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Topic Area: Optical Metrology
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Displaying records 101 to 110 of 138 records.
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101. High-performance, vibration-immune, fiber-laser frequency comb
Topic: Optical Metrology
Published: 3/1/2009
Authors: Esther Baumann, Fabrizio Raphael Giorgetta, Jeffrey W. Nicholson, William C Swann, Ian R Coddington, Nathan Reynolds Newbury
Abstract: We demonstrate an environmentally robust optical frequency comb based on a polarization-maintaining, allfiber, figure-eight laser. The comb is phase locked to a cavity-stabilized cw laser by use of an intracavity electro-optic phase modulator yieldin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900877

102. Choosing the right detector for laser power and energy measurements
Topic: Optical Metrology
Published: 10/1/2008
Author: Marla L Dowell
Abstract: You may not realize the importance of good laser metrology and its many pitfalls until you realize how much of today‰s commonplace conveniences ‹ from long distance communications to LASIK (laser-assisted in situ keratomileusis) to state-of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33180

103. NEW PRACTICAL METHOD FOR MEASUREMENT OF HIGH-POWER LEDS
Topic: Optical Metrology
Published: 10/1/2008
Authors: Yuqin Zong, Yoshihiro Ohno
Abstract: The measurement of high-power light emitting diodes (LEDs) has been difficult because they are highly sensitive to thermal operating conditions, and there has been a lack of common methods that can be used by both LED manufactures and users to acquir ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842561

104. f1‰ EVALUATION AND MEASUREMENT COMPARISON
Topic: Optical Metrology
Published: 10/1/2008
Authors: Jiangen PAN, Haiping SHEN, Yuqin Zong, Yoshihiro Ohno
Abstract: The mismatch of spectral responsivity to the CIE V(lambda) function, i. e., the f1‰ index, is the most critical characteristic of photometers and tristimulus colorimeters. The f1‰ value varies with measurement conditions, which is often omi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842554

105. An infrared laser-based reflectometer for low reflectance measurements of samples and cavity structures
Topic: Optical Metrology
Published: 9/15/2008
Authors: Leonard M Hanssen, Jinan Zeng
Abstract: An instrument, the Complete Hemispherical Infrared Laser-based Reflectometer (CHILR), has been designed and built for the accurate characterization of the total reflectance of highly absorbing samples and cavity structures down to the level of 10-5 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842545

106. Infrared Absolute Calibrations Down to 10 fW in Low-Temperature Environments at NIST
Topic: Optical Metrology
Published: 7/22/2008
Authors: Adriaan Carl Linus Carter, Raju Vsnu Datla, Timothy Jung, Solomon Woods
Abstract: The Low Background Infrared (LBIR) facility at the National Institute of Standards and Technology (NIST) is responsible for absolute IR radiometric calibrations (SI traceable) in low-background temperature (below 80 K) environments. IR radiometric te ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842510

107. NIST Goniospectrometer for Surface Color Measurements
Topic: Optical Metrology
Published: 7/7/2008
Authors: Maria E Nadal, Gael Obein
Abstract: The goniospectrometer at the National Institute of Standards and Technology (NIST) can measure the spectral reflectance of colored samples over a wide range of illumination and viewing angles. This capability is important for the colorimetric charact ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842549

108. Bilateral optical power meter comparison between NIST and CENAM
Topic: Optical Metrology
Published: 7/1/2008
Authors: Igor Vayshenker, J. Bermudez, J. Molina, Z. Ruiz, David J Livigni, Xiaoyu X. Li, John H Lehman
Abstract: We describe the results of a comparison of reference standards between the National Institute of Standards and Technology (NIST-USA) and Centro Nacional De Metrologia (CENAM-Mexico). Open beam (free field) and optical-fiber-based measurements at wave ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33044

109. Dual-CGH Interferometry Test for X-Ray Mirror Mandrels
Topic: Optical Metrology
Published: 6/15/2008
Authors: Guangjun Gao, John Lehan, Ulf Griesmann
Abstract: We describe a glancing-incidence interferometric double-pass test, based on a pair of computer generated holograms (CGHs), for mandrels used to fabricate x-ray mirrors for space-based x-ray telescopes. The design of the test and its realization are d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902515

110. Extraction of trench geometry and linewidth of nanoscale grating targets in (110)-oriented silicon using angle-resolved scatterometry
Topic: Optical Metrology
Published: 6/9/2008
Authors: Heather J Patrick, Thomas Avery Germer, Michael W Cresswell, Bin Li, Huai Huang, Paul S. Ho
Abstract: The extraction of nanoscale dimensions and feature geometry of grating targets using signature-based optical techniques is an area of continued interest in semiconductor manufacturing. In the current work, we have performed angle-resolved scatterome ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=842548



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