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Displaying records 51 to 58.
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51. Spectral response and characterization of a high-efficiency upconvertor for single-photon-level detection
Topic: Optics
Published: 10/18/2013
Authors: Paulina S Kuo, Oliver T Slattery, Yong-Su Kim, Jason S. Pelc, M. M. Fejer, Xiao Tang

52. Spectral response of an upconversion detector and spectrometer
Topic: Optics
Published: 9/17/2013
Authors: Paulina S Kuo, Oliver T Slattery, Yong-Su Kim, Jason S. Pelc, M. M. Fejer, Xiao Tang
Abstract: We theoretically and experimentally investigate the spectral response of an upconversion detector and discuss implications for its use as an infrared spectrometer. Upconversion detection is based on high-conversion-efficiency sum-frequency generation ...

Topic: Optics
Published: 9/12/2014
Authors: Zeeshan Ahmed, Gregory F Strouse
Abstract: For the past century, industrial temperature measurements have relied on resistance measurement of a thin metal wire or filament whose resistance varies with temperature. Though resistance thermometers can routinely measure industrial temperatures wi ...

54. Tests of a Two-Photon Technique for Measuring Polarization Mode Dispersion With Subfemtosecond Precision
Topic: Optics
Published: 1/1/1999
Authors: Eric Dauler, Gregg Jaeger, A Muller, Alan L Migdall
Abstract: An investigation is made of a recently introduced quantum interferometric method capable of measuring polarization mode dispersion (PMD) on sub-femtosecond scales, without the usual interferometric stability problems associated with such small ...

55. Ultra-Sensitive Chip-Based Photonic Temperature Sensor Using Ring Resonator Structures
Topic: Optics
Published: 2/3/2014
Authors: Haitan Xu, Mohammad Hafezi, Jingyun Fan, Jacob M Taylor, Gregory F Strouse, Zeeshan Ahmed
Abstract: Temperature is one of the most measured quantity in the world, second only to time. Recently there has been considerable interest in developing photonic temperature sensors to leverage advancements in frequency metrology. Here we show that Silico ...

56. Upper roughness limitations on the TIS/RMS relationship
Topic: Optics
Published: 9/27/2012
Authors: J C Stover, Sven Schroeder, Thomas Avery Germer
Abstract: The relationship between total integrated scatter (TIS) and root mean square (rms) roughness was developed in the radar literature and enabled the first use of scatter measurements to monitor optical roughness. This relationship has been used and mi ...

57. Visible and near-infrared reflectance spectrometry of Fe for lunar surface composition study
Topic: Optics
Published: 3/31/2010
Authors: David Blewett, Nhan V Nguyen, Oleg A Kirillov, Samuel Lawrence

58. Visible-frequency asymmetric transmission devices incorporating a hyperbolic metamaterial
Topic: Optics
Published: 6/17/2014
Authors: Ting Xu, Henri J Lezec

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