Simons, M.
, Kautz, M.
, Gordon, J.
and Holloway, C.
(2018),
Uncertainties in Rydberg Atom-based RF E-field Measurements, International Symposium and Exhibition on electromagnetic compatibility: EMC Europe 2018, Amsterdam, -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=925898
(Accessed May 19, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Uncertainties in Rydberg Atom-based RF E-field Measurements
Published
Author(s)
, , ,
Abstract
A new atom-based electric (E) field measurement approach (using Rydberg atoms) is being investigated by several groups around the world as a means to develop a new SI-traceable RF E- field standard. For this technique to be useful it is important to understand the uncertainties. In this paper, we examine and quantify the sources of uncertainty present with this Rydberg atom- based RF (E-field) measurement technique.Proceedings Title
International Symposium and Exhibition on electromagnetic compatibility: EMC Europe 2018
Conference Dates
August 27-30, 2018
Conference Location
Amsterdam
Pub Type
Conferences
Download Paper
Keywords
Rydberg atoms, Electromagnetically-induced transparency, SI traceability, antenna metrology
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created October 8, 2018, Updated March 19, 2019