Tip and Surface Reconstruction in Scanned Probe Microscopy

Published

January 1, 1997

Author(s)

John S. Villarrubia

Abstract

The non-vanishing size of tips in scanned probe microscopes (e.g., atomic force microscope or scanning tunneling microscope) results in imaging errors. Correction of these errors requires estimation of the tip shape (tip reconstruction) followed by estimation of the surface shape from the measured image (surface reconstruction). Published surface and tip reconstruction methods are reviewed.

Proceedings Title

Program of the 4th Industrial Applications of Scanned Probe Microscopy; NIST

Conference Dates

January 1, 1997

Conference Location

Gaithersburg, MD

Pub Type

Conferences

Keywords

atomic force microscopy, blind reconstruction, scanned probe microscopy, scanning tunneling microscopy, surface reconstruction, tip artifacts, tip estimation

Citation

Villarrubia, J. (1997), Tip and Surface Reconstruction in Scanned Probe Microscopy, Program of the 4th Industrial Applications of Scanned Probe Microscopy; NIST, Gaithersburg, MD (Accessed April 19, 2024)