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NIST Home > X-Ray Information at NIST 

X-Ray Information at NIST

(the links below are a compilation of programs and projects, news/events, and other pages tagged with this term)

 
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3D Atom Probe Tomography (10/04/2012)
3D Elemental Mapping of Cells using Electron and Ion Beams (10/02/2012)
A Comparison of WD-EPMA Heterogeneity Testing Procedures (10/02/2012)
Analysis of 3D Elemental Mapping Artifacts in Biological Specimens using Monte Carlo Simulation (10/02/2012)
Analysis of Copper Incorporation Into Zinc Oxide Nanowires (10/02/2012)
Automated Scanning Electron Microscope (10/01/2012)
Electron Microprobe (10/01/2012)
Energy Determination of X-Ray Transition Energies Using the NIST TES Microcalorimeter Detector (10/02/2012)
Environmental Scanning Electron Microscope (10/01/2012)
Evaluation of the Extent of Electron Scattering in a Low Vacuum Scanning Electron Microscope (10/02/2012)
Field Emission Electron Probe (10/01/2012)
Focused Ion Beam (Helios 650) (10/01/2012)
Focused Ion Beam/Dual Beam (10/01/2012)
Fundamental Chemical Metrology (10/22/2012)
Microanalysis Research Group Staff (05/15/2013)
< Previous 1 2 Next »

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Date created: April 2, 2010 | Last updated: May 24, 2010    Contact: Webmaster