Bailey, W.
, Wang, S.
and Tsymbal, E.
(2000),
Electronic scattering from Co/Cu interfaces: In situ measurement, comparison with microstructure, and failure of semiclassical free-electron models, Journal of Applied Physics
(Accessed April 23, 2024)
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Electronic scattering from Co/Cu interfaces: In situ measurement, comparison with microstructure, and failure of semiclassical free-electron models
Published
Author(s)
William E. Bailey, S X. Wang, E Y. Tsymbal
Citation
Journal of Applied Physics
Pub Type
Journals
Citation
Created April 30, 2000, Updated October 12, 2021