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Semiconductors Programs & Projects

(showing 1 - 15 of 24)
MEMS Measurement Science and Standards
Last Updated Date: 12/12/2014

Our goal is to provide technical leadership in R&D for the MEMS measurement infrastructure essential to improving U.S. economic … more

Nanostructure Fabrication and Metrology
Last Updated Date: 12/11/2014

Single photons are the fundamental particles for all optical measurements. Single photon detectors made from avalanche photodiodes or … more

Metrology and Synthesis of 3D Nanostructures
Last Updated Date: 12/11/2014

Nanostructures are a critical component of innovations in electronics, energy conservation, renewable energy, biomedical research, and health … more

Quantum Materials and Devices
Last Updated Date: 12/11/2014

Quantum coherent materials have become important in magnetic sensors as well as information processing technology. For magnetic sensors, … more

Nanoscale Stress Measurements and Standards
Last Updated Date: 12/01/2014

Our objective is to develop accurate measurement methods for the nanoscale stress distributions and surface defects that control device … more

Nanocalorimetry Measurements
Last Updated Date: 12/01/2014

To develop nanocalorimetry as a method for measuring heats of reaction of nanoscale samples with nanojoule sensitivity in order to detect … more

Thin Film and Interconnect Reliability
Last Updated Date: 12/01/2014

This project, now concluded, developed methods to evaluate the reliability of thin films and interconnects in their as-manufactured states. Such … more

Theory of the optical properties of materials
Last Updated Date: 11/28/2014

The overarching objective of this project is reliably calculating the bulk optical properties of materials, such as complex index of refraction, … more

Nanoelectronic Device Metrology
Last Updated Date: 09/30/2014

The Nanoelectronic Device Metrology (NEDM) project is developing the measurement science infrastructure that will enable emerging nanoelectronic … more

CMOS Device and Reliability
Last Updated Date: 09/29/2014

The CMOS Device and Reliability Project develops advanced metrology tools to enable high performance CMOS (Complementary Metal Oxide Semiconductor) … more

Back-End-of-Line Reliability Metrology Development
Last Updated Date: 09/26/2014

The Back-End-of-Line (BEOL) Reliability Metrology Development project aims to develop the metrology to enable quantitative and mechanistic … more

Thin Film Electronics
Last Updated Date: 09/23/2014

The Thin Film Electronics Project facilitates the commercialization of emerging and future semiconductor electronic device technologies by … more

Acoustics and Vibration
Last Updated Date: 09/23/2014

The Acoustics and Vibration Project provides measurement services, and develops measurements and documentary standards for the SI units of … more

Analytical Transmission Scanning Electron Microscopy
Last Updated Date: 09/02/2014

This project develops low-energy transmission electron diffraction, imaging, and spectroscopy in the scanning electron microscope, to enable … more

COMPLETED: Dimensional Metrology for Nanoscale Patterns
Last Updated Date: 04/17/2014

Our goal is to develop and demonstrate precise measurement methods that quantify the physical shape, critical dimensions (CD) and the structure of … more

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