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Displaying records 501 to 507.
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501. Writing Guidelines for Requests for Proposals for Automated Fingerprint Identification Systems
Series: Special Publication (NIST SP)
Report Number: 1155
Topic: Materials Science
Published: 4/25/2013
Authors: Susan M Ballou, Michael D Garris, Anthony Clay, Joi Dickerson, Peter T Higgins, Janet Hoin, Lisa Jackson, Mike Lesko, Joe Morrissey, Leo Norton, Beth Owens, Joe Polski, Melissa K Taylor
Abstract: This is one of a series of documents prepared by the Latent Print Automated Fingerprint Identification System (AFIS) Interoperability Working Group. The purpose of these documents is to provide guidance and a framework to those involved in the id ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913324

502. Writing Guidelines to Develop an Memorandum of Understanding for Interoperable Automated Fingerprint Identification Systems
Series: Special Publication (NIST SP)
Report Number: 1156
Topic: Materials Science
Published: 5/14/2013
Authors: Susan M Ballou, Michael D Garris, Anthony Clay, Joi Dickerson, Peter T Higgins, Lisa Jackson, Joe Morrissey, Beth Owens, Joe Polski, Janet Hoin, Leo Norton, Melissa K Taylor
Abstract: This is one of a series of documents prepared by the Latent Print Automated Fingerprint Identification System (AFIS) Interoperability Working Group. The purpose of these documents is to provide guidance and a framework to those involved in the id ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913325

503. X-Ray Diffraction Topography of Sapphire for Windows and Domes
Topic: Materials Science
Published: 3/30/1998
Author: David R Black
Abstract: X-ray diffraction topography has been used as a nondestructive characterization tool to investigate single-crystal sapphire for window and dome applications. A variety of examples are shown that demonstrate the utility of x-ray diffraction imaging a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850182

504. X-Ray Standing Wave Analysis of Overlayer Induced Substrate Relaxation: The Clean and Bi-covered (110) GaP Surface
Topic: Materials Science
Published: 4/1/2007
Authors: A Herrera-Gomez, Joseph C Woicik, T Kendelewicz, K E Miyano, W E Spicer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854331

505. X-Ray Topography Study of Surface Damage in Single-Crystal Sapphire
Topic: Materials Science
Published: 2/9/2000
Authors: David R Black, Robert S. Polvani, Kate Medicus, H E. Burdette
Abstract: X-ray diffraction topography was used to investigate the relationship between sub-surface damage, near-surface microstructure, and fracture strength in a series of sapphire modulus of rupture (MOR) bars which had been fabricated to proof test fabrica ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850319

506. Zeroing in on a Lead-Free Solder Database
Topic: Materials Science
Published: 10/1/2005
Authors: Thomas Allen Siewert, David R. Smith
Abstract: The rising interest in lead-free solders creates a need for complete property data on the various lead-free solder compositions. Circuit designers need these data to assess the impact of the transition on product life, and production engineers need t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50183

507. Zone-Refinement Effect in Small Molecule‹Polymer Blend Semiconductors for Organic Thin Film Transistors
Topic: Materials Science
Published: 12/14/2010
Authors: Yeon Sook Chung, Nayool Shin, Jihoon Kang, Youngeun Jo, Vivek M Prabhu, Regis J Kline, John E Anthony, Do Y Yoon
Abstract: The blend films of small molecule semiconductors with insulating polymers exhibit not only an excellent solution processability, but also superior performance characteristics (field-effect mobility, on/off ratio, threshold voltage and stability) over ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906520



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