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Topic Area: Optical Metrology
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Displaying records 111 to 120 of 134 records.
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111. Spectral responsivity based calibration of photometer and colorimeter standards
Topic: Optical Metrology
Published: 6/19/2013
Author: George P Eppeldauer
Abstract: Several new generation transfer- and working-standard illuminance meters and tristimulus colorimeters have been developed at the National Institute of Standards and Technology (NIST) to measure all kinds of light sources with low uncertainty. The spe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913528

112. Spectrophotometer Linearity Testing Using the Double-Aperture Method
Topic: Optical Metrology
Published: 10/1/1972
Authors: Klaus Mielenz, K Eckerle
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620035

113. Standardization of Broadband UV Measurements
Topic: Optical Metrology
Published: 1/1/2013
Author: George P Eppeldauer
Abstract: The CIE standardized rectangular-shape UV response functions can be realized only with large spectral mismatch errors. The spectral power-distribution of UV sources is not standardized. Accordingly, the readings of different types of UV meters, even ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913173

114. Standardization of Broadband UV Measurements for 365 nm LED Sources
Series: Journal of Research (NIST JRES)
Report Number: 117.004
Topic: Optical Metrology
Published: 2/2/2012
Author: George P Eppeldauer
Abstract: Broadband UV measurements are analyzed when UV-A irradiance meters measure optical radiation from 365-nm sources. The CIE standardized rectangular-shape UV-A function can be realized only with large spectral mismatch errors. The spectral power-di ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909003

115. Statistical Methods for Analyzing Color Differences
Topic: Optical Metrology
Published: 6/2/2011
Authors: Maria E Nadal, Carl C Miller, Hugh Fairman
Abstract: Multi-valued measurands, such as spectral reflectance or transmission, tristimulus values, are usually analyzed by reducing the data to a single-valued parameter, such as color difference. The variations of sets of color differences are non-normal d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842550

116. Supercontinuum fiber laser source for reflectance calibrations in remote sensing
Topic: Optical Metrology
Published: 8/1/2010
Authors: Clarence Joseph Zarobila, Heather J Patrick
Abstract: The Optical Technology Division of the NIST provides reference measurements of specular and diffuse reflectance of materials, including measurements that provide traceability for diffuser plaques that are used as onboard calibration standards in remo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906175

117. Synchrotron Radiation Based Irradiance Calibration From 200 nm to 400 nm at SURF III
Topic: Optical Metrology
Published: 1/1/2007
Authors: Uwe Arp, Charles E Gibson, Keith R Lykke, Albert C Parr, Robert D. Saunders, D J Shin, Ping-Shine Shaw, Zhigang Li, Howard W Yoon
Abstract: A new facility for measuring source irradiance was commissioned recently at the National Institute of Standards and Technology (NIST). The facility uses the calculable radiation from the Synchrotron Ultraviolet Radiation Facility (SURF III) as the pr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841022

118. THz Spectroscopic Study of Rust Layer on Aged Steel-Reinforced Structural Components
Topic: Optical Metrology
Published: 9/26/2011
Authors: David F Plusquellic, Virgil Provenzano, Shin G. Chou
Abstract: In this study, we use THz-based spectroscopy as a non-destructive diagnostic tool to characterize the corrosion by-products (rust) on aged iron structural components. Even though previous Mossbauer spectroscopic findings suggested the presence of an ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907023

119. TSOM Method for Nanoelectronics Dimensional Metrology
Topic: Optical Metrology
Published: 11/18/2011
Author: Ravikiran (Ravikiran) Attota
Abstract: Through-focus scanning optical microscopy (TSOM) is a relatively new method that transforms conventional optical microscopes into truly three-dimensional metrology tools for nanoscale to microscale dimensional analysis. TSOM achieves this by acquirin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908623

120. TSOM Method for Semiconductor Metrology
Topic: Optical Metrology
Published: 4/18/2011
Authors: Ravikiran (Ravikiran) Attota, Ronald G Dixson, John A Kramar, James Edward Potzick, Andras Vladar, Benjamin D. Bunday, Erik Novak, Andrew C. Rudack
Abstract: Through-focus scanning optical microscopy (TSOM) is a new metrology method that achieves 3D nanoscale measurement resolution using conventional optical microscopes; measurement sensitivities are comparable to what is typical using Scatterometry, SEM ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908177



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