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The MBE Summit has brought academia, government, and industry experts together for over 10 years to share the challenges, implementation issues, and lessons
In March 2024, NIST’s Rosemary Astheimer presented efforts to capture and leverage Product Manufacturing Information (PMI) in ISO 10303, referred to as STEP
To be successful as a new business, a growing business, or a well-established business exploring major changes, what do you most need to consider? The 2023-2024
The Digital Thread for Manufacturing project will deliver methods, protocols, and tools for developing, conformance testing, increasing user-awareness, and
AM data is essential for establishing part traceability, understanding AM processes and making decisions during the product development lifecycle. The curation
To provide the necessary information for electronic material manufacturers to predict how and when failures will occur and enable lifetime analysis appropriate
The definitions of cyber-physical systems (CPS) and the Internet of Things (IoT) are converging over time to include a common emphasis on hybrid systems of
Van Sy Mai, Suchin Arunsawatwong, Tadchanon Chuman
This paper develops a methodology for designing a control system composed of a linear time-invariant system interconnecting with multiple decoupled time
Due to self-occlusions in 3D point clouds acquired with line-of-sight sensors, an incomplete representation of an object's surface is used in fitting a CAD
Felix Kim, Adam L. Pintar, John Henry J. Scott, Edward Garboczi
A framework to generate simulated X-ray computed tomography (XCT) data of ground truth flaws was developed for evaluation of flaw detection algorithms. The
Felix Kim, Sarah Robinson, Nikolai Klimov, John Henry J. Scott
Various micro and nano-manufacturing techniques were investigated to create controlled flaws for X-ray computed tomography (XCT) phantoms. We explored the use