NIST logo

Publications Portal

You searched on:
Topic Area: Materials Science
Sorted by: title

Displaying records 501 to 510 of 533 records.
Resort by: Date / Title


501. Time-resolved photoluminescence of lithographically defined quantum dots fabricated by electron beam lithography and wet chemical etching
Topic: Materials Science
Published: 6/15/2011
Authors: Varun Boehm Verma, Martin J Stevens, Kevin Lawrence Silverman, Neville Dias, Akash Garg, James J. Coleman, Richard P Mirin
Abstract: We measure the time-resolved photoluminescence characteristics of a novel type of lithographically patterned quantum dot fabricated by electron beam lithography, wet chemical etching, and overgrowth of the barrier layers by metalorganic chemical ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907840

502. Tooth chipping can reveal bite forces and diets of fossil hominins
Topic: Materials Science
Published: 6/16/2010
Authors: Paul Constantino, James J. Lee, H Chai, Bernhard Zipfel, Charles Ziscovici, Brian Ronald Lawn, Peter Lucas
Abstract: Fossil hominin tooth enamel often exhibits antemortem edge chipping (Robinson 1954; Tobias 1967; Wallace 1973). Here we apply a simple fracture equation to estimate peak bite forces from the sizes of such chips. This equation, previously validated ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904073

503. Towards a Classification System of Manufacturing Objects for the Evaluation of Perception Systems
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7985
Topic: Materials Science
Published: 2/27/2014
Authors: Geraldine S Cheok, Marek Franaszek, Afzal A Godil, Kamel Shawki Saidi, Roger Eastman, Tsai Hong Hong
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915160

504. Towards a Reference Polyurethane Foam and Bench Scale Test for Assessing Smoldering in Upholstered Furniture
Topic: Materials Science
Published: 12/8/2013
Authors: Mauro Zammarano, Szabolcs Matko, William M Pitts, Douglas Matthew Fox, Rick D Davis
Abstract: Smoldering poses a severe fire hazard due to the potentially lethal amount of toxic carbon monoxide released, and the possibility to reach flashover (through transition from smoldering to flaming) with heat sources otherwise too weak to directly ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914809

505. Transmission EBSD in the Scanning Electron Microscope
Topic: Materials Science
Published: 5/1/2013
Authors: Roy Howard Geiss, Katherine P. Rice, Robert R Keller
Abstract: A new method for obtaining Kikuchi diffraction patterns from thin specimens in transmission has been developed for use in the SEM, scanning electron microscope, using a conventional electron backscatter diffraction (EBSD) detector and with a slight m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912886

506. Transverse Fracture of Brittle Bilayers Relevance to Failure of All-Ceramic Dental Crowns
Topic: Materials Science
Published: 3/1/2006
Authors: Jeonghwan Kim, Sanjit Bhowmick, Ilja Hermann, Brian Ronald Lawn
Abstract: A study is made of the behavior of cracks approaching interfaces in all-ceramic crown-like bilayers. Flat specimens are fabricated by fusing porcelain veneers onto Y-TZP and alumina core ceramic plates, with veneer/core matching to minimize residual ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850132

507. Tunable Ionic-Conductivity of Collapsed Sandia Octahedral Molecular Sieves (SOMS)
Topic: Materials Science
Published: 9/12/2007
Authors: Jason D Pless, Terry J Garino, James E Maslar, Tina M Nenoff
Abstract: The structure-property relationship between atomic cation substitution and bulk scale conductivity in perovskites has been studied systematically. A series of Na-Nb perovskites has been synthesized via two methods (1) ion-exchange or (2) synthetic me ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830985

508. Tuning Polymer Melt Fragility With Antiplasticizer Additives
Topic: Materials Science
Published: 6/19/2007
Authors: Robert A Riggleman, Jack F Douglas, J J de Pablo
Abstract: A polymer-diluent model exhibiting antiplasticization has beendeveloped and characterized by molecular dynamics simulations. Antiplasticizer molecules are shown to decrease the glass transition temperature Tg, but to increase the elastic moduli o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852717

509. UV-induced photochemical transformations of citrate capped silver nanoparticle suspensions
Topic: Materials Science
Published: 9/14/2012
Authors: Justin M Gorham, Robert I. MacCuspie, Kate L Klein, D Howard Fairbrother, Richard D Holbrook
Abstract: Due to the increasing use of silver nanoparticles (AgNPs) in consumer products, it is essential to understand how variables, such as light exposure, may change the physical and chemical characteristics of AgNP suspensions. To this end, the effect o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911250

510. Ultra-Small Angle X-ray Scattering Instrument at the Advanced Photon Source, History, Recent Development, and Current Status
Topic: Materials Science
Published: 1/1/2013
Authors: Andrew John Allen, Fan Zhang, Lyle E Levine, Gabrielle Gibbs Long, Jan Ilavsky, Pete R. Jemian
Abstract: The history and development over more than 25 years is presented and discussed of an ultra-small-angle X-ray scattering (USAXS) instrument dedicated to serving a broad range of materials research needs. This history is traced from the instrument‰s o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911113



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series