Publication Citation
NIST Authors in Bold
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| Author(s): | Safak Sayan; Nhan V. Nguyen; James R. Ehrstein; Tom Emge; Eric Garfunkel; Mark Croft; X Zhao; David V. Vanderbilt; Ira Levin; Evgeni Gusev; Hyunjung G. Kim; |
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| Title: | Structural, Electronic, and Dielectric Properties of Ultrathin Zirconia Films on Silicon |
| Published: | November 17, 2005 |
| Abstract: | |
| Citation: | Applied Physics Letters |
| Volume: | 86 |
| Pages: | pp. 152902-1 - 152902-3 |
| Research Areas: | Semiconductors |
| PDF version: |  Click here to retrieve PDF version of paper (140KB) |