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You searched on: Topic Area: Characterization, Nanometrology, and Nanoscale Measurements Sorted by: title

Displaying records 1 to 10 of 163 records.
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1. 2013 ITRS Metrology Roadmap
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/15/2014
Authors: Alain C. Diebold, Ndubuisi George Orji
Abstract: In 2013 the ITRS Metrology Technical Working Group worked on updating the text and tables of the metrology chapter. New additions include a section on 3D nanometrology, a revised lithography metrology table, and an updated Interconnect section. The d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915891

2. 3D Characterization of carbon nanotube polymer composites using Scanning Electron Microscopy and Confocal Raman Microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/11/2014
Authors: Minhua Zhao, Rachel J. Cannara
Abstract: Scanning Electron Microscopy (SEM) and Confocal Raman Microscopy (CRM) were employed to characterize the 3D state of disperison of carbon nanotubes (CNT) in a polymer matrix. First, non-destructive subsurface imaging on CNT-polymer was conducted by c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915822

3. 3D Nanoscale Characterization of Thin-Film Organic Photovoltaic Device Structures via Spectroscopic Contrast in the TEM
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/21/2010
Authors: Andrew A Herzing, Lee J Richter, Ian M. Anderson
Abstract: The three-dimensional characterization of third generation photovoltaic device structures at the nanometer scale is essential to the development of efficient, reliable, and inexpensive solar cell technologies. Electron tomography is a powerful metho ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905254

4. A Study of Nanosilica Release From ,WeatheredŠ Polymer Nanocomposites at Different Temperatures Using ICP-OES
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/15/2014
Authors: Savelas A Rabb, Deborah Stanley Jacobs, Li Piin Sung, Tinh Nguyen, Lee Lijian Yu
Abstract: The impact of nanoparticles on the environment and, more importantly, the human population has been of great interest for the past few years. Release of these nanoparticles from different materials from wear or climate exposure has been explored to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916018

5. A method to determine the number of nanoparticles in a cluster using conventional optical microscopes
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/10/2015
Authors: Hyeong G. Kang, Ravikiran Attota, Premsagar Purushotham Kavuri, Vipin Nagnath Tondare, Andras Vladar
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918715

6. Aggregation/agglomeration state of carbon nanotubes
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/12/2012
Authors: Vivek M Prabhu, Toshiya Okazaki, Takeshi Eitoku, Masayoshi Tange, Haruhisa Kato
Abstract: Evaluation of aggregation and agglomeration of carbon nanotube (CNT) solution has been one of the key issues for applications. Here we introduce a simple method based on depolarized dynamic light scattering (DDLS) performed at multiple scattering ang ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912177

7. Assembly and evaluation of a pyroelectric detector bonded to vertically aligned multiwalled carbon nanotubes over thin silicon
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/20/2013
Authors: John H Lehman, Evangelos Theocharous, Savva Theocharous
Abstract: A novel pyroelectric detector consisting of a vertically aligned nanotube array on thin silicon (VANTA/Si) bonded to a 60 μm thick crystal of LiTaO^d3^ has been fabricated. The performance of the VANTA/Si-coated pyroelectric detector was evaluat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914408

8. Atom probe tomography evaporation behavior of C-axis GaN nanowires: Crystallographic, stoichiometric, and detection efficiency aspects
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/13/2013
Authors: Norman A Sanford, David R Diercks, Brian Gorman, R Kirchofer, Kristine A Bertness, Matthew David Brubaker
Abstract: The field evaporation behavior of c-axis GaN nanowires was explored in two different laser-pulsed atom probe tomography (APT) instruments. Transmission electron microscopy imaging before and after atom probe tomography analysis was used to assist in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915760

9. Attachment of a Reduction-Oxidative Active Diruthenium Compound to Au and Si Surfaces by ,ClickŠ Chemistry
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/10/2014
Authors: Sujitra Jeanie Pookpanratana, Joseph William Robertson, Curt A Richter, Christina Ann Hacker, Lee J Richter, Julia Savchenko, Steven Cummings, Tong Ren
Abstract: We report the formation of molecular monolayers containing redox-active diruthenium(II,III) compound to gold and silicon surfaces via ,clickŠ chemistry. The use of Cu-catalyzed azide-alkyne cycloaddition enables modular design of molecular surfa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914145

10. CAVITY OPTOMECHANICAL SENSORS
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/5/2011
Authors: Houxun H. Miao, Kartik A Srinivasan, Matthew T. Rakher, Marcelo Ishihara Davanco, Vladimir A Aksyuk
Abstract: We report a novel type of fully integrated optomechanical sensor and demonstrate high sensitivity mechanical displacement measurements on chip. We sense the motion of micro and nano-mechanical devices by near field coupling them to high quality facto ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908272



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