sectors. … more

Automation Update of Force Laboratory Deadweight Machines
Last Updated Date: 03/25/2015

This project will update all NIST force laboratory automation hardware and software to maintain the current capability of force calibration … more

Implement Robotic Mass Measurements in SP250 Services
Last Updated Date: 03/25/2015

This project will develop and implement the procedures required to have fully automated/robotic mass measurement services in the range from 1 mg … more

Mass 1 kg CCM Key Comparison
Last Updated Date: 03/25/2015

Serve as co-pilot with BIPM in conducting the CCM 1 kg mass international comparison.

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