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Displaying records 1 to 10 of 124 records.
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1. 2013 ITRS Metrology Roadmap
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/15/2014
Authors: Alain C. Diebold, Ndubuisi George Orji
Abstract: In 2013 the ITRS Metrology Technical Working Group worked on updating the text and tables of the metrology chapter. New additions include a section on 3D nanometrology, a revised lithography metrology table, and an updated Interconnect section. The d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915891

2. 3D Nanoscale Characterization of Thin-Film Organic Photovoltaic Device Structures via Spectroscopic Contrast in the TEM
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/21/2010
Authors: Andrew A Herzing, Lee J Richter, Ian M. Anderson
Abstract: The three-dimensional characterization of third generation photovoltaic device structures at the nanometer scale is essential to the development of efficient, reliable, and inexpensive solar cell technologies. Electron tomography is a powerful metho ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905254

3. Aggregation/agglomeration state of carbon nanotubes
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/12/2012
Authors: Vivek M Prabhu, Toshiya Okazaki, Takeshi Eitoku, Masayoshi Tange, Haruhisa Kato
Abstract: Evaluation of aggregation and agglomeration of carbon nanotube (CNT) solution has been one of the key issues for applications. Here we introduce a simple method based on depolarized dynamic light scattering (DDLS) performed at multiple scattering ang ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912177

4. Assembly and evaluation of a pyroelectric detector bonded to vertically aligned multiwalled carbon nanotubes over thin silicon
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/20/2013
Authors: John H Lehman, Evangelos Theocharous, Savva Theocharous
Abstract: A novel pyroelectric detector consisting of a vertically aligned nanotube array on thin silicon (VANTA/Si) bonded to a 60 μm thick crystal of LiTaO^d3^ has been fabricated. The performance of the VANTA/Si-coated pyroelectric detector was evaluat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914408

5. Atom probe tomography evaporation behavior of C-axis GaN nanowires: Crystallographic, stoichiometric, and detection efficiency aspects
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/13/2013
Authors: Norman A Sanford, David R Diercks, Brian Gorman, R Kirchofer, Kristine A Bertness, Matthew David Brubaker
Abstract: The field evaporation behavior of c-axis GaN nanowires was explored in two different laser-pulsed atom probe tomography (APT) instruments. Transmission electron microscopy imaging before and after atom probe tomography analysis was used to assist in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915760

6. Attachment of a Reduction-Oxidative Active Diruthenium Compound to Au and Si Surfaces by ,ClickŠ Chemistry
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/10/2014
Authors: Sujitra Jeanie Pookpanratana, Joseph William Robertson, Curt A Richter, Christina Ann Hacker, Lee J Richter, Julia Savchenko, Steven Cummings, Tong Ren
Abstract: We report the formation of molecular monolayers containing redox-active diruthenium(II,III) compound to gold and silicon surfaces via ,clickŠ chemistry. The use of Cu-catalyzed azide-alkyne cycloaddition enables modular design of molecular surfa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914145

7. CAVITY OPTOMECHANICAL SENSORS
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/5/2011
Authors: Houxun H. Miao, Kartik A Srinivasan, Matthew T. Rakher, Marcelo Ishihara Davanco, Vladimir A Aksyuk
Abstract: We report a novel type of fully integrated optomechanical sensor and demonstrate high sensitivity mechanical displacement measurements on chip. We sense the motion of micro and nano-mechanical devices by near field coupling them to high quality facto ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908272

8. CEINT/NIST PROTOCOL for the PREPARATION OF NANOSCALE TiO2 DISPERSIONS IN AN ENVIRONMENTAL MATRIX FOR ECO-TOXICOLOGICAL ASSESSMENT
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/2/2012
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
Abstract: Toxicity and fate assessment are key elements in the evaluation of the environmental, health and safety risks of engineered nanomaterials (ENMs). While significant effort and resources have been devoted to the toxicological evaluation of many ENMs, i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910395

9. Challenges and Opportunities of Organic Electronics
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/2/2010
Author: Calvin Chan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905387

10. Challenges for Physical Characterization of Silver Nanoparticles Under Pristine and Environmentally Relevant Conditions
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/17/2011
Authors: Robert I. MacCuspie, Kim Rogers, Manomita Patra, Zhiyong Suo, Andrew John Allen, Matthew N. Martin, Vincent A Hackley
Abstract: The conditions used to disperse silver nanoparticles (AgNPs) strongly impact their resulting size measurements and agglomeration state, based on the underlying metrology and physical chemistry, respectively. A series of AgNP materials with reported ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907651



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