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Topic Area: Information Technology
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Displaying records 811 to 820 of 987 records.
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811. Statistical Analysis of Information Content for Training Pattern Recognition Networks
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5149
Topic: Information Technology
Published: 3/1/1993
Author: Charles L. Wilson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900681

812. Statistical Testing of Random Number Generators
Topic: Information Technology
Published: 10/19/1999
Author: D L. Banks
Abstract: Random Number Generators (RNGs) are an important building block for algorithms and protocols in cryptography. They are paramount in the construction of encryption keys and other cryptographic algorithm parameters. In practice, statistical testing i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151190

813. Status Report on the First Round of the SHA-3 Cryptographic Hash Algorithm Competition
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7620
Topic: Information Technology
Published: 9/23/2009
Authors: Andrew Richard Regenscheid, Ray A Perlner, Shu-jen H Chang, John M Kelsey, Mridul Nandi, Souradyuti Paul
Abstract: The National Institute of Standards and Technology is in the process of selecting a new cryptographic hash algorithm through a public competition. The new hash algorithm will be referred to as SHA-3 and will complement the SHA-2 hash algorithms cu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903483

814. Status of PDES-Related Activities (Standards & Testing)
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 4432
Topic: Information Technology
Published: 10/1/1990
Authors: Cita Marie Furlani, J Wellington, S Kemmerer
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900581

815. Structure and Properties of Small Molecule-Polymer Blend Semiconductors for Organic Thin Film Transistors
Topic: Information Technology
Published: 6/4/2008
Authors: Vivek M Prabhu, Jihoon Kang, Nayool Shin, Do Y. Yoon, Do Young Jang
Abstract: A comprehensive structural and electrical characterization of solution-processed blend films of 6,13-bis(triisopropylsilylethynyl)pentacene (TIPS-pentacene) and poly(alpha-methylstyrene) (PaMS) was performed to understand and optimize the blend semic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854087

816. Structured Testing: A Testing Methodology Using the Cyclomatic Complexity Metric
Series: Special Publication (NIST SP)
Report Number: 500-235
Topic: Information Technology
Published: 8/1/1996
Authors: D Wallace, A H Watson, T J Mccabe
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900482

817. Study of Accuracy of Parts Produced Using Additive Manufacturing
Topic: Information Technology
Published: 4/16/2014
Authors: Marcin Bauza, Shawn P Moylan, Robert Panas, Stephen Burke, Harry Martz, John S Taylor, Paul Alexander, Richard Knebel
Abstract: The purpose of this presentation is to focus discussion onto the issue of accuracy and uncertainty of parts made with additive manufacturing processes.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915785

818. Study of Traffic Control and Congestion Control in Broadband ISDN
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 5000
Topic: Information Technology
Published: 12/1/1992
Author: David H Su
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900669

819. Study of a Prototype Software Engineering Environment
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 86-3408
Topic: Information Technology
Published: 6/1/1986
Authors: D Wallace, David R Kuhn
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900514

820. Subspace Approximation of Face Recognition Algorithms: An Empirical Study
Topic: Information Technology
Published: 5/12/2008
Authors: P Jonathon Phillips, Pranab Mohanty, Sudeep Sarkar, Rangachar Kasturi
Abstract: We present a theory for constructing linear subspace approximations to face recognition algorithms and empirically demonstrate that a surprisingly diverse set of face recognition approaches can be approximated well using a linear model. A linear mode ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=890061



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