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Topic Area: Electronics
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Displaying records 681 to 690 of 745 records.
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681. The Impact of Nonlinear Propagation Effects in Water on Ultrasound Used in Industrial Nondestructive Evaluation
Topic: Electronics & Telecommunications
Published: 1/2/1998
Author: John A. Slotwinski
Abstract: An experimental study was conducted to investigate the presence of, and assess the quantitative impact of nonlinear propagation effects of water on ultrasonic pulses generated by 5 MHz transducers of the type used in industrial ultrasonic nondestruct ...

682. The Influence of Elastomer Concentration on Toughness in Dispersions Containing Preformed Acrylic Elastomeric Particles in an Epoxy Matrix
Topic: Electronics & Telecommunications
Published: 1/1/1999
Authors: J He, D T Raghavan, D Hoffman, Donald Lee Hunston

683. The Influence of Silane Coupling Agent Composition on the Surface Characterization of Fiber and on Fiber-Matrix Interfacial Shear Strength
Topic: Electronics & Telecommunications
Published: 7/1/2003
Authors: E Feresenbet, Gale Antrus Holmes, D T Raghavan
Abstract: Epoxy resins are widely used as the matrix material for fiber reinforced composites in aircrafts, automobiles, ships and housing. Most of the reinforcement in epoxy composite is glass fiber so as to lower the cost. Studies in the past have suggeste ...

684. The NIST Automated Coaxial Microwave Power Standard
Topic: Electronics & Telecommunications
Published: 1/1/1989
Author: Fred R. Clague

685. The NIST Microforce Realization and Measurement Project
Topic: Electronics & Telecommunications
Published: 4/1/2003
Authors: David B Newell, Edwin Ross Williams, John A Kramar, Jon Robert Pratt, Douglas T Smith
Abstract: The National Institute of Standards and Technology (NIST) has launched a five-year Micro-force Realization and Measurement project focusing on the development of an instrument and laboratory capable of realizing and measuring the SI unit of force bel ...

686. The NIST Microwave Power Standards in Waveguide
Series: Technical Note (NIST TN)
Report Number: 1511
Topic: Electronics & Telecommunications
Published: 2/1/1999
Authors: J. W. Allen, Fred R. Clague, N T Larsen, M. P. Weidman
Abstract: The National Institute of Standards and Technology (NIST) microwave power standards in waveguide consist of automated microcalorimeters and associated transfer standards. Each transfer standard is a bolometric dc substitution power detector (a thermi ...

687. The National Ballistics Imaging Comparison (NBIC) Project
Topic: Electronics & Telecommunications
Published: 3/10/2012
Authors: Jun-Feng Song, Theodore Vincent Vorburger, Susan M Ballou, Robert Meryln Thompson, James H Yen, Thomas B Renegar, Xiaoyu A Zheng, Richard M Silver, Martin Ols
Abstract: In response to the guidelines issued by the ASCLD/LAB-International (American Society of Crime Laboratory Directors/Laboratory Accreditation Board) to establish traceability and quality assurance in U.S. crime laboratories, a NIST/ATF joint project e ...

688. The OATS Method Revisited
Topic: Electronics & Telecommunications
Published: 4/1/2005
Authors: Christopher L Holloway, Perry F. Wilson, Robert German
Abstract: Open area test sites (OATS) or equivalent semi-anechoic chambers are the most commonly used sites for EMC emissions tests. This article discusses the origins of this test methodology and revisits the interference problem (broadcast media) that the OA ...

689. The Prediction of Permeability for an Epoxy/E-Glass Composite Using Optical Coherence Tomographic Images
Topic: Electronics & Telecommunications
Published: 12/1/2001
Authors: Joy P Dunkers, Frederick R Phelan Jr, C G Zimba, Kathleen M. Flynn, D P Sanders, R C Peterson, Richard~undefined~undefined~undefined~undefined~undefined Parnas
Abstract: Knowledge of the permeability tensor in liquid composite molding is important for process optimization. Unfortunately, experimental determination of permeability is difficult and time consuming. A rapid, non-destructive technique called optical coh ...

690. The Role of Carrier Lifetime in Forward Bias Degradation of 4H-SiC PiN Diodes
Topic: Electronics & Telecommunications
Published: 10/5/2003
Authors: Allen R Hefner Jr, Ty R. McNutt, David W. Berning, Ranbir Singh, Adwoa Akuffo
Abstract: Abstract. The role of excess carrier lifetime reduction in the mechanism for on-state voltage (Vf) degradation of high voltage 4H-SiC PiN diodes is investigated. A method is developed to electrically monitor the emitter, base, and end region excess c ...

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