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You searched on: Topic Area: Optical Metrology

Displaying records 11 to 20 of 64 records.
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11. Progress toward Radiation-Pressure-Based Measurement of High-Power Laser Emission - Under Policy Review
Topic: Optical Metrology
Published: 10/6/2014
Authors: Paul A Williams, Joshua Aram Hadler, Daniel King, Robert Lee, Frank C. Maring, Gordon Allan Shaw, Nathan A Tomlin, John H Lehman, Marla L Dowell
Abstract: We present an overview of our efforts toward using optical radiation pressure as a means to measure optical power from high-power lasers. Early results with measurements ranging from tens of watts to 92 kW prove the concept, but validation uncertaint ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916422

12. Superconducting nanowire single photon detectors fabricated from an amorphous Mo0.75Ge0.25 thin-film
Topic: Optical Metrology
Published: 7/15/2014
Authors: Varun Boehm Verma, Adriana Eleni Lita, Michael R Vissers, Francesco Marsili, David P Pappas, Richard P Mirin, Sae Woo Nam
Abstract: We present the characteristics of superconducting nanowire single photon detectors (SNSPDs) fabricated from amorphous Mo0.75Ge0.25 thin -films. Fabricated devices show a saturation of the internal detection efficiency at temperatures below 1 K, w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915243

13. An analysis of the nonlinear spectral mixing of didymium and soda-lime glass beads using hyperspectral imagery (HSI) microscopy
Topic: Optical Metrology
Published: 6/13/2014
Authors: Ronald Resmini, Robert S Rand, Christopher Deloye, David W Allen
Abstract: Nonlinear spectral mixing occurs when materials are intimately mixed. Intimate mixing is a common characteristic of granular materials such as soils. A linear spectral unmixing inversion applied to a nonlinear mixture will yield subpixel abundance es ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915979

14. Single molecule confocal fluorescence lifetime correlation spectroscopy for accurate nanoparticle size determination
Topic: Optical Metrology
Published: 5/15/2014
Authors: Bonghwan B. Chon, Kimberly A Briggman, Jeeseong Hwang
Abstract: We report on an experimental procedure in confocal single molecule fluorescence lifetime correlation spectroscopy (FLCS) to determine the range of excitation power and molecule concentration in solution under which the application of an unmodified ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914381

15. Semiconductor-based detectors
Topic: Optical Metrology
Published: 12/13/2013
Authors: Sergio Cova, Massimo Ghioni, Mark A. Itzler, Joshua C Bienfang, Alessandro Restelli
Abstract: There is nowadays a widespread and growing interest in low-level light detection and imaging. This interest is driven by the need for high sensitivity in various scientific and industrial applications such as fluorescence spectroscopy in life and ma ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914460

16. Practical Use and Calculation of CCT and Duv
Topic: Optical Metrology
Published: 10/18/2013
Author: Yoshihiro Ohno
Abstract: The Correlated Color Temperature (CCT) is often used to represent chromaticity of white light sources, but chromaticity is two-dimensional, and another dimension, the distance from the Planckian locus, is often missing. Duv is defined in ANSI C78.377 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912622

17. Fourier Domain Optical Tool Normalization for Quantitative Parametric Image Reconstruction
Topic: Optical Metrology
Published: 9/5/2013
Authors: Jing Qin, Richard M Silver, Bryan M Barnes, Hui Zhou, Francois R. Goasmat
Abstract: There has been much recent work in developing advanced optical metrology methods that use imaging optics for critical dimension measurements and defect detection. Sensitivity to nanometer scale changes has been observed when measuring critical dimens ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913587

18. Mode reconstruction of a light field by multi-photon statistics
Topic: Optical Metrology
Published: 7/15/2013
Authors: Elizabeth A Goldschmidt, Fabrizio Piacentini, I. Ruo Berchera, Sergey V Polyakov, Silke Peters, Stefan Kuck, Giorgio Brida, Ivo Pietro Degiovanni, Alan L Migdall, Marco Genovese
Abstract: Knowing the underlying number and structure of occupied modes of a light field plays a crucial role in minimizing loss and decoherence of quantum information. Typically, full characterization of the mode structure involves a series of several separ ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913292

19. Spectral responsivity based calibration of photometer and colorimeter standards
Topic: Optical Metrology
Published: 6/19/2013
Author: George P Eppeldauer
Abstract: Several new generation transfer- and working-standard illuminance meters and tristimulus colorimeters have been developed at the National Institute of Standards and Technology (NIST) to measure all kinds of light sources with low uncertainty. The spe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913528

20. Use of TSOM for sub-11 nm node pattern defect detection and HAR features
Topic: Optical Metrology
Published: 4/30/2013
Authors: Ravikiran Attota, Abraham Arceo, Bunday Benjamin
Abstract: In-line metrologies currently used in the semiconductor industry are being challenged by the aggressive pace of device scaling and the adoption of novel device architectures. In defect inspection, conventional bright field techniques will not likely ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913698



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