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Topic Area: Optical Metrology
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61. Vibration immune fiber-laser frequency comb based on a polarization-maintaining figure-eight laser
Topic: Optical Metrology
Published: 5/20/2009
Authors: Fabrizio Raphael Giorgetta, Esther Baumann, Jeffrey W. Nicholson, William C Swann, Ian R Coddington, Nathan Reynolds Newbury
Abstract: A frequency comb is phase-locked to a cw laser with an electro-optic-modulator providing 1.6 MHz feedback bandwidth. Residual phase noise is as low as -94 dBc/Hz, and the comb remained locked under mechanical vibration of up to 1.9 g.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901116

62. Quantum radiometry
Topic: Optical Metrology
Published: 5/2/2009
Authors: Sergey V Polyakov, Alan L Migdall
Abstract: We review radiometric techniques that take advantage of photon counting and stem from the quantum laws of nature. We present a brief history of metrological experiments and review the current state of experimental quantum radiometry.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902273

63. Characterization of Metal-Oxide Nanofilm Morphologies and Composition by Terahertz Transmission Spectroscopy
Topic: Optical Metrology
Published: 3/30/2009
Authors: Edwin J Heilweil, James E Maslar, William Andrew Kimes, Nabil Bassim, Peter K. Schenck
Abstract: An all-optical terahertz absorption technique for non-destructive characterization of nanometer-scale metal-oxide thin films grown on silicon substrates is described. Example measurements of laser and atomic layer-deposited films of HfO2, TiO3, Al2O ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842590

64. Polarization-sensitive linear optical sampling for characterization of polarization-multiplexed QPSK
Topic: Optical Metrology
Published: 3/20/2009
Authors: Paul A Williams, Tasshi Dennis, Ian R Coddington, Nathan Reynolds Newbury
Abstract: We describe polarization-sensitive phase-referenced linear optical sampling for measuring polarization, amplitude, and phase of a high speed optical waveform. With a single measurement, we simultaneously measure both orthogonal polarization channels ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900133

65. High-performance, vibration-immune, fiber-laser frequency comb
Topic: Optical Metrology
Published: 3/1/2009
Authors: Esther Baumann, Fabrizio Raphael Giorgetta, Jeffrey W. Nicholson, William C Swann, Ian R Coddington, Nathan Reynolds Newbury
Abstract: We demonstrate an environmentally robust optical frequency comb based on a polarization-maintaining, allfiber, figure-eight laser. The comb is phase locked to a cavity-stabilized cw laser by use of an intracavity electro-optic phase modulator yieldin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900877

66. Choosing the right detector for laser power and energy measurements
Topic: Optical Metrology
Published: 10/1/2008
Author: Marla L Dowell
Abstract: You may not realize the importance of good laser metrology and its many pitfalls until you realize how much of today’s commonplace conveniences – from long distance communications to LASIK (laser-assisted in situ keratomileusis) to state-of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33180

67. Infrared Absolute Calibrations Down to 10 fW in Low-Temperature Environments at NIST
Topic: Optical Metrology
Published: 7/22/2008
Authors: Adriaan Carl Linus Carter, Raju Vsnu Datla, Timothy Jung, Solomon Woods
Abstract: The Low Background Infrared (LBIR) facility at the National Institute of Standards and Technology (NIST) is responsible for absolute IR radiometric calibrations (SI traceable) in low-background temperature (below 80 K) environments. IR radiometric te ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842510

68. NEW PRACTICAL METHOD FOR MEASUREMENT OF HIGH-POWER LEDS
Topic: Optical Metrology
Published: 7/11/2008
Authors: Yuqin Zong, Yoshihiro Ohno
Abstract: The measurement of high-power light emitting diodes (LEDs) has been difficult because they are highly sensitive to thermal operating conditions, and there has been a lack of common methods that can be used by both LED manufactures and users to acquir ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842561

69. NIST Goniospectrometer for Surface Color Measurements
Topic: Optical Metrology
Published: 7/7/2008
Authors: Maria E Nadal, Gael Obein
Abstract: The goniospectrometer at the National Institute of Standards and Technology (NIST) can measure the spectral reflectance of colored samples over a wide range of illumination and viewing angles. This capability is important for the colorimetric charact ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842549

70. Bilateral optical power meter comparison between NIST and CENAM
Topic: Optical Metrology
Published: 7/1/2008
Authors: Igor Vayshenker, J. Bermudez, J. Molina, Z. Ruiz, David J Livigni, Xiaoyu X. Li, John H Lehman
Abstract: We describe the results of a comparison of reference standards between the National Institute of Standards and Technology (NIST-USA) and Centro Nacional De Metrologia (CENAM-Mexico). Open beam (free field) and optical-fiber-based measurements at wave ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33044