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Manufacturing Metrology Programs & Projects

(showing 1 - 15 of 44)
Advanced Dimensional Measurement Systems for Manufacturing
Last Updated Date: 10/21/2014

The US manufacturing industry is experiencing an increase in the variety of dimensional measuring systems available to more rapidly inspect high … more

Optical Methods for 3-D Nanostructure Metrology
Last Updated Date: 10/01/2014

We develop new approaches to optical microscopy and electromagnetic modeling to enable improved metrology of nanoscale structures with dimensions … more

SI Length and Traceability
Last Updated Date: 10/01/2014

In total, the SI Length and Traceability project addresses some central aspects of three cornerstones of precision length measurements: … more

Nano-Structured Optics and Optical Surface Metrology
Last Updated Date: 09/30/2014

Aspheric, free-form, and nano-structured surfaces are indispensable in high-performance optical systems. The ability to accurately manufacture … more

Dimensional Measurement Services
Last Updated Date: 09/30/2014

The Dimensional Measurement Services Project within the Semiconductor & Dimensional Metrology Division (683) of the Physical Measurement … more

Atom-Based Dimensional Metrology
Last Updated Date: 09/30/2014

A primary goal of this project is to develop intrinsic calibration standards based on the crystalline lattice. The ultimate limit for nanoscale … more

Forensic Topography and Surface Metrology
Last Updated Date: 09/30/2014

Provide SI-traceable measurements and standards for ballistic and toolmark identification and surface texture and microform calibrations. Enable … more

CMOS Device and Reliability
Last Updated Date: 09/29/2014

The CMOS Device and Reliability Project develops advanced metrology tools to enable high performance CMOS (Complementary Metal Oxide Semiconductor) … more

Thin Film Electronics
Last Updated Date: 09/23/2014

The Thin Film Electronics Project facilitates the commercialization of emerging and future semiconductor electronic device technologies by … more

Traceable Scanning Probe Nano-Characterization
Last Updated Date: 09/23/2014

Research and development of rigorously SI traceable nano-characterization instrumentation, measurements, and procedures to enable a fundamental … more

Crystallographic Databases
Last Updated Date: 05/21/2014

Components and devices used in a broad spectrum of technology sectors such as health care, communications, energy and electronics are manufactured … more

International System of Units (SI)
Last Updated Date: 04/29/2014

The International System of Units (SI) provides definitions of units of measurement that are widely accepted in science and technology and which … more

Smart Manufacturing Operations Planning and Control Program
Last Updated Date: 04/25/2014

The Smart Manufacturing Operations Planning and Control Program will enhance U.S. innovation and industrial competitiveness by facilitating the … more

Digital Thread for Smart Manufacturing
Last Updated Date: 04/25/2014

We live in a new manufacturing era that has been called the Third Industrial Revolution [1] , which is characterized by the digitization of … more

Smart Manufacturing Systems Interoperability
Last Updated Date: 04/25/2014

Smart manufacturing system components exchange and use information inefficiently because the information is not uniformly expressed nor well … more

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