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Displaying records 731 to 738.
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731. Using nested reverberation chambers to determine the shielding effectiveness of a material
Topic: Electronics & Telecommunications
Published: 7/8/2007
Authors: Jason B Coder, John M Ladbury, Christopher L Holloway
Abstract: We examine the current method for determining the shielding effectiveness of a material using nested reverberation chambers and show a simplified approach. Included in our examination is a discussion of the purpose for using a four antenna measuremen ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32645

732. Variable Waveform Excitation of Ceramic-Element Transducers for ASTM E127-Type Reference Block Calibration
Topic: Electronics & Telecommunications
Published: 3/1/2000
Authors: John A Slotwinski, C R Snydor, Ana Lopez-Sanchez
Abstract: Nominally identical ceramic-element ultrasonic transducers have been used successfully to calibrate ASTM E127-type flat-bottom-hole (FBH) aluminum reference blocks. The transducers all had nominal center frequencies of 5 MHz, and nominal element diam ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823254

733. Variable Waveform Excitation of Ceramic-Element Transducers for ASTM E127-Type Reference Blocks
Topic: Electronics & Telecommunications
Published: 1/1/2000
Authors: John A Slotwinski, Ana Lopez-Sanchez, G V Sydnor
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820135

734. Vector Corrected Noise Temperature Measurements
Topic: Electronics & Telecommunications
Published: 6/7/2002
Authors: Mark H. Weatherspoon, Lawrence P. Dunleavy, Ali Boudiaf, James Paul Randa
Abstract: A new one-port noise temperature measurement technique is presented that uses receiver noise parameters for error correction. Improved accuracy in one-port noise temperature measurements made with commercial systems is demonstrated without using iso ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=954

735. Verification of an EMC facility retro fit using time domain and field uniformity measurements
Topic: Electronics & Telecommunications
Published: 7/8/2007
Authors: Dennis G. Camell, Michael Taylor, Robert T. Johnk, Benjamin Davis
Abstract: This paper summarizes a joint NIST Industry measurement effort. Time domain and field uniformity measurements are used to verify a retro-fit of RF absorber in an EMC Compliance Chamber from 30 MHz to 6 GHz. Time gating and dense frequency packing of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32649

736. Word-synchronous linear optical sampling of 40 Gb/s QPSK signals
Topic: Electronics & Telecommunications
Published: 3/20/2009
Authors: Tasshi Dennis, Paul A Williams, Ian R Coddington, Nathan Reynolds Newbury
Abstract: We demonstrate word-synchronous measurements of QPSK format 40 Gb/s PRBS signals using linear optical sampling with a precision time-base, which allows us to average waveforms and distinguish between signal distortion and noise in eye diagrams.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900143

737. Workshop on Micromechanics Measurement Technologies for Fiber-Polymer Interfaces
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6102
Topic: Electronics & Telecommunications
Published: 5/1/1997
Authors: Walter G McDonough, Richard~undefined~undefined~undefined~undefined~undefined Parnas, Gale Antrus Holmes, Donald Lee Hunston
Abstract: The Polymers Division hosted the Workshop on Micromechanics Measurement Technologies for Fiber-Polymer Interfaces, jointly sponsored by NIST and the Textile Research Institute of Princeton, NJ, on May 28-30, 1997. Fifty researchers from industry, ac ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851382

738. Workshop on Reliability Issues in Nanomaterials
Series: Special Publication (NIST SP)
Report Number: 1043
Topic: Electronics & Telecommunications
Published: 8/1/2005
Authors: Robert R Keller, David Thomas Read, Roop L Mahajan
Abstract: The Workshop on Reliability Issues in Nanomaterials was held at the Boulder Laboratories of the National Institute of Standards and Technology (NIST) on August 17-19, 2004. It was designed to promote a particular subset of NIST?s responsibilities und ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50111



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