Semiconductors Programs & Projects | |
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Nanocalorimetry
Last Updated Date: 12/29/2011 Nanocalorimetry using micromachined devices has the capability to provide quantitative data to support the development of advanced metal silicide … more
Advanced Magnetic and Quantum Materials
Last Updated Date: 12/15/2011 Quantum coherent materials have become important in magnetic sensors as well as information processing technology. For magnetic sensors, … more
Nanoscale Stress Measurements and Standards
Last Updated Date: 11/17/2011 Our objective is to develop accurate measurement methods for the nanoscale stress distributions and surface defects that control device … more
Semiconductor Metrology for Energy Conversion
Last Updated Date: 11/07/2011 Optical Materials Metrology 21st century optoelectronics emphasizes energy technologies, and modern security issues have heightened needs for … more
Nanostructure Fabrication and Metrology
Last Updated Date: 11/07/2011 Single photons are the fundamental particles for all optical measurements. Single photon detectors made from avalanche photodiodes or … more
Theory of the optical properties of materials
Last Updated Date: 10/11/2011 The overarching objective of this project is reliably calculating the bulk optical properties of materials, such as complex index of refraction, … more
Power Device and Thermal Metrology
Last Updated Date: 10/11/2011 The Power Device and Thermal Metrology Project will enable the development, commercialization and utilization of High-Voltage, High-Frequency … more
CMOS Device and Reliability
Last Updated Date: 10/11/2011 The CMOS Device and Reliability Project will develop advanced metrology tools to enable high performance CMOS devices with sufficient reliability. … more
Thin Film Electronics
Last Updated Date: 10/11/2011 The Thin Film Electronics Project is developing measurements on active thin film electronic devices like transistors which currently enable user … more
Nanoelectronic Device Metrology
Last Updated Date: 10/11/2011 The Nanoelectronic Device Metrology Project will develop the required measurement infrastructure and scientific knowledge-base to address … more
Comparison and Uncertainty Evaluation of Methods for Asphere Metrology
Last Updated Date: 10/06/2011 The goal of this project is a rigorous uncertainty assessment of generic methods for measuring aspheres. The evaluated methods include zonal and … more
Metrology for Advanced Optics
Last Updated Date: 10/06/2011 From projecting computer chip designs onto silicon wafers to imaging remote galaxies, advanced optics are crucial to modern technology and … more
Wafer Flatness and Wafer Thickness Variation
Last Updated Date: 10/06/2011 The semiconductor industry expects continued demand for improved wafer flatness at the exposure site to avoid blurring of ever smaller circuit … more
Physical Properties of Liquid Precursors
Last Updated Date: 10/03/2011 In striving to adhere to Moore's Law, the semiconductor industry is designing and using new metal-organic compounds. Precursor compounds … more
MEMS Measurement Science and Standards
Last Updated Date: 10/03/2011 The microelectronics revolution, which started in 1947 with the invention of the transistor, is epitomized in Moore's Law, which describes the … more |
Contact
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