Berweger, S.
, Weber, J.
, Li, J.
, Velazquez, J.
, Pieterick, A.
, Sanford, N.
, Davydov, A.
, Wallis, T.
and Kabos, P.
(2015),
Microwave Near-Field Imaging of Two-Dimensional Semiconductors, Nano Letters, [online], https://doi.org/10.1021/nl504960u
(Accessed May 7, 2024)