NIST logo

Publications Portal

You searched on: Topic Area: Nanofabrication, Nanomanufacturing, and Nanoprocessing Sorted by: title

Displaying records 71 to 80 of 106 records.
Resort by: Date / Title


71. Nanotechnology with Atom Optics
Topic: Nanofabrication, Nanomanufacturing, and Nanoprocessing
Published: 11/1/2004
Authors: Jabez J McClelland, Shannon Bradley Hill, M Pichler, Robert Celotta
Abstract: A brief review of atom optics is presented, with emphasis on how it can be applied in the field of nanotechnology. Two specific examples are discussed: laser-focused atomic deposition and deterministic production of single atoms. Results are summar ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620565

72. New Ion Source for High Precision FIB Nanomachining and Circuit Edit
Topic: Nanofabrication, Nanomanufacturing, and Nanoprocessing
Published: 12/31/2014
Authors: Adam V. Steele, Brenton Knuffman, Jabez J McClelland
Abstract: We present a review of the Low Temperature Ion Source (LoTIS): its aims, design, performance data collected to date, and focused spot size projections when integrated with a FIB. LoTIS provides a Cs+ beam that has been measured to have high brightnes ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917117

73. Non-Hydrolytic Synthesis and Electronic Structure of Ligand-Capped CeO2- and CeOCl Nanocrystals
Topic: Nanofabrication, Nanomanufacturing, and Nanoprocessing
Published: 8/13/2009
Authors: Daniel A Fischer, S. Depner, K. Kort, Cherno Jaye, Sarbajit Banerjee
Abstract: A novel and versatile non-hydrolytic approach is developed for the synthesis of ligand-passivated CeO2-δ and CeOCl nanocrystals soluble in non-polar organic solvents based on the condensation of cerium alkoxides with cerium halides. The alkyl gr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902942

74. Novel nano-structured Metal-Semiconductor-Metal photodetector with high peak voltage
Topic: Nanofabrication, Nanomanufacturing, and Nanoprocessing
Published: 6/22/2009
Authors: Paul D Hale, Dylan F Williams, Tomoko Borsa, B. J. VanZeghbroeck
Abstract: A novel nano-structured metal-semiconductor-metal photodetector consisting of interdigitated metal fingers and nanodots is successfully fabricated on a semi-insulating GaAs substrate by electron beam lithography, and integrated with an on-chip ground ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901074

75. O2 A-band line parameters to support atmospheric remote sensing. Part II: The rare isotopologues
Topic: Nanofabrication, Nanomanufacturing, and Nanoprocessing
Published: 7/21/2011
Authors: Joseph Terence Hodges, David A Long, Daniel K Havey, S. S. Yu, M Okumura, Charles E Miller
Abstract: Frequency-stabilized cavity ring-down spectroscopy (FS-CRDS) was employed to measure over 100 transitions in the R-branch of the b1Σg+←X3Σg-(0,0) band for the rare O2 isotopologues. The use of 17O- and 18O-enriched mixtures allowed fo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907932

76. On CD-AFM bias related to probe bending
Topic: Nanofabrication, Nanomanufacturing, and Nanoprocessing
Published: 4/9/2012
Authors: Vladimir A Ukraintsev, Ndubuisi George Orji, Theodore Vincent Vorburger, Ronald G Dixson, Joseph Fu, Richard M Silver
Abstract: Critical Dimension AFM (CD-AFM) is a widely used reference metrology. To characterize modern semiconductor devices, very small and flexible probes, often 15 nm to 20 nm in diameter, are now frequently used. Several recent publications have reported ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910903

77. Optical State-Preparation of Atoms
Topic: Nanofabrication, Nanomanufacturing, and Nanoprocessing
Published: 4/16/1996
Author: Jabez J McClelland
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620439

78. Optical volumetric inspection of sub-20 nm patterned defects with wafer noise
Topic: Nanofabrication, Nanomanufacturing, and Nanoprocessing
Published: 4/2/2014
Authors: Bryan M Barnes, Francois R. Goasmat, Martin Y Sohn, Hui H. Zhou, Richard M Silver, Andras Vladar, Abraham Arceo
Abstract: We have previously introduced a new data analysis method that more thoroughly utilizes scattered optical intensity data collected during defect inspection using bright-field microscopy. This volumetric approach allows conversion of focus resolved 2-D ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915807

79. Organic Electronics: Challenges and Opportunities
Topic: Nanofabrication, Nanomanufacturing, and Nanoprocessing
Published: 3/31/2010
Author: Calvin Chan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905389

80. Pattern Transfer of Hydrogen Depassivation Lithography Patterns into Silicon with Atomically Traceable Placement and Size Control
Topic: Nanofabrication, Nanomanufacturing, and Nanoprocessing
Published: 7/17/2014
Authors: Josh Ballard, Stephen McDonnell, Don Dick, Maia Bischof, Joseph Fu, D Jaeger, James Owen , w Owen, Justin Alexander, Udi Fuchs, Pradeep Narayanan Namboodiri, Kai Li, John Randall, Robert Wallace, Yves Chabal, Richard Reidy, Richard M Silver
Abstract: Reducing the scale of etched nanostructures below the 10 nm range eventually will require an atomic scale understanding of the masks being used in order to maintain exquisite control over both feature size and feature density. Here, we demonstrate a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915583



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series