NIST logo

Publication Citation: A New High Precision Procedure for AFM Probe Spring Constant Measurement Using a Microfabricated Calibrated Reference Cantilever Array (CRCA)

NIST Authors in Bold

Author(s): M G. Reitsma; Richard S. Gates;
Title: A New High Precision Procedure for AFM Probe Spring Constant Measurement Using a Microfabricated Calibrated Reference Cantilever Array (CRCA)
Published: September 01, 2006
Abstract:
Conference: Nanotech 2006 Technical Proceedings Volume 1: pages: 785-788
Proceedings: NSTI 2006 Nanotechnology Conference
Location: Boston MA,
Research Areas: Characterization, Ceramics
PDF version: PDF Document Click here to retrieve PDF version of paper (578KB)