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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements
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Displaying records 1 to 10 of 211 records.
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1. 2013 ITRS Metrology Roadmap
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/15/2014
Authors: Alain C. Diebold, Ndubuisi George Orji
Abstract: In 2013 the ITRS Metrology Technical Working Group worked on updating the text and tables of the metrology chapter. New additions include a section on 3D nanometrology, a revised lithography metrology table, and an updated Interconnect section. The d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915891

2. 3D Nanoscale Characterization of Thin-Film Organic Photovoltaic Device Structures via Spectroscopic Contrast in the TEM
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/21/2010
Authors: Andrew A Herzing, Lee J Richter, Ian M. Anderson
Abstract: The three-dimensional characterization of third generation photovoltaic device structures at the nanometer scale is essential to the development of efficient, reliable, and inexpensive solar cell technologies. Electron tomography is a powerful metho ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905254

3. A 10 mK Scanning Probe Microscopy Facility
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 12/29/2010
Authors: Young J. Song, Alexander F. Otte, Steven R Blankenship, Alan H. Band, Frank M. (Frank M.) Hess, Young Kuk, Vladimir Shvarts, Zuyu Zhao, Joseph A Stroscio
Abstract: We describe the design, development and performance of a scanning probe microscopy (SPM) facility operating at a base temperature of 10 mK in magnetic fields up to 15 T. The microscope is cooled by a custom designed, fully ultra-high vacuum (UHV) co ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906211

4. A Benchmark Study on the Thermal Conductivity of Nanofluids
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/13/2009
Authors: Jacopo Buongiorno, David Venerus, Naveen Prabhat, Thomas McKrell, Jessica Townsend, Rebecca Christianson, Yuriy Tolmachev, Pawel Keblinski, Lin-wen Hu, Jorge Alvarado, In Cheol Bang, Sandra Bishnoi, Marco Bonetti, Frank Botz, Anselmo Cecre, Yun Chang, Gang Chen, Haisheng Chen, Sung Jae Chung, Minking Chyu, Sarit Das, Roberto Di Paola, Yulong Ding, F. Dubois, Grzegorz Dzido, Jacob Eapen, Werner Escher, Denis Funfschilling, Quentin Galand, Jinwei Gao, Patricia Gharagozloo, Kenneth Goodson, Jorge Gustova Jin, Haiping Hong, Mark Horton, Carlo Iorio, Andrzej Jarzebski, Yiran Jiang, L.W. Jin, Stephan Kabelac, Aravind Kamath, Mark A Kedzierski, Chongyoup Kim, Ji Hyun Kim, Sukwon Kim, Lim Geok Kieng, K Leong, Indranil Manna, Bruno Michel, Rui Ni, Hrishikesh Patel, John Philip, Dimos Poulikakos, Cecile Reynaud, Raffaele Savino, Pawan Singh, Pengxiang Song, T. Sundararajan, Elena Timofeeva, Todd Tritcak, A.N. Turanov, Stefan Van Vaerenbergh, Dongsheng Wen, Sanjeeva Witharana, Charles Chun Yang, W.-H. Yeh, Xiao-Zheng Zhao, Sheng-Qi Zhou
Abstract: This article reports on the International Nanofluid Property Benchmark Exercise (INPBE) in which the thermal conductivity of identical samples of colloidal dispersions of nanoparticles, or nanofluids , was measured by over 30 organizations worldwi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902860

5. A Flexible TiO2-Based Memristor
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/2/2010
Authors: Nadine Emily Gergel-Hackett, Joseph Leo Tedesco, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907110

6. A rational strategy for characterization of nanoscale particles by asymmetric flow field-flow fractionation
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/16/2014
Authors: Julien C. Gigault, John M Pettibone, Charlene Eva Schmitt, Vincent A Hackley
Abstract: This tutorial proposes a comprehensive and rational measurement strategy that provides specific guidance for the application of asymmetric-flow field flow fractionation (A4F) to the size-dependent separation and characterization of nanoscale partic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914192

7. A standardized approach for the dispersion of titanium dioxide nanoparticles in biological media
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/1/2013
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
Abstract: We describe a comprehensive optimization study culminating in a standardized and validated approach for the preparation of titanium dioxide (TiO2) nanoparticle dispersions in relevant biological media (PBS and DMEM-FBS). This study utilizes a candida ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909777

8. Accuracy of Nanoscale Pitch Standards Fabricated by Laser-Focused Atomic Deposition
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/1/2003
Authors: Jabez J McClelland, W Anderson, C Bradley, M Walkiewicz, R Deslattes, E Jurdik, Robert Celotta
Abstract: The pitch accuracy of a grating formed by laser-focused atomic deposition is evaluated from the point of view of fabricating nanoscale pitch standard artifacts. The average pitch obtained by the process, nominally half the laser wavelength, is simpl ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620548

9. Advanced Capacitance Metrology for Nanoscale Device Characterization
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/29/2010
Authors: Joseph Leo Tedesco, Nadine Emily Gergel-Hackett, Laurie A. Stephey, Christina Ann Hacker, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906391

10. Advanced Nanoscale Elastic Property Measurement by Contact-Resonance Atomic Force Microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/23/2010
Authors: Gheorghe Stan, Robert Francis Cook
Abstract: In atomic force microscopy (AFM)-based techniques, material information (topography, mechanical, electrical, magnetic, etc.) is retrieved from the nanoscale interaction between the AFM tip and the material probed. As the size of the apex of the AFM ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905459



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