Publication Citation
NIST Authors in Bold
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| Author(s): | M G. Reitsma; Richard S. Gates; |
|---|---|
| Title: | A New High Precision Procedure for AFM Probe Spring Constant Measurement Using a Microfabricated Calibrated Reference Cantilever Array (CRCA) |
| Published: | September 01, 2006 |
| Abstract: | |
| Conference: | Nanotech 2006 Technical Proceedings Volume 1: pages: 785-788 |
| Proceedings: | NSTI 2006 Nanotechnology Conference |
| Location: | Boston MA, |
| Research Areas: | Characterization, Ceramics |
| PDF version: |  Click here to retrieve PDF version of paper (565KB) |