TY  - CONF
AU  - John Villarrubia
C2  - Program of the 4th Industrial Applications of Scanned Probe Microscopy; NIST, Gaithersburg, MD
DA  - 1997-01-01
LA  - en
PB  - Program of the 4th Industrial Applications of Scanned Probe Microscopy; NIST, Gaithersburg, MD
PY  - 1997
TI  - Tip and Surface Reconstruction in Scanned Probe Microscopy
ER  -