TY  - JOUR
AU  - Bailey, William
AU  - Wang, S
AU  - Tsymbal, E
C2  - Journal of Applied Physics
DA  - 2000-05-01 00:05:00
LA  - en
PB  - Journal of Applied Physics
PY  - 2000
TI  - Electronic scattering from Co/Cu interfaces: In situ measurement, comparison with microstructure, and failure of semiclassical free-electron models
ER  -