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Displaying records 51 to 60 of 736 records.
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51. A review of fire blocking technologies for soft furnishings
Topic: Electronics & Telecommunications
Published: 4/23/2012
Authors: Shonali Nazare, Rick D. Davis
Abstract: Fire barrier fabrics are expected to play an increasingly important role in complying with existing and proposed soft furnishing flammability regulations. The number of commercial fire blocking technologies is large in order to accommodate the vast ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910355

52. Patterned Defect & CD Metrology by TSOM Beyond the 22 nm Node
Topic: Electronics & Telecommunications
Published: 4/10/2012
Authors: Ravikiran (Ravikiran) Attota, Abraham Arceo, Benjamin Bunday, Victor Vertanian
Abstract: Through-focus scanning optical microscopy (TSOM) is a novel method [1-8] that allows conventional optical microscopes to collect dimensional information down to the nanometer level by combining two-dimensional optical images captured at several throu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910910

53. Residual Layer Thickness Control and Metrology in Jet and Flash Imprint Lithography
Topic: Electronics & Telecommunications
Published: 4/10/2012
Authors: Ravikiran (Ravikiran) Attota, Shrawan Singhal, Sreenivasan S.V.
Abstract: Jet-and-Flash Imprint Lithography (J-FIL) has demonstrated capability of high-resolution patterning at low costs. For accurate pattern transfer using J-FIL, it is imperative to have control of the residual layer thickness (RLT) of cured resist undern ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910872

54. On CD-AFM bias related to probe bending
Topic: Electronics & Telecommunications
Published: 4/9/2012
Authors: Vladimir A Ukraintsev, Ndubuisi George Orji, Theodore Vincent Vorburger, Ronald G Dixson, Joseph Fu, Richard M Silver
Abstract: Critical Dimension AFM (CD-AFM) is a widely used reference metrology. To characterize modern semiconductor devices, very small and flexible probes, often 15 nm to 20 nm in diameter, are now frequently used. Several recent publications have reported ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910903

55. Detection and Speciation of Brominated Flame Retardants in Consumer Products and Household Dust
Topic: Electronics & Telecommunications
Published: 3/27/2012
Authors: Richard D Holbrook, Jeffrey M Davis, Keana C K Scott, Christopher W Szakal
Abstract: The ubiquitous presence of brominated flame retardants in humans, biota, and the environment has caused concerns about their toxicity, transformations, and persistence. Polymeric materials, which often are intercalated with include brominated flame ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905365

56. Durable nanoparticle coatings to reduce polyurethane foam flammability
Topic: Electronics & Telecommunications
Published: 3/24/2012
Authors: Yeon Seok Kim, Rick D. Davis
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909889

57. Flexible polyurethane foam with well characterized and reproducible smoldering
Topic: Electronics & Telecommunications
Published: 3/24/2012
Authors: Mauro Zammarano, Szabolcs Matko, Rick D. Davis, Roland H. Kraemer
Abstract: Smoldering is a self-sustaining heterogeneous oxidation reaction that induces a slow, low temperature, flameless combustion.1 Flexible polyurethane foams (PUF) are particularly prone to smoldering due to their high air permeability and low density. I ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909925

58. Modeling the effects of acid amplifiers on photoresist stochastics
Topic: Electronics & Telecommunications
Published: 3/23/2012
Authors: Gregg M. Gallatin, Patrick Naulleau, Robert Brainard
Abstract: The tradeoff between Resolution, Line Edge Roughness (LER) and Sensitivity, the so called RLS tradeoff, continues to be a difficult challenge, especially for EUV lithography. Acid amplifiers have recently been proposed as a method to improve upon t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910777

59. The National Ballistics Imaging Comparison (NBIC) Project
Topic: Electronics & Telecommunications
Published: 3/10/2012
Authors: Jun-Feng Song, Theodore Vincent Vorburger, Susan M Ballou, Robert Meryln Thompson, James H Yen, Thomas B Renegar, Xiaoyu A Zheng, Richard M Silver, Martin Ols
Abstract: In response to the guidelines issued by the ASCLD/LAB-International (American Society of Crime Laboratory Directors/Laboratory Accreditation Board) to establish traceability and quality assurance in U.S. crime laboratories, a NIST/ATF joint project e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907871

60. Nanomanufacturing with DNA Origami: Factors Affecting the Kinetics and Yield of Quantum Dot Binding
Topic: Electronics & Telecommunications
Published: 3/7/2012
Authors: Seung H. Ko, Gregg M. Gallatin, James Alexander Liddle
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907933



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