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Topic Area: Optical Metrology
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Displaying records 111 to 117.
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111. Time and Frequency-Domain Spectroscopy with Dual Frequency Combs
Topic: Optical Metrology
Published: 5/28/2009
Authors: Nathan Reynolds Newbury, Ian R Coddington, William C Swann
Abstract: High-resolution spectroscopic measurements of the amplitude and phase spectra from a gas sample can be acquired by use of dual frequency combs. Here we discuss the corresponding gas signature in the time domain.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901109

112. Time-domain spectroscopy of the optical free-induction decay from vibrating molecules
Topic: Optical Metrology
Published: 4/26/2010
Authors: Ian R Coddington, William C Swann, Nathan Reynolds Newbury
Abstract: Time-domain spectroscopy using dual, coherent frequency combs is used to measure free-induction decay from a molecular gas sample in the near-IR with a time-domain signal-to-noise ratio of ~10^u6^ over a ~6 ns window at 55 fs time resolution (corresp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903774

113. Tunable Supercontinuum Fiber Laser Source for BRDF Measurements in the STARR II Gonioreflectometer
Topic: Optical Metrology
Published: 9/27/2012
Authors: Heather J Patrick, Clarence Joseph Zarobila, Thomas Avery Germer, Victor Alan Ying, Catherine C Cooksey, Benjamin K Tsai
Abstract: STARR II is a planned NIST facility for spectral measurements of specular reflectance and diffuse bidirectional reflectance distribution function (BRDF) that is the follow-on to the current NIST STARR (Spectral Tri-function Automated Reference Reflec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912019

114. Use of TSOM for sub-11 nm node pattern defect detection and HAR features
Topic: Optical Metrology
Published: 4/30/2013
Authors: Ravikiran Attota, Abraham Arceo, Bunday Benjamin
Abstract: In-line metrologies currently used in the semiconductor industry are being challenged by the aggressive pace of device scaling and the adoption of novel device architectures. In defect inspection, conventional bright field techniques will not likely ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913698

115. Vibration immune fiber-laser frequency comb based on a polarization-maintaining figure-eight laser
Topic: Optical Metrology
Published: 5/20/2009
Authors: Fabrizio Raphael Giorgetta, Esther Baumann, Jeffrey W. Nicholson, William C Swann, Ian R Coddington, Nathan Reynolds Newbury
Abstract: A frequency comb is phase-locked to a cw laser with an electro-optic-modulator providing 1.6 MHz feedback bandwidth. Residual phase noise is as low as -94 dBc/Hz, and the comb remained locked under mechanical vibration of up to 1.9 g.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901116

116. Wavelength References for Optical Interferometry
Topic: Optical Metrology
Published: 6/12/2005
Authors: Richard W Fox, Leo W. Hollberg
Abstract: We are exploring air wavelength references useful for interferometry. Femtosecond comb frequency measurements determine mode wavelengths of a stable optical cavity in vacuum, and subsequently a tunable laser is locked to the modes in air.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30063

117. Weak value thermostat with 0.2 mK precision
Topic: Optical Metrology
Published: 12/1/2012
Authors: Patrick F Egan, Jack A Stone Jr
Abstract: A new laser-based thermostat sensitive to 0.2 mK at room temperature is reported. The method utilizes a fluid-filled prism and interferometric weak value amplification to sense nanoradian deviations of a laser beam: due to the high thermooptic coef ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912232



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