NIST logo

Publications Portal

You searched on:
Topic Area: Radiation Physics
Sorted by: title

Displaying records 21 to 30 of 59 records.
Resort by: Date / Title


21. Emergency Radiobioassay Preparedness Exercises through the NIST Radiochemistry Intercomparison Program (NRIP)
Topic: Radiation Physics
Published: 8/1/2011
Authors: Svetlana Nour, Jerome LaRosa, Kenneth G Inn
Abstract: The present challenge for the international radiobioassay community is to analyze contaminated samples rapidly while maintaining high quality results. NIST runs a radiobioassay measurement traceability testing program to evaluate the radioanalytical ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906938

22. Energetic Photon Spectra from Targets Irradiated by Picoseconds Lasers
Topic: Radiation Physics
Published: 4/30/2011
Authors: Lawrence T Hudson, John F Seely, Csilla Szabo, Uri Feldman, Hui Chen, Albert Henins
Abstract: Photon spectra in the energy range 60 keV to 1 MeV were recorded from targets irradiated by the LLNL Titan and LLE EP picosecond lasers. The radiation consisted of K shell radiation, Bremsstrahlung radiation from MeV electrons, and preliminary eviden ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907778

23. Extending transmission crystal x-ray spectroscopy to moderate-intensity laser driven sources
Topic: Radiation Physics
Published: 3/17/2012
Authors: Lawrence T Hudson, J. Y. Mao, L. M. Chen, John F Seely, L. Zhang, Y. Q. Sun, X. X. Lin, J. Zhang
Abstract: We present spectroscopic measurements of characteristic Kα and Kβ emissions from Mo targets irradiated by a 100 fs, 200 mJ, Ti: sapphire laser with intensity of 1017 W/cm2 to 1018 W/cm2 per pulse. This research pursues novel x-ray sources f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910310

24. High contract femtosecond laser-driven intense hard X-ray source for imaging application
Topic: Radiation Physics
Published: 11/18/2009
Authors: Lawrence T Hudson, L.M Chen, W.M. Wang, M. Kando, F Liu, X.X. Lin, J.L Ma, Y.T. Li, S.V. Bulanvo, T. Tajima, Y. Kato, Z.M. Sheng, J Zhang
Abstract: In this report we address the current situation of laser-driven hard X-ray sources for imaging applications,especially the saturation of X-ray conversion efficiency and the serious impact upon imaging quality.By employing high contrast laser pulses ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907448

25. High-resolution K-shell spectra from laser excited molybdenum plasma
Topic: Radiation Physics
Published: 11/1/2013
Authors: Lawrence T Hudson, C.I Szabo, P Indelicatio, John F Seely, T Ma
Abstract: X-ray spectra from Molybdenum plasmas were recorded by a Cauchois-type cylindrically bent Transmission Crystal Spectrometer (TCS). The absolutely calibrated spectrometer provides an unprecedented resolution of inner shell transitions (K x-ray radiati ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912283

26. Improved Determination of the Neutron Lifetime
Topic: Radiation Physics
Published: 12/2/2013
Authors: Jeffrey S Nico, A. T. Yue, Maynard S Dewey, David McLarty Gilliam, G L. Greene, A. Laptev, W M. Snow, F. E Wiefeldt
Abstract: The most precise determination of the neutron lifetime using the beam method was completed in 2005 and reported a result of tau_n = (886.3 ± 1.2 [stat] ± 3.2 [sys]) s. The dominant uncertainties were attributed to the absolute determination of the f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914740

27. Improving quantitative neutron radiography through image restoration
Topic: Radiation Physics
Published: 7/20/2013
Authors: Daniel S Hussey, Elias M Baltic, Kevin J Coakley, David L Jacobson
Abstract: This in-situ study examines the water content in polymer electrolyte fuel cells (PEFCs) using neutron radiography. Various conditions such as different polytetraflouroethylene (PTFE) loadings in the gas diffusion media including the micro-porous laye ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910015

28. In-situ Polarized 3He system for the Magnetism Reflectometer at the Spallation Neutron Source
Topic: Radiation Physics
Published: 7/2/2012
Authors: Thomas R Gentile, X Tong, C Y Jiang, V Lauter, H. Ambaye, D. Brown, L Crow, R J Goyette, W-T Lee, A. Parizzi
Abstract: We report on the in-situ polarized 3He neutron polarization analyzer developed for the time-of-flight Magnetism Reflectometer (MAGICS) at the Spallation Neutron Source (SNS) at Oak Ridge National Laboratory (ORNL). Using the spin exchange optical ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911438

29. Justification of Shielding Requirements for Plutonium Sources
Series: Technical Note (NIST TN)
Report Number: 1758
Topic: Radiation Physics
Published: 9/12/2012
Authors: Leticia S Pibida, Michael P Unterweger
Abstract: This report provides a justification for shielding plutonium sources when testing radiation detection instruments against standard performance requirements and test methods. The use of copper as a shielding material is proposed to provide compara ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912144

30. Key Comparison BIPM.RI(I)-K2 of the air-kerma standards of the NIST, USA and the BIPM in low-energy x-rays
Topic: Radiation Physics
Published: 3/23/2012
Authors: C Michelle O'Brien, D T Burns, C Kessler
Abstract: A key comparison has been made between the air-kerma standards of the NIST and the BIPM in the low-energy x ray range. The results show the standards to be in general agreement at the level of the combined standard uncertainty for the comparison of 4 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910332



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series