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Topic Area: Optical Metrology
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Displaying records 21 to 30 of 139 records.
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21. Characterization and Calibration of an Optical Time Domain Reflectometer Calibrator
Topic: Optical Metrology
Published: 8/23/2006
Authors: Donald R Larson, Nicholas G Paulter Jr, Kenneth C Blaney
Abstract: We report the results of an investigation into the signal characteristics and behavior of an instrument used to calibrate Optical Time Domain Reflectometers. This instrument implements the Telecommunications Industry Association standard TIA/EIA-455- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32309

22. Characterization of Composite Microstructure and Damage Using Optical Coherence Tomography
Topic: Optical Metrology
Published: 1/1/1999
Authors: Joy P Dunkers, C G Zimba, Kathleen M. Flynn, Donald Lee Hunston, R Prasankumar, X Li, J G Fujimoto
Abstract: Optical coherence tomography (OCT) is a non-destructive and non-contact technique that images microstructure within scattering media. In this work, the versatility of OCT for non-destructive evaluation is demonstrated through imaging of composite mi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851542

23. Characterization of Metal-Oxide Nanofilm Morphologies and Composition by Terahertz Transmission Spectroscopy
Topic: Optical Metrology
Published: 3/30/2009
Authors: Edwin J Heilweil, James E Maslar, William Andrew Kimes, Nabil Bassim, Peter K. Schenck
Abstract: An all-optical terahertz absorption technique for non-destructive characterization of nanometer-scale metal-oxide thin films grown on silicon substrates is described. Example measurements of laser and atomic layer-deposited films of HfO2, TiO3, Al2O ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842590

24. Characterization of an Optical Time Domain Reflectometer Calibrator
Topic: Optical Metrology
Published: 3/1/2007
Authors: Donald R Larson, Nicholas G Paulter Jr, Kenneth C Blaney
Abstract: We report the results of an investigation into the signal characteristics and behavior of an instrument used to calibrate Optical Time Domain Reflectometers. This instrument implements the Telecommunications Industry Association standard TIA/EIA-455- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32449

25. Choosing the right detector for laser power and energy measurements
Topic: Optical Metrology
Published: 10/1/2008
Author: Marla L Dowell
Abstract: You may not realize the importance of good laser metrology and its many pitfalls until you realize how much of today‰s commonplace conveniences ‹ from long distance communications to LASIK (laser-assisted in situ keratomileusis) to state-of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33180

26. Collinear Optical Coherence Microscopy and Confocal Fluorescence Microscopies for Tissue Engineering
Topic: Optical Metrology
Published: 11/1/2003
Authors: Joy P Dunkers, Marcus T Cicerone, N Washburn
Abstract: Tissue engineered medical products (TEMPs) often consist of a three-dimensional synthetic scaffold that provides form and foundation for the cells as they produce the tissue of interest. Successful TEMPs will allow cell infiltration, and foster prol ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852133

27. Collinear Optical Coherence Microscopy and Confocal Fluorescence Microscopy: A New in Vitro Technique for Tissue Engineering
Topic: Optical Metrology
Published: 1/1/2003
Authors: Joy P Dunkers, Marcus T Cicerone, N. R. Washburn
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853915

28. Collinear Optical Coherence and Confocal Fluorescence Microscopies for Tissue Engineering
Topic: Optical Metrology
Published: 1/1/2003
Authors: Joy P Dunkers, Marcus T Cicerone, N. R. Washburn
Abstract: We have combined confocal optical coherence (OCM) and confocal fluorescence (CFM) microscopies to gather simultaneous structural and functional information on tissue engineered products in a registered fashion. In this work, we present the design an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852114

29. Comparison of Optical Coherence Tomography, X-Ray Computed Tomography, and Confocal Microscopy Results From an Impact Damaged Epoxy/E-Glass Composite
Topic: Optical Metrology
Published: 1/1/2002
Authors: Joy P Dunkers, D P Sanders, Donald Lee Hunston, M J Everett, William H. Green
Abstract: Optical coherence tomography (OCT) is an emerging technique for imaging of synthetic materials. OCT is attractive because of the combination of its high sensitivity (>90 dB), high resolution ((10-20) mm), and low cost (~$75 k). The value of any new ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851798

30. Critical dimension metrology by through-focus scanning optical microscopy beyond the 22 nm node
Topic: Optical Metrology
Published: 6/7/2013
Authors: Ravikiran Attota, Benjamin D. Bunday, Victor Vertanian
Abstract: We present results using simulations and experiments to demonstrate metrological applications of the through-focus scanning optical microscopy (TSOM) down to features at and well below the International Technology Roadmap for Semiconductors' 22  ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913353



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