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Displaying records 631 to 640 of 701 records.
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631. Mass Spectromic and Optical Emission Diagnostics for rf Plasma Reactors
Topic: Electronics & Telecommunications
Published: 2/1/1992
Authors: James K Olthoff, J R Roberts, Richard J. Van Brunt, James R Whetstone, Mark A Sobolewski, S. Djurovic
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=3907

632. Recent Advances in Partial Discharge Measurement Capabilities at NIST
Topic: Electronics & Telecommunications
Published: 2/1/1992
Authors: Richard J. Van Brunt, Ken L. Stricklett, J. P. Steiner, S. V. Kulkarni
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=16575

633. An Experimentally Verified IGBT Model Implemented in the Saber Circuit Simulator
Topic: Electronics & Telecommunications
Published: 12/31/1991
Authors: Allen R Hefner Jr, D. M. Diebolt
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27637

634. Insulated Gate Bipolar Transistor (IGBT) Modeling Using IG-Spice
Topic: Electronics & Telecommunications
Published: 12/31/1991
Authors: C. S. Mitter, Allen R Hefner Jr, D X Chen, F. C. Lee
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=375

635. Scanning Tunneling Microscopy of the Surface Morphology of YBa^d2^Cu^d3^O^dx^ Thin-Films Between 300 K and 76 K
Topic: Electronics & Telecommunications
Published: 12/1/1991
Authors: John M Moreland, Paul Rice, Stephen E Russek, B. Jeanneret, Alexana Roshko, David A Rudman, Ronald H. Ono
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30528

636. Stochastic Properties of Partial-Discharge Phenomena: A Review
Topic: Electronics & Telecommunications
Published: 11/1/1991
Author: Richard J. Van Brunt
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=28540

637. Tunneling Stabilized Magnetic Force Microscopy of YBa^d2^Cu^d3^O^d7-{delta}^ Films on MgO at 76 K
Topic: Electronics & Telecommunications
Published: 11/1/1991
Authors: Paul Rice, John M Moreland
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30529

638. Influence of Memory on the Statistics of Pulsating Corona
Topic: Electronics & Telecommunications
Published: 10/1/1991
Authors: Richard J. Van Brunt, S. V. Kulkarni
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=5855

639. Influence of Phase-to-Phase Memory Propagation on the Stochastic Behavior of AC-Generated Partial Discharges
Topic: Electronics & Telecommunications
Published: 10/1/1991
Authors: Richard J. Van Brunt, E. W. Cernyar
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=25569

640. S2F10 Formation by Electrical Discharges in SF6: Comparison of Spark and Corona
Topic: Electronics & Telecommunications
Published: 10/1/1991
Authors: I. Sauers, George Gibson Harman, James K Olthoff, Richard J. Van Brunt
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=27403