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Displaying records 731 to 740 of 745 records.
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731. Uncertainty Analysis for Noise-Parameter Measurements
Topic: Electronics & Telecommunications
Published: 6/8/2008
Author: James Paul Randa
Abstract: A brief summary is presented for the uncertainty analysis for measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave repre ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32904

732. Uncertainty Analysis for Noise-Parameter Measurements at NIST
Topic: Electronics & Telecommunications
Published: 4/9/2009
Author: James Paul Randa
Abstract: The uncertainty analysis is presented for NIST measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33026

733. Use of an Ion Energy Analyzer-Mass Spectrometer to Measure Ion Kinetic-Energy Distributions from RF Discharges in Argon-Helium Gas Mixtures
Topic: Electronics & Telecommunications
Published: 3/1/1994
Authors: James K Olthoff, Richard J. Van Brunt, S. B. Radovanov, J. A. Rees
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=1903

734. Use of the Oscillation Based Built-in Self-test Method for Smart Sensor Devices
Topic: Electronics & Telecommunications
Published: 5/7/2001
Authors: Angela Hodge, R. Newcomb, Allen R Hefner Jr
Abstract: An oscillation-based built in self-test (BIST) method is presented for functional testing of mixed signal devices. An integral component of this method of on-chip testing involves transforming an oscillating analog signal into a digital clock-like s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=11649

735. Using Atom Optics to Fabricate Nanostructures
Topic: Electronics & Telecommunications
Published: 1/1/1995
Authors: Robert Celotta, Jabez J McClelland, R E. Scholten, R Gupta
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620444

736. Using Self-Assembled Monolayer Technology to Probe the Fiber-Matrix Interface
Topic: Electronics & Telecommunications
Published: 1/1/2001
Authors: Gale Antrus Holmes, E Feresenbet, D T Raghavan
Abstract: hesion at the fiber matrix interface of composite specimens is often ascribed to the following factors (Sharpe and Drzal): (1) mechanical interlocking, (2) physicochemical interactions, (3) chemical bonding, and (4) mechanical deformation of the fib ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851836

737. Using Self-Assembled Monolayer Technology to Probe the Mechanical Response of the Fiber Interphase-Matrix Interphase Interface
Topic: Electronics & Telecommunications
Published: 6/1/2003
Authors: Gale Antrus Holmes, E Feresenbet, D T Raghavan
Abstract: In this paper, a brief review of the fiber-matrix interphase/interface region is given for carbon- and glass-fiber composites. The interphase/interface region is discussed interms of the fiber interphase (FI), the matrix (MI), and the FI-MI interfac ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851935

738. Using nested reverberation chambers to determine the shielding effectiveness of a material
Topic: Electronics & Telecommunications
Published: 7/8/2007
Authors: Jason B Coder, John M Ladbury, Christopher L Holloway
Abstract: We examine the current method for determining the shielding effectiveness of a material using nested reverberation chambers and show a simplified approach. Included in our examination is a discussion of the purpose for using a four antenna measuremen ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32645

739. Variable Waveform Excitation of Ceramic-Element Transducers for ASTM E127-Type Reference Block Calibration
Topic: Electronics & Telecommunications
Published: 3/1/2000
Authors: John A. Slotwinski, C R Snydor, Ana Lopez-Sanchez
Abstract: Nominally identical ceramic-element ultrasonic transducers have been used successfully to calibrate ASTM E127-type flat-bottom-hole (FBH) aluminum reference blocks. The transducers all had nominal center frequencies of 5 MHz, and nominal element diam ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=823254

740. Variable Waveform Excitation of Ceramic-Element Transducers for ASTM E127-Type Reference Blocks
Topic: Electronics & Telecommunications
Published: 1/1/2000
Authors: John A. Slotwinski, Ana Lopez-Sanchez, G V Sydnor
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820135



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