NIST logo

Publications Portal

You searched on:
Topic Area: Electronics
Telecommunications
Sorted by: title

Displaying records 721 to 730 of 739 records.
Resort by: Date / Title


721. Ultrasound Power Measurement Techniques at NIST
Topic: Electronics & Telecommunications
Published: 11/12/1995
Author: Steven Earl Fick
Abstract: Megahertz-frequency sound waves with submillimeter wavelengths are widely used to probe the interior regions of many types of structures. When human tissues are exposed to ultrasound for diagnostic or therapeutic purposes, the applied power levels m ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820047

722. Ultrasound Power Measurement by Pulsed Radiation Pressure
Topic: Electronics & Telecommunications
Published: 8/2/1999
Author: Steven Earl Fick
Abstract: In a specially designed radiation force balance (RFB), low-frequency pulse modulation of the incident ultrasound allows high-accuracy measurement of time-averaged spatially-integrated ultrasound power radiated into a reflectionless water load. Errors ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=820119

723. Uncertainties in NIST Noise-Temperature Measurements
Series: Technical Note (NIST TN)
Report Number: 1502
Topic: Electronics & Telecommunications
Published: 3/1/1998
Author: James Paul Randa
Abstract: Uncertainty analyses are presented for NIST measurements of noise temperature. All systems currently used in NIST calibrations of thermal-noise sources are treated. These include tuned systems for 30 and 60 MHz, coaxial total-power radiometers for 1 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=11498

724. Uncertainties in Spherical Near-Field Antenna Measurements
Topic: Electronics & Telecommunications
Published: 8/3/2005
Authors: Michael H Francis, Ronald Curtis Wittmann, Jin-Seob Kang
Abstract: A general approach is presented for estimating uncertainties in far-field parameters obtained from spherical near-field antenna measurements. The error is approximately bounded in terms of the uncertainty of the probe's receiving pattern and the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31969

725. Uncertainty Analysis for Noise-Parameter Measurements
Topic: Electronics & Telecommunications
Published: 6/8/2008
Author: James Paul Randa
Abstract: A brief summary is presented for the uncertainty analysis for measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave repre ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32904

726. Uncertainty Analysis for Noise-Parameter Measurements at NIST
Topic: Electronics & Telecommunications
Published: 4/9/2009
Author: James Paul Randa
Abstract: The uncertainty analysis is presented for NIST measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33026

727. Use of an Ion Energy Analyzer-Mass Spectrometer to Measure Ion Kinetic-Energy Distributions from RF Discharges in Argon-Helium Gas Mixtures
Topic: Electronics & Telecommunications
Published: 3/1/1994
Authors: James K Olthoff, Richard J. Van Brunt, S. B. Radovanov, J. A. Rees
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=1903

728. Use of the Oscillation Based Built-in Self-test Method for Smart Sensor Devices
Topic: Electronics & Telecommunications
Published: 5/7/2001
Authors: Angela Hodge, R. Newcomb, Allen R Hefner Jr
Abstract: An oscillation-based built in self-test (BIST) method is presented for functional testing of mixed signal devices. An integral component of this method of on-chip testing involves transforming an oscillating analog signal into a digital clock-like s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=11649

729. Using Atom Optics to Fabricate Nanostructures
Topic: Electronics & Telecommunications
Published: 1/1/1995
Authors: Robert Celotta, Jabez J McClelland, R E. Scholten, R Gupta
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620444

730. Using Self-Assembled Monolayer Technology to Probe the Fiber-Matrix Interface
Topic: Electronics & Telecommunications
Published: 1/1/2001
Authors: Gale Antrus Holmes, E Feresenbet, D T Raghavan
Abstract: hesion at the fiber matrix interface of composite specimens is often ascribed to the following factors (Sharpe and Drzal): (1) mechanical interlocking, (2) physicochemical interactions, (3) chemical bonding, and (4) mechanical deformation of the fib ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851836



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series