NIST logo

Publications Portal

You searched on:
Topic Area: Manufacturing

Your search results exceeded 1,000 records. Please refine your search and try again.
Displaying records 71 to 80 of 1000 records.
Resort by: Date / Title


71. Requirements and Conformance Test Assertions for ANSI/NIST-ITL 1-2011 Record Type 18 - DNA Record
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7933
Topic: Manufacturing
Published: 6/21/2013
Authors: Fernando L Podio, Dylan James Yaga, Christofer Justin McGinnis
Abstract: The Computer Security Division (CSD) of NIST/ITL develops conformance test architectures (CTAs) and test suites (CTSs) to support users that require conformance to selected biometric standards. Product developers as well as testing laboratories c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913465

72. Recent Advances in Sharing Standardized STEP Composite Structure Design and Manufacturing Information
Topic: Manufacturing
Published: 6/19/2013
Authors: Vijay Srinivasan, Allison Barnard Feeney, Keith A. Hunten
Abstract: Composite structures have been developed and used in the aerospace, automobile, sports, and marine industries since the early 1940s. Compared to conventional metallic structures, newer high-performance composite structures provide benefits such as de ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913466

73. ASME Journal of Computing and Information Science in Engineering (JCISE)
Topic: Manufacturing
Published: 6/14/2013
Author: Vijay Srinivasan
Abstract: For over a decade this journal has supported and advanced the research and applications at the intersection of information science and mechanical engineering. In that process it has established itself as a premier outlet for cutting edge research in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914067

74. CHARACTERIZING ENERGY CONSUMPTION OF THE INJECTION MOLDING PROCESS
Topic: Manufacturing
Published: 6/14/2013
Authors: Jatinder Madan, Mahesh Mani, Kevin W Lyons
Abstract: Presently available systems for sustainability assessment do not fully account for aspects related to a product‰s manufacturing. In an effort to make more sustainable decisions, today‰s industry seeks reliable methods to assess and compare sustainabi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912839

75. Inferring Intention Through State Representations in Cooperative Human-Robot Environments
Topic: Manufacturing
Published: 6/7/2013
Authors: Craig I Schlenoff, Anthony Pietromartire, Zeid Kootbally, Stephen B. Balakirsky, Thomas Rollin Kramer, Sebti Foufou
Abstract: In this paper, we describe a novel approach for inferring intention during cooperative human-robot activities through the representation and ordering of state information. State relationships are represented by a combination of spatial relationships ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912328

76. The Impact of Characteristic Impedance on Waveform Calibrations
Topic: Manufacturing
Published: 6/7/2013
Authors: Dylan F Williams, Jeffrey A Jargon, Paul D Hale
Abstract: We examine the impact of the characteristic impedance on mismatch corrections for temporal waveform calibrations based on high-speed electro-optic sampling measurements. We show that failing to measure and account for the characteristic impedance of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912864

77. Development of a Methodology to Determine Risk of Counterfeit Use
Topic: Manufacturing
Published: 6/5/2013
Authors: Mark Schaffer, Yaw S Obeng
Abstract: Counterfeit components have become a multi-million dollar, yet undesirable, part of the electronics industry. The profitability of the counterfeit industry rests in large part on its ability to recognize supply constraints and quickly respond, effect ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914105

78. Accelerated Stress Test Assessment of Through-Silicon Vias Using RF Signals
Topic: Manufacturing
Published: 6/1/2013
Authors: Chukwudi Azubuike Okoro, Pavel Kabos, Jan Obrzut, Klaus Hummler, Yaw S Obeng
Abstract: In this work, radio frequency (RF) signal is demonstrated as an effective metrology tool for the assessment of the effect of thermal cycling on the reliability of through-silicon via (TSV) stacked dies. It was found that RF signal integrity of TSV da ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912850

79. Use of RF-Based Technique as a Metrology Tool for TSV Reliability Analysis
Topic: Manufacturing
Published: 5/28/2013
Authors: Chukwudi Azubuike Okoro, Yaw S Obeng, Jan Obrzut, Pavel Kabos, Klaus Hummler
Abstract: In this work, we used radio frequency (RF) based measurement technique is used as a prognostic tool for the assessment of the effect of thermal cycling on the reliability of through-silicon via (TSV) stacked dies. It was found that RF signal integrit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913332

80. Proposed ,NIST Ballistics Identification System (NBIS)Š Based on 3D Topography Measurements on Correlation Cells
Topic: Manufacturing
Published: 5/17/2013
Author: Jun-Feng Song
Abstract: The invented ,NIST Ballistics Identification System (NBIS)Š using three-dimensional (3D) topography measurements on correlation cells can promote high accuracy and fast ballistics identifications [1]. The use of paired correlation cells can identify ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910868



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series