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31. Controlled Formation and Characterization of Dithiothreitol-Conjugated Gold Nanoparticle Clusters
Topic: Manufacturing
Published: 3/5/2014
Authors: De-Hao D. Tsai, Tae Joon Cho, Frank W DelRio, Justin M Gorham, Jiwen Zheng, Jiaojie Tan, Michael Russel Zachariah, Vincent A Hackley
Abstract: We report a systematic study of the controlled formation of discrete-size gold nanoparticle clusters (GNCs) by interaction with the reducing agent dithiothreitol (DTT). Asymmetric-flow field flow fractionation and electrospray differential mobility a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915014

32. Metrology Needs for TSV Fabrication
Topic: Manufacturing
Published: 3/4/2014
Authors: Victor Vartanian, Richard A Allen, Larry Smith, Klaus Hummler, Steve Olson, Brian Sapp
Abstract: This paper focuses on the metrology needs and challenges of through silicon via (TSV) fabrication, consisting of TSV etch, liner, barrier, and seed (L/B/S) depositions, copper plating, and copper CMP. These TSVs, with typical dimensions within a f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914497

33. Methods for improving visibility measurement standards of powered industrial vehicles
Topic: Manufacturing
Published: 2/28/2014
Authors: Roger V Bostelman, Jochen Teizer, Soumitry J. Ray, Mike Agronin, Dominic Albanese
Abstract: Poor visibility of powered industrial vehicles, such as forklifts, used in industry is often the cause of accidents that include pedestrians. Current standards allow up to 20% non-visible regions for forklifts where measurement of these regions is p ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912877

34. Detection of 3D Interconnect Bonding Voids by IR Microscopy
Topic: Manufacturing
Published: 2/20/2014
Authors: Jonny H?glund, Zoltan Kiss, Gyorgy Nadudvari , Zsolt Kovacs, Szabolcs Velkei, Moore Chris, Victor Vartanian, Richard A Allen
Abstract: There are a number of factors driving 3D integration including reduced power consumption, RC delay, and form factor as well as increased bandwidth. However, before these advantages can be realized, various technical and cost hurdles must be overcom ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914474

35. Metrological challenges introduced by new tolerancing standards
Topic: Manufacturing
Published: 2/13/2014
Authors: Edward P Morse, Yue Peng, Vijay Srinivasan, Craig M Shakarji
Abstract: The recent release of ISO has provided designers with a richer set of specification tools for the size of part features, so that various functional requirements can be captured with greater fidelity [2]. However, these tools also bring new challenges ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916214

36. The U.S. Manufacturing Value Chain: An International Perspective
Series: Technical Note (NIST TN)
Report Number: 1810
Topic: Manufacturing
Published: 2/11/2014
Author: Douglas S Thomas
Abstract: This report uses input-output data from the World Input-Output Database along with the methods developed by Wassily Leontief to track the intermediate goods and services used in national manufacturing industries. Specifically, it examines the extent ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914022

37. An Ontology Based Approach to Action Verification for Agile Manufacturing
Topic: Manufacturing
Published: 1/10/2014
Authors: Zeid Kootbally, Stephen B. Balakirsky
Abstract: Many of today's robotic work cells are unable to detect when an action failure has occurred. This results in faulty products being sent down the line, and/or downtime for the cell as failures are detected and corrected. This article examines a novel ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914818

38. Applications of Surface Metrology in Toolmark Identification
Topic: Manufacturing
Published: 1/8/2014
Authors: Xiaoyu A Zheng, Johannes A Soons, Theodore Vincent Vorburger, Jun-Feng Song, Thomas B Renegar, Robert Meryln Thompson
Abstract: Surface metrology is commonly used to characterize functional engineering surfaces. The technologies developed offer opportunities to improve forensic toolmark identification. In 2009, a report by the National Academies called into question, amon ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913337

39. A Detailed Failure Analysis Examination of the Effect of Thermal Cycling on Cu TSV Reliability
Topic: Manufacturing
Published: 1/1/2014
Authors: Chukwudi Azubuike Okoro, June Waiyin Lau, Yaw S Obeng, Klaus Hummler
Abstract: In this work, a detailed failure analysis of the physical root cause for the increase in electrical resistance and radio-frequency (RF) transmission coefficient of through-silicon via (TSV) daisy chain was investigated. Six different failure modes we ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913115

40. Uncertainty of temperature measurements by infrared thermography for metal cutting applications
Topic: Manufacturing
Published: 12/31/2013
Authors: Brandon M Lane, Eric Paul Whitenton, Viswanathan Madhavan, M. Alkan Donmez
Abstract: This paper presents the methodology and results of a comprehensive measurement uncertainty analysis for infrared thermography of a cutting tool during the metal cutting process. The analysis is based on a commercial off-the-shelf (COTS) camera, ty ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913632



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