@article{59926,
  author = {Safak Sayan and Nhan Nguyen and James Ehrstein and Tom Emge and Eric Garfunkel and Mark Croft and X Zhao and David Vanderbilt and Ira Levin and Evgeni Gusev and Hyunjung Kim},
  title = {Structural, Electronic, and Dielectric Properties of Ultrathin Zirconia Films on Silicon},
  year = {2005},
  number = {86},
  month = {2005-11-17},
  publisher = {Applied Physics Letters},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32146},
  language = {en},
}