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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements
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Displaying records 161 to 170 of 188 records.
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161. Structure Characterization of Nanoporous Interlevel Dielectric Thin Films With X-Ray and Neutron Radiation
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/6/2007
Authors: Christopher L Soles, Hae-Jeong Lee, B D. Vogt, Eric K Lin, Wen-Li Wu
Abstract: The structure characterization of nanoporous interlevel dielectric (ILD) thin films is challenging because of the small sample volumes and nanometer dimensions of the pores. In this chapter, we review characterization methods for porous ILD material ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852526

162. Subsurface Characterization of Carbon Nanotubes in Polymer Composites via Quantitative Electric Force Microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/3/2010
Authors: Minhua Zhao, Xiaohong Gu, Sharon E. Lowther, Cheol Park, Jerry Jean, Tinh Nguyen
Abstract: In this study, quantitative Electric Force Microscopy (EFM) characterization of CNTs dispersed in free-standing polymer composite films is pursued. The effect of experimental parameters including humidity conditions, EFM probe geometry, tip-sample ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904262

163. Summary Report of Research on TiO2 Nanomaterial
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/3/2012
Author: Vincent A Hackley
Abstract: Report summarizes study whose purpose was to optimize and validate a standardized and reproducible approach for the preparation of TiO2 nanoparticle dispersions in relevant biological and environmental test media, using an industrially relevant powde ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912219

164. Surface Chemical Transformations of UV irradiated Silica-Epoxy Nanocomposites
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/15/2013
Authors: Justin M Gorham, Tinh Nguyen, Deborah L Stanley, Coralie Bernard, Richard D Holbrook
Abstract: Silica nanoparticles (SiNPs) incorporated into a polymeric matrix, or silica nanocomposites (SiNCs), are used in a wide variety of commercially available products in numerous natural and artificial environments. Environmental factors, such as light, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913534

165. Surface-Engineered Nanomaterials as X-ray Absorbing Adjuvant Agents for Auger-Mediated Chemo-Radiation
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/30/2013
Authors: Robert Francis Cook, Sang-Min Lee, De-Hao D. Tsai, Vincent A Hackley, Martin W. Brechbiel
Abstract: We demonstrate a prototype approach to formulate gold nanoparticle (AuNP)‹based X‹ray absorbing adjuvant agents through surface‹engineering of cisplatin pharmacophore (PtII) with lipoic acid‹modified polyacrylate (denoted as PtII‹AuNPs). Design of Pt ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911911

166. Surface-plasmon enhancement of Brillouin light scattering from gold-nanodisk arrays on glass
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/1/2007
Authors: Zhandos Utegulov, B. T. Draine, Sudook A Kim, J. M. Shaw, Ward L Johnson
Abstract: Enhancement of Brillouin light scattering (BLS) at 532 nm was observed from Rayleigh-like and Sezawa-like acoustic modes of alkaline-earth boro-aluminosilicate glass covered with periodic arrays of gold nanodisks. This enhancement is larger than that ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50589

167. Switching in Flexible Titanium Oxide Memristors
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/25/2010
Authors: Joseph Leo Tedesco, Nadine Emily Gergel-Hackett, Laurie A. Stephey, Christina Ann Hacker, Curt A Richter
Abstract: In this study, memristors were fabricated on flexible polyethylene terephthalate (PET) substrates with aluminum contacts and a titanium dioxide film formed with a sol-gel of titanium isopropoxide and ethanol. To study the electric field dependence of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906392

168. TSOM Method for Nanoelectronics Dimensional Metrology
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/18/2011
Author: Ravikiran Attota
Abstract: Through-focus scanning optical microscopy (TSOM) is a relatively new method that transforms conventional optical microscopes into truly three-dimensional metrology tools for nanoscale to microscale dimensional analysis. TSOM achieves this by acquirin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908623

169. TSOM Method for Semiconductor Metrology
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/18/2011
Authors: Ravikiran Attota, Ronald G Dixson, John A Kramar, James Edward Potzick, Andras Vladar, Benjamin D. Bunday, Erik Novak, Andrew C. Rudack
Abstract: Through-focus scanning optical microscopy (TSOM) is a new metrology method that achieves 3D nanoscale measurement resolution using conventional optical microscopes; measurement sensitivities are comparable to what is typical using Scatterometry, SEM ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908177

170. TSV Reveal height and bump dimension metrology by the TSOM method
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/30/2013
Authors: Ravikiran Attota, Haesung Park, Victor Vartanian, Ndubuisi George Orji, Richard A Allen
Abstract: Through-focus scanning optical microscopy (TSOM) transforms conventional optical microscopes into truly 3D metrology tools for nanoscale- to- microscale dimensional analysis with nanometer-scale sensitivity. Although not a resolution enhancement meth ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913667



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